HP StorageWorks 2000 Modular Smart Array Reference Guide (481599-003, August 2008)

Chapter 7 Troubleshooting Using SMU 201
4. Note any error counts displayed for these statistics.
Field Description
SMART Event Count The number of SMART (Self-Monitoring Analysis and
Reporting Technology) events that the drive recorded.
These events are often used by the vendor to determine
the root cause of a drive failure. Some SMART events
may indicate imminent electromechanical failure.
I/O Timeout Count The number of times the drive accepted an I/O request
but did not complete it in the required amount of time.
Excessive timeouts can indicate potential device failure
(media retries or soft, recoverable errors)
No Response Count The number of times the drive failed to respond to an I/O
request. A high value can indicate that the drive is too
busy to respond to further requests.
Spin-up Retries The number of times the drive failed to start on power-up
or on a software request. Excessive spin-up retries can
indicate that a drive is close to failing.
Media Errors The number of times the drive had to retry an I/O
operation because the media did not successfully
record/retrieve the data correctly.
Non Media Errors The number of soft, recoverable errors that are not
associated with drive media.
Bad Block Reassignments The number of block reassignments that have taken place
since the drive was shipped from the vendor. A large
number of reallocations in a short period of time could
indicate a serious condition.
Bad Block List Size The number of blocks that have been deemed defective
either from the vendor or over time due to reallocation.