Datasheet

PCF2127AT All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 6 — 11 July 2013 70 of 86
NXP Semiconductors
PCF2127AT
Integrated RTC, TCXO and quartz crystal
13.2 Frequency characteristics
[1] 1 ppm corresponds to a time deviation of 0.0864 seconds per day.
[2] Only valid if CLKOUT frequencies are not equal to 32.768 kHz or if CLKOUT is disabled.
[3] Not production tested. Effects of reflow soldering are not included (see Ref. 3 “
AN10857”).
Table 63. Frequency characteristics
V
DD
= 1.8 V to 4.2 V; V
SS
=0V; T
amb
=+25 C, unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
f
o
output frequency on pin CLKOUT;
V
DD
or V
BAT
= 3.3 V;
COF[2:0] = 000;
AO[3:0] = 1000
- 32.768 - kHz
f/f frequency stability V
DD
or V
BAT
= 3.3 V
T
amb
= 15 C to +60 C
[1][2]
- 3 5ppm
T
amb
= 25 Cto15 C
and
T
amb
=+60Cto+65C
[1][2]
- 5 10 ppm
f
xtal
/f
xtal
relative crystal frequency variation crystal aging, first year;
V
DD
or V
BAT
= 3.3 V
[3]
--3ppm
f/V frequency variation with voltage on pin CLKOUT - 1- ppm/V
(1) Typical temperature compensated frequency response.
(2) Uncompensated typical tuning-fork crystal frequency.
Fig 50. Typical characteristic of frequency with respect to temperature
Temperature (°C)
-40 1006008040-20 20
013aaa593
-40
0
40
Frequency
stability
(ppm)
-80
± 5 ppm
± 3 ppm
± 5 ppm
(1)
(2)