User's Manual
Table Of Contents
- Agilent Technologies 16750A/B Logic Analyzer
- Agilent Technologies 16750A/B Logic Analyzer
- Contents
- Getting Started
- Step 1. Connect the logic analyzer to the device under test
- Step 2. Choose the sampling mode
- Step 3. Format labels for the probed signals
- Step 4. Define the trigger condition
- Step 5. Run the measurement
- Step 6. Display the captured data
- For More Information...
- Example: Timing measurement on counter board
- Example: State measurement on counter board
- Task Guide
- Probing the Device Under Test
- Choosing the Sampling Mode
- To select transitional timing or store qualified
- Formatting Labels for Logic Analyzer Probes
- Setting Up Triggers and Running Measurements
- Displaying Captured Data
- Using Symbols
- Printing/Exporting Captured Data
- Cross-Triggering
- Solving Logic Analysis Problems
- Saving and Loading Logic Analyzer Configurations
- Reference
- The Sampling Tab
- The Format Tab
- Importing Netlist and ASCII Files
- The Trigger Tab
- The Symbols Tab
- Error Messages
- Must assign Pod 1 on the master card to specify actions for flags
- Branch expression is too complex
- Cannot specify range on label with clock bits that span pod pairs
- Counter value checked as an event, but no increment action specified
- Goto action specifies an undefined level
- Maximum of 32 Channels Per Label
- Hardware Initialization Failed
- Must assign another pod pair to specify actions for flags
- No more Edge/Glitch resources available for this pod pair
- No more Pattern resources available for this pod pair
- No Trigger action found in the trace specification
- Slow or Missing Clock
- Timer value checked as an event, but no start action specified
- Trigger function initialization failure
- Trigger inhibited during timing prestore
- Trigger Specification is too complex
- Waiting for Trigger
- Analyzer armed from another module contains no "Arm in from IMB" event
- Specifications and Characteristics
- Concepts
- Understanding Logic Analyzer Triggering
- Understanding State Mode Sampling Positions
- Getting Started
- Glossary
- Index
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Chapter 2: Task Guide
Displaying Captured Data
time. For example, if you use storage qualification (in the state
sampling mode) or the Pattern Filter analysis tool, you can chart
variable values.
You can use the Distribution display tool to show how often different
values (among the possible values) are captured on a label.
You can use the Compare analysis tool to show the differences between
two measurement data sets. For example, you can run a measurement
on one circuit board, then run the same measurement on a different
circuit board (or on the same circuit board in different environmental
conditions), and compare the results.
You can use the Pattern Filter analysis tool to remove samples from a
measurement data set before displaying or exporting the data. This lets
you look at selected samples without having to re-capture data.
You can use the Serial Analysis toolset to convert streams of serial data
into parallel words which are easier to view and analyze.
You can use the System Performance Analysis toolset to do things like:
isolate the root cause of performance bottlenecks, measure function
execution times, view the occurrence rate of an event, analyze bus
occupation and bandwidth, analyze bus stability, analyze jitter or time
dispersion, etc.
See Also Using the Chart Display Tool (see the Chart Display Tool help volume)
Using the Distribution Display Tool (see the Distribution Display Tool
help volume)
Using the Compare Analysis Tool (see the Compare Tool help volume)
Using the Pattern Filter Analysis Tool (see the Pattern Filter Tool help
volume)
Using the Serial Analysis Tool (see the Serial Analysis Tool help volume)
Using the System Performance Analyzer (see the System Performance
Analyzer help volume)
Measurement Examples (see the Measurement Examples help volume)