Specifications

1-2 Agilent 4155B/4156B Quick Start Guide, Edition 2
Overview
Agilent 4155B Semiconductor Parameter Analyzer and Agilent 4156B Precision
Semiconductor Parameter Analyzer are fully, automatic, high performance
instruments designed to measure, display graphically, and analyze the dc parameters
and characteristics of semiconductor devices such as diodes, transistors, ICs, solar
cells, and wafers during the fabrication process. You can evaluate device design,
process design, production line, and so on by using the 4155B/4156B.
In semiconductor research and development laboratories, the 4155B/4156B
provides precise characteristics evaluation, which is an important step in the
development of new high performance devices, and gives design engineers an easy
to use method of device parameter acquisition.
On the production line, the 4155B/4156B provides real-time feedback on wafer
evaluation to improve the semiconductor process and to increase production yields.
For semiconductor end users, the 4155B/4156B is ideal for circuit design
applications and incoming inspection.