74LV4051 8-channel analog multiplexer/demultiplexer Rev. 5 — 17 September 2014 Product data sheet 1. General description The 74LV4051 is an 8-channel analog multiplexer/demultiplexer with three digital select inputs (S0 to S2), an active-LOW enable input (E), eight independent inputs/outputs (Y0 to Y7) and a common input/output (Z). It is a low-voltage Si-gate CMOS device that is pin and function compatible with 74HC4051 and 74HCT4051.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 3. Ordering information Table 1. Ordering information Type number Package Temperature range Name Description Version 74LV4051N 40 C to +125 C DIP16 plastic dual in-line package; 16 leads (300 mil) SOT38-4 74LV4051D 40 C to +125 C SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 74LV4051DB 40 C to +125 C SSOP16 plastic shrink small outline package; 16 leads; body width 5.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 11 10 9 6 13 S0 S1 S2 14 11 10 15 9 12 1 5 2 E 6 4 3 0 8X 2 G8 Y0 Y1 MUX/DMUX 0 Y2 13 14 1 Y3 15 2 Y4 12 3 3 Y5 1 4 Y6 5 5 Y7 2 6 4 7 Z 001aad541 Fig 2. 0 7 001aad542 Logic symbol Fig 3. IEC logic symbol < 9(( 9&& 9&& 9&& 9&& 9(( IURP ORJLF 9(( = DDG Fig 4.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 5. Pinning information 5.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 6. Functional description 6.1 Function table Table 3. Function table[1] Input Channel ON E S2 S1 S0 L L L L Y0 to Z L L L H Y1 to Z L L H L Y2 to Z L L H H Y3 to Z L H L L Y4 to Z L H L H Y5 to Z L H H L Y6 to Z L H H H Y7 to Z H X X X switches off [1] H = HIGH voltage level; L = LOW voltage level; X = don’t care. 7. Limiting values Table 4.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 8. Recommended operating conditions Table 5. Recommended operating conditions[1] Symbol Parameter Conditions Min Typ Max Unit VCC supply voltage see Figure 8 1 3.3 6 V VI input voltage 0 - VCC V VSW switch voltage Tamb ambient temperature t/V [1] 0 - VCC V 40 - +125 C input transition rise and fall rate VCC = 1.0 V to 2.0 V - - 500 ns/V VCC = 2.0 V to 2.7 V - - 200 ns/V VCC = 2.
4LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 9. Static characteristics Table 6. Static characteristics At recommended operating conditions. Voltages are referenced to GND (ground = 0 V).
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 9.1 Test circuits VCC VCC S0 to S2 VIH or VIL S0 to S2 VIH or VIL Yn Z IS Yn Z E IS GND = VEE VCC GND = VEE GND VI VO IS E VO VI 001aak409 001aak410 VI = VCC or VEE and VO = VEE or VCC. Fig 9. VI = VCC or VEE and VO = open circuit. Test circuit for measuring OFF-state leakage current Fig 10. Test circuit for measuring ON-state leakage current 9.2 ON resistance Table 7.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer Table 7. ON resistance …continued At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for graphs see Figure 11 and Figure 12. Symbol RON(rail) Parameter ON resistance (rail) ON resistance (rail) 40 C to +125 C Unit Min Typ[1] Max Min Max - 225 - - - VCC = 2.0 V; ISW = 1000 A - 110 235 - 270 VCC = 2.7 V; ISW = 1000 A - 70 145 - 165 VCC = 3.0 V to 3.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 9.3 On resistance waveform and test circuit V VSW VCC S0 to S2 VIH or VIL Yn Z E GND = VEE GND ISW VI 001aak411 RON = VSW / ISW. Fig 11. Test circuit for measuring RON 001aak412 180 RON (Ω) VCC = 2.0 V 120 VCC = 3.0 V VCC = 4.5 V 60 0 0 1.2 2.4 3.6 4.8 VI (V) Vi = 0 V to VCC VEE Fig 12.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 10. Dynamic characteristics Table 8. Dynamic characteristics Voltages are referenced to GND (ground = 0 V). For test circuit see Figure 15. Symbol Parameter tpd 40 C to +85 C Conditions Min Max Min Max VCC = 1.2 V - 25 - - - ns VCC = 2.0 V - 9 17 - 20 ns - 6 13 - 15 ns propagation delay Yn to Z, Z to Yn; see Figure 13 VCC = 3.0 V to 3.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer Table 8. Dynamic characteristics …continued Voltages are referenced to GND (ground = 0 V). For test circuit see Figure 15. Symbol Parameter tdis disable time 40 C to +85 C Conditions Min VCC = 1.2 V - 145 - - - ns VCC = 2.0 V - 51 93 - 110 ns - 38 69 - 82 ns - 25 - - - ns E to Yn, Z; see Figure 14 VCC = 3.0 V to 3.6 V; CL = 15 pF [3] VCC = 3.0 V to 3.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 10.1 Waveforms VCC Yn or Z input VM VEE tPLH tPHL VO Z or Yn output VM VEE 001aak418 Measurement points are given in Table 9. VOL and VOH are typical voltage output levels that occur with the output load. Fig 13.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer VI tW 90 % negative pulse VM 0V tf tr tr tf VI 90 % positive pulse 0V VM 10 % VM VM 10 % tW VEXT VCC VI RL VO G DUT RT VEE RL CL 001aak353 Test data is given in Table 10. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 10.2 Additional dynamic parameters Table 11. Additional dynamic characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V); VI = GND or VCC (unless otherwise specified); tr = tf 6.0 ns; Tamb = 25 C. Symbol Parameter Conditions THD fi = 1 kHz; CL = 50 pF; RL = 10 k; see Figure 20 total harmonic distortion Min Typ Max Unit VCC = 3.0 V; VI = 2.75 V (p-p) - 0.8 - % VCC = 6.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 10.2.1 Test circuits 001aak361 5 (dB) VCC VCC VIH or VIL S0 to S2 0 2RL Yn Z E 0.1 μF GND = VEE GND 2RL CL dB fi −5 10 102 103 104 105 106 f (kHz) 001aak420 VCC = 3.0 V; GND = 0 V; VEE = -3.0 V; RL = 50 ; RSOURCE = 1 k. Fig 16. Test circuit for measuring frequency response Fig 17. Typical frequency response 001aak360 0 (dB) VCC VCC VIH or VIL S0 to S2 VCC 2RL Yn Z 0.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer VCC VCC S0 to S2 VIH or VIL 2RL Yn Z E 10 μF GND = VEE GND 2RL CL D fi 001aak422 Fig 20. Test circuit for measuring total harmonic distortion VCC VCC VCC 2RL S0 to S2 2RL Yn Z E 2RL G GND = VEE VIH or VIL 2RL CL V VO 001aak423 a. Test circuit ORJLF LQSXW 6Q ( RII RQ RII 92 9FW DDM b. Input and output pulse definitions VI may be connected to Sn or E. Fig 21.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer VCC VCC VCC 2RL VIH or VIL RL S0 to S2 Y0 Z Yn 2RL E 0.1 μF GND = VEE GND 2RL VO CL 2RL dB VI 001aak434 a. Switch closed condition VCC VCC VCC 2RL VCC 2RL VIH or VIL S0 to S2 Y0 Z Yn 2RL E GND = VEE GND RL 2RL VO VI 2RL CL dB 001aak435 b. Switch open condition Fig 22.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 11.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 62 SODVWLF VPDOO RXWOLQH SDFNDJH OHDGV ERG\ ZLGWK PP 627 ' ( $ ; F \ + ( Y 0 $ = 4 $ $ $ $ SLQ LQGH[ ș / S / H Z 0 E S GHWDLO ; PP VFDOH ',0(16,216 LQFK GLPHQVLRQV DUH GHULYHG IURP WKH RULJLQDO PP GLPHQVLRQV 81,7 $ PD[ $ $ $ E S F ' ( H + ( / / S 4 Y Z \ = PP
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 6623 SODVWLF VKULQN VPDOO RXWOLQH SDFNDJH OHDGV ERG\ ZLGWK PP ' 627 ( $ ; F \ + ( Y 0 $ = 4 $ $ $ $ SLQ LQGH[ ș / S / GHWDLO ; Z 0 E S H PP VFDOH ',0(16,216 PP DUH WKH RULJLQDO GLPHQVLRQV 81,7 $ PD[ $ $ $ E S F ' ( H + ( / / S 4 Y Z \ = ș PP
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 76623 SODVWLF WKLQ VKULQN VPDOO RXWOLQH SDFNDJH OHDGV ERG\ ZLGWK PP ' 627 ( $ ; F \ + ( Y 0 $ = 4 $ SLQ LQGH[ $ $ $ ș / S / H GHWDLO ; Z 0 E S PP VFDOH ',0(16,216 PP DUH WKH RULJLQDO GLPHQVLRQV 81,7 $ PD[ $ $ $ E S F ' ( H + ( / / S 4 Y Z \ = ș PP
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer '+94)1 SODVWLF GXDO LQ OLQH FRPSDWLEOH WKHUPDO HQKDQFHG YHU\ WKLQ TXDG IODW SDFNDJH QR OHDGV 627 WHUPLQDOV ERG\ [ [ PP % ' $ $ $ ( F GHWDLO ; WHUPLQDO LQGH[ DUHD WHUPLQDO LQGH[ DUHD & H H E \ \ & Y 0 & $ % Z 0 & / (K H 'K ; PP VFDOH ',0(16,216 PP DUH WKH RULJLQDO GLPHQVLRQV 81,7 PP $ PD[
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 12. Abbreviations Table 12. Abbreviations Acronym Description CMOS Complementary Metal-Oxide Semiconductor ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model TTL Transistor-Transistor Logic 13. Revision history Table 13. Revision history Document ID Release date Data sheet status Change notice Supersedes 74LV4051 v.5 20140917 Product data sheet - 74LV4051 v.4 Modifications: 74LV4051 v.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 14. Legal information 14.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from competent authorities. Non-automotive qualified products — Unless this data sheet expressly states that this specific NXP Semiconductors product is automotive qualified, the product is not suitable for automotive use.
74LV4051 NXP Semiconductors 8-channel analog multiplexer/demultiplexer 16. Contents 1 2 3 4 5 5.1 5.2 6 6.1 7 8 9 9.1 9.2 9.3 10 10.1 10.2 10.2.1 11 12 13 14 14.1 14.2 14.3 14.4 15 16 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . .