Datasheet

SMU INSTRUMENTS
A Greater Measure of Confidence
www.keithley.com
1.888.KEITHLEY
(U.S. only)
Ordering Information
2601B Single-channel System
SourceMeter SMU Instrument
(3A DC, 10A Pulse)
2602B Dual-channel System
SourceMeter SMU Instrument
(3A DC, 10A Pulse)
2604B Dual-channel System
SourceMeter SMU
Instrument (3A DC, 10A
Pulse, Benchtop Version)
2611B Single-channel System
SourceMeter SMU Instrument
(200V, 10A Pulse)
2612B Dual-channel System
SourceMeter SMU Instrument
(200V, 10A Pulse)
2614B Dual-channel System
SourceMeter SMU
Instrument (200V, 10A
Pulse, Benchtop Version)
2634B Dual-channel System
SourceMeter SMU
Instrument (1fA, 10A Pulse,
Benchtop Version)
2635B Single-channel System
SourceMeter SMU Instrument
(0.1fA, 10A Pulse)
2636B Dual-channel System
SourceMeter SMU Instrument
(0.1fA, 10A Pulse)
Accessories Supplied
Operators and Programming Manuals
2600-ALG-2: Low Noise Triax
Cable with Alligator Clips, 2m
(6.6 ft.) (two supplied with 2634B
and 2636B, one with 2635B)
2600-Kit: Screw Terminal
Connector Kit (2601B/
2602B/2604B/2611B/2612B/2614B)
2600B-800A: Series 2400 Emulation
Script for Series 2600B (supplied
on USB memory stick)
7709-308A: Digital I/O Connector
CA-180-3A: TSP-Link/Ethernet
Cable (two per unit)
TSP Express Software Tool (embedded)
Test Script Builder Software (supplied
on CD)
LabVIEW Driver (supplied on CD)
ACS Basic Edition Software (optional)
Unmatched Throughput for
Automated Test with TSP Technology
For test applications that demand the highest
levels of automation and throughput, the Model
2600B’s TSP technology delivers industry-best
performance. TSP technology goes far beyond
traditional test command sequencers… it fully
embeds then executes complete test programs
from within the SMU instrument itself. This
virtually eliminates all the time-consuming bus
communications to and from the PC control-
ler, and thus dramatically improves overall
test times.
• Conditional branching
• Advanced calculations
and flow control
• Variables
• Pass/Fail test
• Prober/Handler control
• Datalogging/
Formatting
Test Script
DUT
TSP technology executes complete test pro-
grams from the 2600B’s non-volatile memory.
SMU-Per-Pin Parallel Testing
with TSP-Link Technology
TSP-Link is a channel expansion bus that enables
multiple Series 2600B’s to be inter-connected
and function as a single, tightly-synchronized,
multi-channel system. The 2600B’s TSP-Link
Technology works together with its TSP technol-
ogy to enable high-speed, SMU-per-pin parallel
testing. Unlike other high-speed solutions such
as large ATE systems, the 2600B achieves parallel
test performance without the cost or burden of
a mainframe. The TSP-Link based system also
enables superior flexibility, allowing for quick
and easy system re-configuration as test require-
ments change.
Model 2400 Software Emulation
The Series 2600B is compatible with test
code developed for Keithley’s Model 2400
SourceMeter SMU instrument. This enables
an easier upgrade from Model 2400-based
test systems to Series 2600B, and can improve
test speeds by as much as 80%. In addition, it
provides a migration path from SCPI program-
ming to Keithley’s TSP technology, which when
implemented can improve test times even more.
For complete support of legacy test systems, the
Model 2400’s Source-Memory-List test sequencer
is also fully supported in this mode.
Third-generation SMU Instrument
Design Ensures Faster Test Times
Based on the proven architecture of earlier Series
2600 instruments, the Series 2600B’s SMU instru
-
ment design enhances test speed in several ways.
For example, while earlier designs used a parallel
current ranging topology, the Series 2600B uses a
patented series ranging topology, which provides
faster and smoother range changes and outputs
that settle more quickly.
SMU1
<500ns
SMU2
SMU3
SMU4
All channels in the TSP-Link system are
synch ronized to under 500ns.
Scalable, integrated source and measure solutions Scalable, integrated source and measure solutions
Series 2600B
System SourceMeter
®
SMU Instruments
Test 1
running
To
Device 1
GPIB, USB, or Ethernet
TSP-Link
Test 2
running
To
Device 2
Test 3
running
To
Device 3
SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and lowers the
cost of test.