Datasheet

HEF4794B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 7 — 16 November 2011 11 of 18
NXP Semiconductors
HEF4794B
8-stage shift-and-store register LED driver
Test data is given in Table 10.
Definitions for test circuit:
DUT - Device Under Test.
R
L
= Load resistance.
C
L
= load capacitance.
R
T
= Termination resistance should be equal to output impedance of Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
001aag804
DUT
V
EXT
R
T
C
L
R
L
t
r
10 %
90 %
t
f
V
I
V
I
V
O
V
DD
V
SS
input pulse
G
Table 10. Test data
Supply Input V
EXT
Load
V
DD
V
I
t
r
, t
f
t
PLZ
, t
PZL
t
PLH
, t
PHL
C
L
R
L
5 V to 15 V V
DD
 20 ns V
DD
open 50 pF 1 k