Datasheet

5. Characteristics :
Test Methods
( JIS C 5201-1 )
Natural resistance change per temp.
degree centigrade
Temperature
coefficient
Within the temperature coefficient
specified below :
10Ω to 10MΩ; ± 50 PPM/℃ Max.
1Ω to 9.76Ω; ± 200 PPM/℃ Max.
R
2-R1 x 106 (PPM/℃)
R
1(t2-t1)
R
1: Resistance value at room temperature (t1)
R
2: Resistance value at room temp. plus 100 ℃ (t2)
(Sub-clause 4.8)
Short time
overload
Resistance change rate is
± (0.5% + 0.05Ω) Max. with no
evidence of mechanical damage
Permanent resistance change after the
application of a potential of 2.5 times RCWV
for 5 seconds
(Sub-clause 4.13)
Terminal
strength
No evidence of mechanical
damage
Direct load :
Resistance to a 2.5 kgs direct load for 10 secs.
in the direction of the longitudinal axis of the
terminal leads
Twist test :
Terminal leads shall be bent through 90 ° at
a point of about 6mm from the body of the
resistor and shall be rotated through 360°
about the original axis of the bent terminal in
alternating direction for a total of 3 rotations
(Sub-clause 4.16)
Solderability 95 % coverage Min.
The area covered with a new, smooth,
clean, shiny and continuous surface free from
concentrated pinholes.
Test temp. of solder : 245℃ ± 3℃
Dwell time in solder : 2 ~ 3 seconds
(Sub-clause 4.17)
Metal Film Fixed Resistors
Characteristics Limits
Distributed by Conrad Electronic SE • Klaus-Conrad-Str. 1 • D-92240 Hirschau
Datasheet
V1_0717_01_en
4