Specification Sheet

SDS1000X-E Series Digital Oscilloscope
1 Mpoints FFT
History Waveforms (History) Mode and
Segmented Acquisition (Sequence)
High Speed Hardware-Based Pass/Fail Function
Gate and Zoom Measurement
The new math co-processor enables FFT analysis of incoming signals
using up to 1M samples per waveform. This provides high frequency
resolution with a fast refresh rate. The FFT function also supports a
variety of window functions so that it can adapt to different spectrum
measurement needs.
Playback the latest triggered events using the history function.
Segmented memory zcquisition will store the waveform into multiple
(up to 80,000) memory segments, each segment will store triggered
waveforms and timestamp each frame.
The SDS1000X-E utilizes a hardware-based Pass/Fail function, performing
up to 40,000 Pass / Fail decisions each second. Easily generate user-
for long-term signal monitoring or automated production line testing.
Through Gate and Zoom measurement, the user can specify an arbitrary
interval of waveform data analysis and statistics. This helps avoid
measurement errors that can be caused by invalid or extraneous data,
Customizable Default Key Complete Connectivity
The current parameters of oscilloscope can be preset to Default Key
through the Save menu.
SDS1000X-E supports USB Host, USB Device (USB-TMC), LAN (VXI-11),
Pass/Fail and Trigger Out