Datasheet

74HC_HCT4052 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 19 July 2012 18 of 29
NXP Semiconductors
74HC4052; 74HCT4052
Dual 4-channel analog multiplexer/demultiplexer
Fig 16. Test circuit for measuring sine-wave distortion
dB
001aah829
nYn/nZ
10 μF
V
is
V
os
nZ/nYn
C
L
R
L
Sn
GNDV
EE
V
CC
V
CC
= 4.5 V; GND = 0 V; V
EE
= 4.5 V; R
L
= 600 ; R
S
=1k.
a. Test circuit
b. Isolation (OFF-state) as a function of frequency
Fig 17. Test circuit for measuring isolation (OFF-state)
dB
001aah871
nYn/nZ
0.1 μF
V
is
V
os
nZ/nYn
C
L
R
L
Sn
GNDV
EE
V
CC
001aae332
f
i
(kHz)
10 10
5
10
6
10
4
10
2
10
3
−60
−40
−80
−20
0
α
iso
(dB)
−100