User`s guide

Index
Index-11
temperature drift,5-5
terminology, TRL
,7-67
test
bandwidth
,1-92–1-97
ripple limit
,1-82–1-91
test port coupling
,7-10
testportinputpower,increasing
,
5-15
test sequencing
,1-98
changing the sequence title
,
1-103
clearing a sequence from
memory
,1-102
creating a sequence
,1-98
editing a sequence
,1-100
generatingfilesinaloopcounter
example
,1-115
in-depth sequencing
information
,1-105
inserting a command
,1-101
limit test example sequence
,
1-117
loading a sequence from a disk
,
1-104
loopcounterexamplesequence
,
1-114
modifying a command
,1-101
naming files generated by a
sequence
,1-103
printing a sequence
,1-105
purgingasequencefromadisk
,
1-104
running a sequence
,1-100
stopping a sequence
,1-100
storing a sequence on a disk
,
1-104
using to test a device
,1-113
test set, built-in
,7-4
testport output power
,5-7
textfile,savingmeasurementsas
a
,4-44
time delay, decreasing
,5-9
timedomainbandpassmode
,3-4,
3-12
adjusting the relative velocity
factor
,3-12
reflection measurements using
bandpass mode
,3-12
transmission measurements
using bandpass mode
,3-14
time domain low pass impulse
mode
,3-4
time domain low pass mode
,3-15
fault location measurements
using low pass
,3-17
minimum allowable stop
frequencies
,3-16
reflectionmeasurementsintime
domain low pass
,3-16
settingfrequencyrangefortime
domain low pass
,3-15
transmission measurements in
time domain low pass
,3-19
time domain low pass step mode
,
3-4
time domain measurements,
introduction
,3-3
forward transform mode
,3-4
time domain bandpass mode
,
3-4
time domain low pass impulse
mode
,3-4
time domain low pass step
mode
,3-4
time stamp
,4-33
title
,1-106
title, display
,1-11
titling the displayed
measurement
,4-32
to produce a time stamp
,4-33
trace math operation
,7-7
trace noise, reducing
,5-16
tracking
,7-40
tracking the amplitude
,1-41
tracking, amplitude and phase
,
2-38
transform
,7-8
transforming CW time
measurements into the
frequency domain
,3-22
forward transform
measurements
,3-22
transmission measurements in
time domain low pass
,3-19
interpreting the low pass step
transmission response
horizontal axis
,3-20
interpreting the low pass step
transmission response
vertical axis
,3-20
measuring separate
transmissionpathsthrough
the test device using low
pass impulse mode
,3-20
measuring small signal
transient response using
low pass step
,3-19
transmission measurements
using bandpass mode
,3-14
interpreting the bandpass
transmission response
horizontal axis
,3-14
interpreting the bandpass
transmission response
vertical axis
,3-14
transmission measurements,
response and isolation error
correction
,6-17
transmission measurements,
response error correction
,
6-14
transmission response
measurements, making
,3-5
TRLcalibration,performing
,6-53
TRL error correction
assigning standards to various
TRL classes
,6-52
label the calibration kit
,6-52
label the classes
,6-52
performingtheTRLcalibration
,
6-53
TRL error-correction
,6-51
creating a user-defined TRL
calibration kit
,6-51
TRL options
,7-75
TRL terminology
,7-67
TRL* error model
,7-67
TRL*/LRM* calibration
,7-66
fabricating and defining
calibration standards for
TRL/LRM
,7-73
how TRL*/LRM* works
,7-67
improving raw source match
and load match for
TRL*/LRM* calibration
,
7-70
isolation
,7-68
source match and load match
,
7-69
TRL calibration procedure
,7-71
TRL options
,7-75
TRL standards, requirements
,
7-71
TRL terminology
,7-67
TRL* error model
,7-67
TRL*/LRM*two-portcalibration
,
7-55
TRM error correction
,6-54
assigning standards to various
TRM classes
,6-55
creating a user-defined TRM
calibration kit
,6-54
labelingthecalibrationkit
,6-56
labeling the classes
,6-55
modifying the standard
definitions
,6-54
performing the TRM
calibration
,6-56
TTL