Release Notes

17 Memory Errors and Dell PowerEdge YX4X Server Memory RAS Features
References
[1]
P. Restle, J. Park and B. Lloyd, "DRAM Variable Retention Time," IEEE, 1992.
[2]
K. Aadithya, A. Demir, S. Venugopalan and J. Roychowdhury, "Accurate Prediction of Random
Telegraph Noise Effects in SRAMs and DRAMs," IEEE, 2013.
[3]
"ReedSolomon error correction," Wikipedia, [Online]. Available:
https://en.wikipedia.org/wiki/Reed%E2%80%93Solomon_error_correction.
[4]
V. Sridharan and D. Liberty, "A study of DRAM failures in the field," IEEE, 2012.
[5]
A. Hwang, S. Ioan and B. Schroeder, "Cosmic rays don't strike twice: understanding the nature of
DRAM errors and the implications for system design," ACM, 2012.
© 2020 Dell Inc. or its subsidiaries. All Rights Reserved. Dell, EMC and other trademarks are trademarks of Dell Inc. or its
subsidiaries. Other trademarks may be trademarks of their respective owners.