Information

Connection/Test 3(GPT-95X3)
8
One testing condition for more
than one channel output (8
channels max.) simultaneously
Prerequisite: Test object has the characteristics
of low defect rate.
Advantages: time saving and fast
Disadvantages:
1. Prone to test blind spots
2. The result is the sum of all channels, and
the exact point of failure cannot be
immediately known when the fault occurs
Assume component spec. leakage 3mA.
A good component has avg. leakage 1mA
8CH test same time, total leak 1mA * 8 = 8mA
Hi Set setup is 8mA * K (K=multiplication factor)
＊If tests is fail > Hi SET.
scan DUT one by one, meantime Hi SET is
equal to setup divided by 8