Datasheet

QT20.241, QT20.241-C1
Q-Series
24V, 20A, THREE PHASE INPUT
Oct. 2006 / Rev. 1.0 DS-QT20.241-EN
All parameters are specified at 24V, 20A, 3x400Vac, 25°C ambient and after a 5 minutes run-in time unless otherwise noted.
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10/23
14. TERMINALS AND WIRING
Type Bi-stable, quick-connect spring clamp terminals. IP20 Finger safe construction.
Suitable for field- and factory installation. Shipped in open position.
Solid wire 0.5-6mm
2
Stranded wire 0.5-4mm
2
American wire gauge 20-10 AWG
Ferrules Allowed, but not required
Wire stripping length 10mm / 0.4inch
Pull-out force 10AWG:80N, 12AWG:60N, 14AWG:50N, 16AWG:40N (according to UL486E)
Fig. 14-1 Connecting a wire
1. Insert the wire 2. Snap the lever
To disconnect wire: same procedure
vice versa
Instructions:
a) Use appropriate copper cables that are designed
for an operating temperature of:
60°C for ambient up to 45°C and
75°C for ambient up to 60°C minimum.
b) Follow national installation codes and
installation regulations!
c) Ensure that all strands of a stranded wire enter
the terminal connection!
d) Up to two stranded wires with the same cross
section are permitted in one connection point
(except PE wire).
e) Do not use the unit without PE connection.
15. RELIABILITY
3AC 400V 3AC 480V
Lifetime expectancy min. 51 000h 48 000h 40°C, 24V, 20A
min. 89 000h 86 000h 40°C, 24V, 10A
min. 144 000h 135 000h 25°C, 24V, 20A
MTBF SN 29500, IEC 61709 690 000h 670 000h 40°C, 24V, 20A
1 194 000h 1 159 000h 25°C, 24V, 20A
MTBF MIL HDBK 217F 284 000h 271 000h 40°C, 24V, 20A, Ground Benign GB40
389 000h 371 000h 25°C, 24V, 20A, Ground Benign GB25
The Lifetime expectancy shown in the table indicates the operating hours (service life) and is determined by the
lifetime expectancy of the built-in electrolytic capacitors.
Lifetime expectancy is specified in operational hours. Lifetime expectancy is calculated according to the capacitor’s
manufacturer specification. The prediction model allows a calculation of up to 15 years from date of shipment.
MTBF stands for Mean Time Between Failure, which is calculated according to statistical device failures, and indicates
reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily
represent the life of a product.