User Manual

GMC-I Messtechnik GmbH 33
Protection Class I Devices 
with Terminals for Applied Parts 
– M
easurement type PE(TS) - P1 
– DUT mains plug to test socket 
– Test probe P1 to P1 terminals
Schematic Diagram
Insulation resistance is measured between protective conductor
terminal PE and external, short-circuited applied parts which can
be contacted with test probe P1.
Wiring Diagram
Protection Class I Devices with Outputs for Safety Extra-Low Voltage 
– M
easurement type PE(TS) - P1 
– DUT mains plug to test socket 
– Test probe P1 to P1 terminals
Schematic Diagram
Insulation resistance is measured between the PE terminal and
the safety extra-low voltage outputs, which must be contacted
one after the other with probe P1.
Wiring Diagram
Protection Class I Devices 
with Exposed Conductive Parts 
– M
easurement type LN(TS) - P1//PE(TS) 
– DUT mains plug to test socket 
– Test probe P1 to P1 terminals
Schematic Diagram
Insulation resistance is measured between short-circuited mains
terminals (L-N) and external conductive parts which can be con-
tacted with test probe P1 and are not connec
ted to the housing,
as well as protective conductor terminal PE at the housing.
Wiring Diagram
Setting Measuring Parameters for RISO
Measuring 
Parameter
Meaning
Measurement Type,
Suitable for 
DUT Connection via
LN(TS)-PE(TS) PC I: Testing is conducted be-
tween short-circuited LN mains
terminals at the test sock
et and
the DUT’s PE terminal
Test socket, EL1, VL2E, 
AT3 adap ter (AT3-I I I E, AT3-I IS,
AT3-I IS32), AT16DI/AT32DI, 
CEE adapter
LN(TS)-P1 Testing is conducted between
short-
circuited LN mains termi-
nals at the test socket and test
pr
obe P1.
Test socket, VL2E, 
AT3 adap ter (AT3-I I I E, AT3-I IS,
AT3-I IS32), AT16DI/AT32DI
P1 – P2
SECUTEST PRO or feature H01: 
2-pole measurement between
test probes 1 and 2 
(see section 6.6)
No connection (PC3)
PE(mains)-P1
Cable test: Testing is conducted
between the ground terminal at the
mains and test probe P1.
Permanent connection
PE(TS)-P1
Testing is conducted between the
PE terminal at the test socket and
test probe P1.
Test socket
LN(TS)-P1 //
PE(
TS)
Testing is conducted between
short-circuited LN mains termi-
nals at the test socket
and test
probe P1, including PE at the test
socket.
Test socket, VL2E, 
AT3 adap ter (AT3-I I I E, AT3-I IS,
AT3-I IS32
), AT16DI/AT32DI
UISO(set)
> 50 ... < 500 V Variable test voltage can be entered with the numeric keypad