Specifications

ADC12D1800RF
www.ti.com SNAS518I –JULY 2011–REVISED JANUARY 2014
3.7 Converter Electrical Characteristics
I-Channel to Q-Channel Characteristics
ADC12D1800RF
Units
Symbol Parameter Conditions
(Limits)
Typ Lim
Offset Match See
(1)
2 LSB
Positive Full-Scale Match Zero offset selected in
2 LSB
Control Register
Negative Full-Scale Match Zero offset selected in
2 LSB
Control Register
Phase Matching (I, Q) f
IN
= 1.0 GHz
(1)
< 1 Degree
X-TALK Crosstalk from I-channel Aggressor = 867 MHz F.S.
−70 dB
(Aggressor) to Q-channel (Victim) Victim = 100 MHz F.S.
Crosstalk from Q-channel Aggressor = 867 MHz F.S.
−70 dB
(Aggressor) to I-channel (Victim) Victim = 100 MHz F.S.
(1) This parameter is specified by design and/or characterization and is not tested in production.
3.8 Converter Electrical Characteristics
Sampling Clock Characteristics
ADC12D1800RF
Units
Symbol Parameter Conditions
(Limits)
Typ Lim
V
IN_CLK
Differential Sampling Clock Input Sine Wave Clock 0.4 V
P-P
(min)
0.6
Level
(1)
Differential Peak-to-Peak
2.0 V
P-P
(max)
Square Wave Clock 0.4 V
P-P
(min)
0.6
Differential Peak-to-Peak
2.0 V
P-P
(max)
C
IN_CLK
Sampling Clock Input Differential 0.1 pF
Capacitance
(2)
Each input to ground 1 pF
R
IN_CLK
Sampling Clock Differential Input See
(1)
100 Ω
Resistance
(1) This parameter is specified by design and/or characterization and is not tested in production.
(2) This parameter is specified by design and is not tested in production.
3.9 Converter Electrical Characteristics
AutoSync Feature Characteristics
ADC12D1800RF
Units
Symbol Parameter Conditions
(Limits)
Typ Lim
V
IN_RCLK
Differential RCLK Input Level
(1)
Differential Peak-to-Peak 360 mV
P-P
C
IN_RCLK
RCLK Input Capacitance
(1)
Differential 0.1 pF
Each input to ground 1 pF
R
IN_RCLK
RCLK Differential Input Resistance See
(1)
100 Ω
I
IH_RCLK
Input Leakage Current;
22 µA
V
IN
= V
A
I
IL_RCLK
Input Leakage Current;
-33 µA
V
IN
= GND
V
O_RCOUT
Differential RCOut Output Voltage 360 mV
(1) This parameter is specified by design and/or characterization and is not tested in production.
Copyright © 2011–2014, Texas Instruments Incorporated Electrical Specifications 25
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