Datasheet

Electrical Specifications
32 Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
maximum allowable overshoot above VID). These specifications apply to the processor
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Notes:
1. V
OS
is the measured overshoot voltage above VID.
2. T
OS
is the measured time duration above VID.
2.12.2 Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
Table 2-17 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
Table 2-17. V
CC
Overshoot Specifications
Symbol Parameter Min Max Units Figure Notes
V
OS_MAX
Magnitude of V
CC
overshoot above VID 50 mV 2-5
T
OS_MAX
Time duration of V
CC
overshoot above VID 25 µs 2-5
Figure 2-5. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0 5 10 15 20 25
Time [us]
Voltage [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID