Datasheet

GMC-I Messtechnik GmbH 5
SECUTEST BASE / PRO and SECULIFE ST BASE(25)
Test Instruments for Measuring Electrical Safety of Devices
Characteristic Values
Func-
tion
Measured
Quantity
Display Range /
Nominal Range of
Use
Reso-
lution
Nominal
Voltage
U
N
Open-
Circuit
Voltage
U
0
Nom.
Current
I
N
Short-
Circuit
Current
I
K
Inter-
nal
Resis-
tance
R
I
Refer-
ence
Resis-
tance
R
REF
Measuring
Uncertainty
1
Intrinsic Error
1
Overload
Capacity
Value Time
Tests, 62638 (DIN VDE 0701-0702) / IEC 62353 (VDE 0751)
Protective
conductor
resistance
R
PE
1 … 999 mΩ 1mΩ
—
< 24 V
AC or DC
—
>200 mA
AC or DC
> 10 A AC 5
>35 AAC
11)
——
±(15% rdg. + 10 D)
>10D
> 10.0 Ω :
±(10% rdg.+ 10 d)
±(10% rdg.+ 10 d)
>10d
264 V
250 mA
16 A
5
Cont.
1.00 ... 999 Ω 10 mΩ
>42 AAC
11)
15 s
10.0 … 30.0 Ω 100 m Ω
Insulation
resistance
9
RISo
10 … 999 kΩ 1kΩ
50 … 500
VDC
1.0 • U
N
…
1.5 • U
N
>1 mA >2mA — —
±(5% rdg.+ 4 d)
> 10 d
± (2.5% rdg.+2 d)
> 10 d
264 V Cont.
1.00 … 9.99 MΩ 10 kΩ
10.0 … 99.9 MΩ 100 kΩ
≥ 20 MΩ:
±(10% rdg.+ 8 d)
≥ 20 MΩ:
± (5% rdg.+4 d)
100 … 300 MΩ 1MΩ
Leakage current,
alternative
measurement
2
IPE, IB, IG, IA
0.0 ... 99 μA1μA
—
50 ...
250 V~
– 20/+10%
—>1.5mA
> 150 k Ω
1kΩ
±10 Ω
± (5% rdg.+ 4 d) > 10 d
> 15 mA:
±(10% rdg.+ 8 d)
± (2% rdg.+2 d) > 10 d
> 15 mA:
±(5% rdg.+ 4 d)
264 V Cont.
100 ... 999 μA1μA
1.00 ... 9.99 mA 10 μA
10.0 ... 30.0 mA 100 μA
Leakage current,
direct
measurement
3
IPE, IB, IG, IA, IP
Only Ip: 0.0 ...
99.9 μA
100 nA
————
1kΩ
±10 Ω
1kΩ
±(5% rdg.+ 4 d)
> 10 d
± (2.5% rdg.+2 d)
> 10 d
264 V Cont.
0.0 ... 99 μA1μA
100 ... 999 μA1μA
1.00 ... 9.99 mA 10 μA
10.0 ... 30.0 mA 100 μA
Leakage current,
differential
current
measurement
4
IPE, IB, IG
0 ... 99 μA1μA
— — ————
±(5% rdg.+ 4 d)
> 10 d
± (2.5% rdg.+2 d)
> 10 d
264 V Cont.
100 ... 999 μA1μA
1.00 ... 9.99 mA 10 μA
10.0 ... 30.0 mA 100 μA
Function test at test socket
Line voltage
U
L–N
10
100.0 … 240.0 V~ 0.1V— — ———— — ± (2% rdg.+2 d) 264 V Cont.
Load current I
L
0 … 16.00 A
RMS
10mA— — ———— — ± (2% rdg.+2 d) 16 A Cont.
Active power P
0 … 3700 W 1 W — — — — — — —
± (5% rdg.+10 d)
>20d
264 V Cont.
20 A 10 min
Apparent power S
0 … 4000 VA 1 VA Calculated value, U
L–N
• I
V
± (5% rdg.+10 d)
>20d
Power factor PF
with sinusoidal
waveform: cosϕ
0.00 … 1.00 0.01 Calculated value, P / S, display > 10 W ±(10% rdg.+5 d)
t
A
PRCD
Time to trip
0.1 ... 999 ms 0.1 ms — — 30 mA — — — ± 5 ms
V–COM
Probe voltage
(test probe P1 to PE)
, and
0,0 … 99.9 V
100 ... 250 V
100 mV
1 V
————
3 MΩ
——
± (2 % v.M.+2 D)
300 V
,
and
Cont.
Measurem. voltage
( sockets V–COM
6
)
, and
1 MΩ
± (2 % rdg. +2 d )
> 45 Hz ... 65 Hz
± (2 % rdg. +5 d )
> 65 Hz ... 10 kHz
± (5 % rdg. +5 d )
> 10 kHz ... 20 kHz
Leakage current
via AT3-IIIE
adapter Z745S
6 8
0,00 ... 0.99 mA
0.01 mA
— — ———— —
±(2 % rdg.+2 d)
>10D
without adapter
253 V Cont.
1,0 ... 9.9 mA
0.1 mA
10 ... 20 mA
1mA
Temperature
with Pt100 sensor
– 200.0 ...
+850.0 °C
0.1 °C— <20V– 1.1mA— — — ±(2 % rdg.+1 °C) 10 V Cont.
Temperature with
Pt1000 sensor
– 150.0 ...
+850.0 °C