Instruction Manual

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and clockwise rotation causes more of the display to

be occupied by the delayed sweep.

4. Set the Sweep Mode switch to the DELAY position

to display only the magnified delayed sweep portion

of the display.

NOTE

In order to obtain meaningful results with

delayed sweep, the DELAY Time Base

control must set be set to a faster sweep

speed than the MAIN Time Base control.

Because of this, the oscilloscope automat-

ically prevents (electrically) the DELAY

Time Base from being set to a slower

sweep speed than the MAIN Time Base.

For example, if the MAIN Time Base is set

to 0.1 ms/div, the slowest possible DELAY

Time Base sweep speed is also 0.1 ms/div,

even if the control is set slower.

COMPONENT TEST OPERATION

(Model 2125&&)

Do not apply an external voltage to the

COMP TEST jacks. Only non-powered

circuits should be tested with this unit.

Testing powered circuits could damage

the instrument and increase the risk of

electrical shock.

The component test function produces a component “sig-

nature” on the CRT by applying an ac signal across the

device and measuring the resulting ac current. The display

represents a graph of voltage (X) versus current (Y). The

component test function can be used to view the signatures

of resistors, capacitors, inductors, diodes, and other semi-

conductor devices. Devices may be analyzed in-circuit or

out-of-circuit and combinations of two or more devices may

be displayed simultaneously. Each component produces a

different signature and the components can be analyzed as

outlined below.

Component Test mode is activated by depressing the

COMPonent TEST switch. The SWEEP MODE switch

must not be in the DELAY position.

Resistors

A purely resistive impedance produces a signature that is

a straight line. A short circuit produces a vertical line and an

open circuit causes a horizontal line. Therefore, the higher

the resistance, the closer to horizontal the trace will be.

Values from 10 Ω to about 5 kΩ are within measurement

range. Values below 10 Ω will appear to be a dead short

while values above 5 kΩ will appear to be an open circuit.

Fig. 6 shows some typical resistance signatures.

To test a resistor, insert one of the resistor’s leads into the

white COMP TEST jack, and the other into the GND jack

(make sure that the leads touch the metal walls inside the

jacks). To test in-circuit, a pair of test leads can be used to

connect the COMP TEST and GND jacks to the compo-

nent(s).

Capacitors

Be sure to discharge capacitors (by short-

ing the leads together) before connecting

to the COMP TEST jack. Some capaci-

tors can retain a voltage high enough to

damage the instrument.

A purely capacitive impedance produces a signature that

is an ellipse or circle. Value is determined by the size and

shape of the ellipse. A very low capacitance causes the

ellipse to flatten out horizontally and become closer to a

straight horizontal line and a very high capacitance causes

the ellipse to flatten out vertically and become closer to a

straight vertical line. Values from about 0.33 µF to about

330 µF are within measurable range. Values below 0.33 µF

will be hard to distinguish from an open circuit and values

above 330 µF will be hard to distinguish from a short circuit.

Fig. 7 shows several typical capacitance signatures.

To test a capacitor, insert the capacitor’s positive lead into

the white COMP TEST jack, and the negative lead into the

GND jack (make sure that the leads touch the metal walls

inside the jacks). To test in-circuit or to test a capacitor with

leads that are too short to fit into the COMP TEST and GND

jacks, a pair of test leads can be used to connect the COMP

TEST and GND jacks to the component(s).

OPERATING INSTRUCTIONS

100

Main

Sweep

Delayed Sweep

Fig. 5. MIX SWEEP MODE Display.