Datasheet

PCF2129 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 7 — 19 December 2014 58 of 86
NXP Semiconductors
PCF2129
Accurate RTC with integrated quartz crystal for industrial applications
12. Limiting values
[1] Pass level; Human Body Model (HBM) according to Ref. 7 “JESD22-A114”.
[2] Pass level; Charged-Device Model (CDM), according to Ref. 8 “
JESD22-C101”.
[3] Pass level; latch-up testing according to Ref. 9 “
JESD78” at maximum ambient temperature (T
amb(max)
).
[4] According to the store and transport requirements (see Ref. 14 “
UM10569”) the devices have to be stored at a temperature of +8 C to
+45 C and a humidity of 25 % to 75 %.
Table 78. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DD
supply voltage 0.5 +6.5 V
I
DD
supply current 50 +50 mA
V
i
input voltage 0.5 +6.5 V
I
I
input current 10 +10 mA
V
O
output voltage 0.5 +6.5 V
I
O
output current 10 +10 mA
at pin SDA/CE
10 +20 mA
V
BAT
battery supply voltage 0.5 +6.5 V
P
tot
total power dissipation - 300 mW
V
ESD
electrostatic discharge
voltage
HBM
[1]
- 4000 V
CDM
[2]
- 1250 V
I
lu
latch-up current
[3]
-200mA
T
stg
storage temperature
[4]
55 +85 C
T
amb
ambient temperature operating device 40 +85 C