User`s guide
1-2
Making Measurements
Using This Chapter
Using This Chapter
This chapter contains the following example procedures for making measurements. Mixer
and time domain measurements are covered in Chapter 2 , "Making Mixer Measurements
(Option 089 Only)" and Chapter 3 , “Making Time Domain Measurements.” This chapter
also describes how to use most display, marker, and sequencing functions.
• Making a Basic Measurement on page 1-4
• Measuring Magnitude and Insertion Phase Response on page 1-7
• Measuring Electrical Length and Phase Distortion on page 1-43
— Electrical Length
— Phase Distortion (deviation from linear phase, group delay)
• Characterizing a Duplexer (ES Analyzers Only) on page 1-50
• Measuring Amplifiers on page 1-53
— Measuring Harmonics
— Measuring Gain Compression
— Measuring Gain Compression and Reverse Isolation Simultaneously
(ES Analyzers Only)
— Making High Power Measurements (ES Analyzers Only)
• Using the Swept List Mode to Test a Device on page 1-68
• Using Limit Lines to Test a Device on page 1-73
• Using Test Sequencing to Test a Device on page 1-113
The following chapters describe how to use more instrument functions (as indicated by
their chapter titles):
• Chapter 4 , "Printing, Plotting, and Saving Measurement Results"
• Chapter 5 , "Optimizing Measurement Results"
• Chapter 6 , "Calibrating for Increased Measurement Accuracy"