Datasheet

SMU INSTRUMENTS
www.keithley.com
1.888.KEITHLEY
(U.S. only)
A Greater Measure of Confidence
The Series 2600B SMU instrument design sup-
ports two modes of operation for use with a vari-
ety of loads. In normal mode, the SMU instru-
ment provides high bandwidth performance
for maximum throughput. In high capacitance
(high-C) mode, the SMU instrument uses a slow-
er bandwidth to provide robust performance
with higher capacitive loads.
Simplify Semiconductor Component
Test, Verification, and Analysis
The optional ACS Basic Edition software
maximizes the productivity of customers who
perform packaged part characterization dur-
ing development, quality verification, or failure
analysis. Key features include:
Rich set of easy-to-access test libraries
Script editor for fast customization of
existing tests
Data tool for comparing results quickly
Formulator tool that analyzes captured curves
and provides a wide range of math functions
For more information about the ACS Basic
Edition software, please refer to the ACS Basic
Edition data sheet.
Powerful Software Tools
In addition to the embedded Java-based plug &
play software and optional ACS Basic Edition
software, the free Test Script Builder software
tool is provided to help users create, modify,
debug, and store TSP test scripts. Table 1
describes key features of Series 2600B soft-
ware tools.
Three New Dual-Channel Bench-
Top Models of Series 2600B Offer
Industry-Best Value and Performance
For applications that do not require leading-edge
system-level automation capabilities, Keithley
has expanded the Series 2600B to include 3 new
value-priced “bench-top” models – the 2604B,
2614B, and 2634B. These models offer similar
performance to Models 2602B, 2612B, and
2636B, respectively, however do not include TSP-
Link, Contact Check, and Digital I/O capabilities.
Complete Automated
System Solutions
Keithley’s S500 Integrated Test Systems are
highly configurable, instrument-based systems
for semiconductor characterization at the
device, wafer, or cassette level. Built on our
proven Series 2600B System SourceMeter SMU
instruments, our S500 Integrated Test Systems
Scalable, integrated source and measure solutions
Scalable, integrated source and measure solutions
Series 2600B
System SourceMeter
®
SMU Instruments
When you need to acquire data on a packaged
part quickly, the wizard-based user interface
of ACS Basic Edition makes it easy to find and
run the test you want, like this common FET
curve trace test.
Table 1. Series 2600B software tools
Feature/
Functionality
ACS Basic Edition
Java-based Plug & Play Test Script Builder (TSB)
Description
Semiconductor
characterization software for
component test, verification,
and analysis
Quick Start Java-based Plug &
Play Tool for fast and easy I-V
testing, primarily for bench and
lab users
Custom script writing tool for
TSP instruments
Supported
hardware
Series 2400, Series 2600B,
4200-SCS
Series 2600B Series 2600B, Series 3700
Supported
buses
GPIB, LAN/LXI
LAN/LXI GPIB, RS-232, LAN/LXI, USB
Functionality
Intuitive, wizard-based GUI,
Rich set of test libraries,
curve trace capability
Linear/Log Sweeps, Pulsing,
Custom sweeps, Single point
source-measures. Note: Uses
new 2600B’s new API’s for
precision timing and channel
synchronization
Custom scripts with total
flexibility, full featured
debugger
Data
management
Formulator tool with wide
range of math functions
.csv export User defined
Installation
Optional purchase
Not necessary.
Embedded in the instrument.
Free Download or CD Install
on PC.
The flexible software architecture of ACS Basic
Edition allows configuring systems with a wide
range of controllers and test fixtures, as well as the
exact number of SourceMeter SMU instruments the
application requires.
provide innovative measurement features and
system flexibility, scalable to your needs. The
unique measurement capability, combined
with the powerful and flexible Automated
Characterization Suite (ACS) software, provides
a comprehensive range of applications and fea-
tures not offered on other comparable systems
on the market.