User's Manual

Appendix A Specifications for AT-MIO-16XE-10 and AT-AI-16XE-10
National Instruments Corporation A-23 AT-MIO/AI E Series User Manual
Dynamic Characteristics
Settling time for full-scale step.......... 10 µs to ±1 LSB accuracy
Slew rate ........................................... 5 V/µs
Noise................................................. 60 µVrms, DC to 1 MHz
Stability
Offset temperature coefficient........... ±50 µV/°C
Gain temperature coefficient ............. ±7.5 ppm/°C
Onboard calibration reference
Level...........................................5.000 V (±0.5 mV) (actual value
stored in EEPROM)
Temperature coefficient ..............±0.6 ppm/°C max
Long-term stability .....................±6 ppm/
Digital I/O
Number of channels .......................... 8 input/output
Compatibility .................................... TTL/CMOS
Power-on state................................... Input (High-Z)
Data transfers .................................... Programmed I/O
Digital logic levels............
Level Min Max
Input low voltage
0 V 0.8 V
Input high voltage
2 V 5 V
Input low current
-320 µA
Input high current
10 µA
Output low
voltage
(I
OL
= 24 mA)
0.4 V
Output high
voltage
(I
OH
= 13 mA)
4.35 V
1,000 h