Datasheet

SMU INSTRUMENTS
A Greater Measure of Confidence
www.keithley.com
1.888.KEITHLEY
(U.S. only)
TYPICAL APPLICATIONS
I-V functional test and characterization of a wide
range of devices, including:
• Discrete and passive components
– Two-leaded – Sensors, disk drive heads,
metal oxide varistors (MOVs), diodes, zener
diodes, sensors, capacitors, thermistors
– Three-leaded – Small signal bipolar junction
transistors (BJTs), field-effect transistors
(FETs), and more
• Simple ICs – Optos, drivers, switches, sensors,
converters, regulators
• Integrated devices – small scale integrated (SSI)
and large scale integrated (LSI)
– Analog ICs
– Radio frequency integrated circuits (RFICs)
– Application specific integrated circuits (ASICs)
– System on a chip (SOC) devices
• Optoelectronic devices such as light-emitting
diodes (LEDs), laser diodes, high brightness
LEDs (HBLEDs), vertical cavity surface-emitting
lasers (VCSELs), displays
• Wafer level reliability
– NBTI, TDDB, HCI, electromigration
• Solar Cells
• Batteries
• And more...
Series 2600B
System SourceMeter
®
SMU Instruments
Scalable, integrated source and measure solutions Scalable, integrated source and measure solutions
+1.5A
+3A
+5A
–3A
–5A
+10A
–10A
–1A
+1A
–1.5A
+40V+6V
–6V
+20V–20V 0V
0A
+35V–35V–40V
DC
Pulse
+1.5A
+10A
–10A
–1A
+1A
+0.1A
–0.1A
–1.5A
+200V+5V
–5V
+20V–20V 0V
0A
+180V–180V–200V
DC
Pulse
+1.5A
+10A
–10A
–1A
+1A
+0.1A
–0.1A
–1.5A
+200V+5V
–5V
+20V–20V 0V
0A
+180V–180V–200V
DC
Pulse
Models 2601B, 2602B, and 2604B I-V capability
Models 2611B, 2612B, and 2614B I-V capability
Models 2634B, 2635B, and 2636B I-V capability
In the first and third quadrants, Series 2600B SMU instruments operate as
a source, delivering power to a load. In the second and fourth quadrants,
they operate as a sink, dissipating power internally.
Model 2604B/2614B rear panel
(Single channels 2601B, 2611B, 2635B not shown)
Model 2636B rear panel