User’s Guide Publication Number 54657-97019 August 2000 For Safety information, Warranties, and Regulatory information, see the pages behind the index © Copyright Agilent Technologies 1991-1996, 2000 All Rights Reserved Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules
Measurement/Storage Modules The Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules provide additional measurement and storage capabilities to the Agilent 54600–Series oscilloscopes. The 54657A has a GPIB interface and the 54658A has a RS-232 interface. The 54659B has a RS-232 interface plus an additional parallel output connector which allows the module to be connected to both an RS-232 controller and a parallel printer at the same time. The main features are: • Full Programmability.
Accessories available • 34810B BenchLink/Scope software package. • 10833A 1 meter (3.3 feet) GPIB cable. • 10833B 2 meter (6.6 feet) GPIB cable. • 10833C 4 meter (13.2 feet) GPIB cable. • 10833D 0.5 meter (1.6 feet) GPIB cable. • 13242G 5 meter (16.7 feet) RS-232 cable for printer/plotter and HP Vectra 25-pin serial port. • 17255M 1.2 meter (3.9 feet) RS-232 cable for printer/plotter and HP Vectra 25-pin serial port. • 17255D 1.2 meter (3.9 feet) RS-232 cable for IBM PC/XT 25-pin serial port.
In This Book This book is the user’s guide for the Agilent 54657A, 54658A, and 54659B Measurement/Storage Modules, and contains three chapters. Installation Chapter 1 contains information concerning installation and interconnection of the Measurement/ Storage Modules. Operating the Measurement/Storage Module Chapter 2 contains a series of exercises that guide you through the operation of the Measurement/Storage Modules.
1 Installation 2 Operating the Measurement/ Storage Module 3 Reference Information Index v
vi
Contents 1 Installation Oscilloscope Compatibility 1–2 To install the Measurement/Storage Module 1–3 To configure the interface 1–4 2 Operating the Measurement/Storage Module Math Functions 2–3 Function 1 2–4 Function 2 2–5 FFT Measurement 2–8 Automatic Measurements 2–14 Setting Thresholds 2–15 To make delay measurements automatically 2–19 To make phase measurements automatically 2–21 To make additional voltage measurements automatically 2–23 To make additional cursor measurements 2–25 Unattended Waveform
Contents 3 Reference Information Operating Characteristics Index Contents–2 3–3
1 Installation
Installation This chapter provides you with the information necessary to install the Measurement/Storage Module on the oscilloscope. Information required to connect and configure the module to the desired external devices (such as printer, plotter, computer) prior to local or remote operation is given in the Interface Modules for Agilent 54600-Series Instruments I/O Function Guide shipped with your module.
Installation To install the Measurement/Storage Module To install the Measurement/Storage Module 1 Turn off the oscilloscope. 2 Install the module as shown below. The oscilloscope is reset after installation. The installed module is reflected in the message displayed when you turn on the oscilloscope.
Installation To configure the interface To configure the interface The Measurement/Storage Module can be connected to a printer, a plotter, or a computer through the interface. The 54657A has an GPIB interface and the 54658A has an RS-232 interface. The 54659B has an RS-232 interface plus an additional parallel output connector which allows the module to be connected to both an RS-232 controller and a parallel printer at the same time.
Installation To configure the interface 54658A Serial Connections The signals for the RS-232 port on the 54658A are listed below.
Installation To configure the interface Figure 1– 3 13242G/17255M Cable Printer/plotter/ controller 54658A Module 1 3 2 8 20 1 2 3 4 5 6 7 8 12 11 19 20 25-pin female 7 4 19 11 12 5 6 25-pin male 25-pin male 25-pin female 54645b09.cdr Pin out of 13242G/17255M RS-232 cable Figure 1– 4 54658A Module 24542G Cable Controller 4 2 3 5 6 7 20 1 2 3 4 5 6 8 7 9-pin male 8 25-pin male 9-pin female 25-pin female 54657b10.
Installation To configure the interface 54659B Serial Connections The signals for the 9-pin RS-232 port on the 54659B are listed below.
1–8
2 Operating the Measurement/Storage Module
Operating the Measurement/Storage Module This chapter provides you with the information necessary to use the additional, or enhanced features that the Measurement/Storage Module provides. Basic operation for the oscilloscope is covered in the User and Service Guide for your oscilloscope.
Operating the Measurement/Storage Module Math Functions Math Functions Without the Measurement/Storage module installed, addition and subtraction are the only math operations provided. In addition to the limited selections, the single function is performed on the pixel position of the data on the screen. With the Measurement/Storage module installed, two functions define up to six operations that create mathematically altered waveforms (not pixel math.
Operating the Measurement/Storage Module Function 1 Function 1 1 Press ± . 2 Toggle the Function 1 On Off softkey to enable math function number 1. 3 Press the Function 1 Menu softkey A softkey menu with four softkey choices appears. Three of them are related to the math functions. 4 Toggle the + – * softkey until the desired operation is selected. Results (F1) are displayed on the screen. All operations are calculated on a point-by-point basis.
Operating the Measurement/Storage Module Function 2 Function 2 Function 2 will plot differential or integral waveforms, or perform an FFT using the input signals connected to the vertical inputs (1 and 2), or using the function 1 waveform. 1 Press ± . 2 Toggle the Function 2 On Off softkey to enable math function number 2. 3 Press the Function 2 Menu softkey. 4 Toggle the Operand softkey until the desired source is selected. F1 uses the result waveform in function 1.
Operating the Measurement/Storage Module Function 2 The integrate calculation is relative to the currently selected source’s input offset. The following examples illustrate any changes in offset level. Figure 2– 1 0V 0V Integrate and Offset • FFT (Fast Fourier Transform) inputs the digitized time record of the source and transforms it to the frequency domain. The FFT spectrum is plotted on the oscilloscope display as dBV (dBV or dBm for 54610 and 54615/54616) versus frequency.
Operating the Measurement/Storage Module Function 2 7 Press the Offset (differentiate and integrate) or Ref Levl (FFT) softkey and rotate the knob closest to the Cursors key to set the offset (from the center graticule) or reference level (top graticule) of the resulting waveform. Function waveform (F2) is available for viewing, measurement, or storage. 8 Press the Previous Menu softkey. For FFT functions, an additional menu is available to set additional parameters.
Operating the Measurement/Storage Module FFT Measurement FFT Measurement Operating System Requirements Refer to "Oscilloscope Compatibility" on page 1-2 for operating system requirements for FFT operation. FFT (Function 2) is used to compute the fast Fourier transform using vertical inputs (1 and 2), or the Function 1 waveform. This function takes the digitized time record of the specified source and transforms it to the frequency domain.
Operating the Measurement/Storage Module FFT Measurement Aliasing When using FFT’s, it is important to be aware of aliasing. This requires that the operator have some knowledge as to what the frequency domain should contain, and also consider the effective sampling rate, frequency span, and oscilloscope vertical bandwidth when making FFT measurements. Effective sample rate is briefly displayed when the ± key is pressed.
Operating the Measurement/Storage Module FFT Measurement Spectral Leakage The FFT operation assumes that the time record repeats. Unless there is an integral number of cycles of the sampled waveform in the record, a discontinuity is created at the end of the record. This is referred to as leakage. In order to minimize spectral leakage, windows that approach zero smoothly at the beginning and end of the signal are employed as filters to the FFT.
Operating the Measurement/Storage Module FFT Measurement • Cent Freq Allows centering of the FFT spectrum to the desired frequency. Select and rotate the knob closest to the Cursors key to set the center frequency to the desired value. • Freq Span Sets the overall width of the FFT spectrum (left graticule to right graticule). Select and rotate the knob closest to the Cursors key to set the center frequency to the desired value.
Operating the Measurement/Storage Module FFT Measurement The following FFT spectrum was obtained by connecting the front panel probe adjustment signal to input 1. Set Time/Div to 500 s/div, Volts/Div to 100 mV/div, Units/div to 10.00 dB, Ref Level to –10.00 dBV, Center Freq to 6.055 kHz, Freq Span to 12.21 kHz, and window to Hanning. Figure 2– 3 fft(1) 6.05kHz 12.2kHz 1 STOP f1(F2) = 1.221kHz f2(F2) = 3.662kHz f(F2) = 2.441kHz Cent Freq Freq Span Move 0Hz Autoscale Window Previous 6.055kHz 12.
Operating the Measurement/Storage Module FFT Measurement FFT Measurement Hints – Continued While the FFT spectrum is displayed, use the and Cursor keys to switch between measurement functions and frequency domain controls in FFT menu. See the end of the manual for display menus. Decreasing the effective sampling rate by selecting a slower sweep speed will increase the low frequency resolution of the FFT display and also increase the chance that an alias will be displayed.
Operating the Measurement/Storage Module Automatic Measurements Automatic Measurements With the Measurement/Storage Module installed, the oscilloscope is capable of making five additional automatic voltage and time measurements. • • • • • Delay Measurements Phase Measurements Voltage Amplitude Voltage Overshoot Voltage Preshoot In addition to the measurements, the thresholds used for automatic time measurements are user-selectable.
Operating the Measurement/Storage Module Setting Thresholds Setting Thresholds Without the Measurement/Storage module installed, rise time and fall time measurements are performed at the 10%/90% threshold levels. The remaining five time measurements (frequency, period, duty cycle, positive pulse width, and negative pulse width) are all performed at the 50% transition point. Refer to the User and Service Guide for your oscilloscope for more information.
Operating the Measurement/Storage Module Setting Thresholds Figure 2– 5 User Thresholds 1 Press Time . 2 Press the Next Menu softkey until the Define Thresholds softkey is displayed on the far left side. 3 Press the Define Thresholds softkey. 4 Press the desired Thresholds softkey. A softkey menu with six softkey choices appears. Five of them are related to selecting thresholds. • 10% 90% Rise time/fall time measurements performed at the 10% (lower) and 90% (upper) levels.
Operating the Measurement/Storage Module Setting Thresholds • Voltage Rise time/fall time measurements performed at the lower and upper levels specified by you. Frequency, period, duty cycle, positive pulse width, and negative pulse width measurements will be performed at the center of both entered levels. • Lower This softkey is displayed only when Voltage softkey is selected. Select and rotate the knob closest to the Cursors key to set the lower threshold to the desired value.
Operating the Measurement/Storage Module Setting Thresholds Figure 2– 6 User Threshold Rise Time Measurement 2–18
Operating the Measurement/Storage Module To make delay measurements automatically To make delay measurements automatically You can measure the delay of signals connected to the oscilloscope’s input 1 and input 2 connectors when the Measurement/Storage Module is connected to the oscilloscope. Delay is measured from the user-defined slope and edge count of the signal connected to input 1, to the defined slope and edge count of the signal connected to input 2.
Operating the Measurement/Storage Module To make delay measurements automatically 7 Press the Measure Delay softkey. Delay is measured and displayed on the screen. Negative delay values indicate the defined edge on channel 1 occurred after the defined edge on channel 2. Automatic Delay Measurement Hints If an edge is selected that is not displayed on the screen, delay will not be measured. User thresholds have no effect on automatic delay measurements.
Operating the Measurement/Storage Module To make phase measurements automatically To make phase measurements automatically Phase shift between two signals can be measured using the Lissajous method. Refer to the User and Service Guide for your oscilloscope for more information. With the Measurement/Storage Module installed, phase is automatically measured and displayed.
Operating the Measurement/Storage Module To make phase measurements automatically Figure 2– 8 Automatic Phase Measurement 2–22
Operating the Measurement/Storage Module To make additional voltage measurements automatically To make additional voltage measurements automatically With the Measurement/Storage Module is installed, the following additional automatic voltage measurements can be performed. • Vamplitude Amplitude Voltage measurement is made using the entire waveform. When performing a measurement on a particular cycle, set the controls to display only that cycle is displayed.
Operating the Measurement/Storage Module To make additional voltage measurements automatically 1 Adjust controls until the desired signal is displayed. 2 Press Voltage . 3 Press the Source softkey until the desired source is selected. 4 Press the Next Menu softkey until the Vamp softkey is displayed on the far left side. 5 Press the desired Voltage Measurement softkey. • Vamp Select to perform a voltage amplitude measurement. • Vover Select to perform an overshoot measurement.
Operating the Measurement/Storage Module To make additional cursor measurements To make additional cursor measurements Without the Measurement/Storage Module installed, cursor measurements can be performed on channels 1 through 4, and are displayed in volts (V1/V2) and time (t1/t2). Refer to the User and Service Guide for your oscilloscope for more information.
Operating the Measurement/Storage Module To make additional cursor measurements • V2 reads the percentage the V2 marker has moved from the established 100% position. Negative readings indicate marker has moved through the established V1 marker position. • ∆V reads the percentage difference between the V1 and V2 marker repetitive to the established positions. Negative readings indicate markers have crossed. Figure 2– 10 Voltage Cursor Measurements in Percent 8 Press the Active Cursor t1 t2 softkey.
Operating the Measurement/Storage Module To make additional cursor measurements 11 Press the Set 100% softkey to set the t1 marker to 0° and the t2 marker to 360°. All readings (except second ∆t display in seconds) are now relative to the established t1/t2 marker positions. • t1 reads the phase the t1 marker has moved from established 0° position. Negative readings indicate marker has moved away from the t2 marker. • t2 reads the phase the t2 marker has moved from established 360° position.
Operating the Measurement/Storage Module To make additional cursor measurements Cursor Measurement Hints If cursors are positioned too closely together, an error will be displayed when the SET softkey is selected. Displayed marker readings in percent (%) and degrees (°) are always relative measurements, with the current reading dependent on the previously established 100% or 360 reference setting.
Operating the Measurement/Storage Module Unattended Waveform Monitoring Unattended Waveform Monitoring The Measurement/Storage Module simplifies circuit debugging by comparing an active channel (not functions) trace on the display to one of two test templates. When a failure is detected, the oscilloscope can be instructed to take one of several actions. • The test can be set to stop after the first failure, or to continue regardless of the number of failures found.
Operating the Measurement/Storage Module To create a mask template using Automask To create a mask template using Automask A mask template contains two limit lines: minimum and maximum. Automask allows you to easily generate a mask with tolerances from a displayed waveform on the screen. 1 Connect a known good signal to the oscilloscope. 2 Set up the oscilloscope with the settings that are required to test the signal. 3 Press ± . 4 Press the Mask Test softkey.
Operating the Measurement/Storage Module To create a mask template using Autostore To create a mask template using Autostore An envelope of the passing region can be generated using the Autostore function. Then the Automask function can read the Autostore screen information and take the maximum and minimum limits of it as the limit lines of the mask template. This process allows you to create a mask template from a known good signal, allowing certain tolerance margins.
Operating the Measurement/Storage Module To create a mask template using Autostore 11 Press the Tolerance softkey, then turn the knob closest to the Cursors key to set the tolerance to ±0.0%. If additional tolerance is desired, set the tolerance to the appropriate level. This will be the amount "added on" to the previously created envelope. 12 Press the Create Mask softkey to create the mask from the autostore information.
Operating the Measurement/Storage Module To create or edit a mask using line segments To create or edit a mask using line segments The Measurement/Storage Module has a built-in Mask Editor for creating or editing masks. It provides two editing tools: pixel editing and line drawing editing. The line drawing editing tool can also be used to create a mask using line segments.
Operating the Measurement/Storage Module To create or edit a mask using line segments 5 Toggle the Edit Line softkey to select the limit line you want to edit. 6 Turn the Delay knob to move the X-coordinate of the cursor to the time corresponding to the first point. If a mask has been previously created, both the X and Y coordinate of the cursor will track the selected limit line.
Operating the Measurement/Storage Module To edit an individual pixel of a mask To edit an individual pixel of a mask Previously created masks can be edited pixel-by-pixel using the line drawing editing tool. The Delay knob selects the column to be edited, and the Cursors knob moves the mask vertically. 1 Press ± . 2 Press the Mask Test softkey. 3 Press the Use Mask softkey to select the desired mask number (1 or 2). 4 Press the Define Mask Editor softkey.
Operating the Measurement/Storage Module To edit the mask to test only a portion of a waveform To edit the mask to test only a portion of a waveform In certain circumstances, not all the points on the waveform need to be tested. Only the area of interest needs to be tested. For example, to test the amount of overshoot of a pulse, you only need to test the portion of the waveform after the rising edge. You can select the test region by editing the shape of the mask template. 1 Press ± .
Operating the Measurement/Storage Module To edit the mask to test only a portion of a waveform Mask Editing Operating Hint Each limit line can have its own selectable test region. The figure below shows a mask that tests the overshoot of the waveform. Note that only the part you are interested in is tested. The test region can be set individually for the maximum and minimum limit.
Operating the Measurement/Storage Module To start waveform monitoring To start waveform monitoring Before using a testing mask to monitor a waveform, the mask must be created. Once created, the mask is automatically stored in one of the two nonvolatile mask memories. Procedures for creating a mask template are provided in this chapter. 1 Press ± . 2 Press the Mask Test softkey. 3 Press the Use Mask softkey to select the previously created mask number (1 or 2). 4 Press the Test Options softkey.
Operating the Measurement/Storage Module To start waveform monitoring • Increment This softkey is displayed only when Save To Trace is selected. When On, all test violations are saved by incrementing the trace number. The starting trace number is the one that is currently selected. When the 64K compressed memory is full, the oldest trace memory is overwritten, and the trace count continues incrementing. When the trace count reaches 100, the number resets to 1 (wraps around).
Operating the Measurement/Storage Module To automatically save test violations To automatically save test violations The signals that fail the waveform monitoring test can be saved, then viewed/measured at a later time. Provisions are provided to save the violations in trace memory, or print a hardcopy of the data. When trace is selected, the option of saving only the last violation, or saving all violations are provided. 1 Setup for waveform monitoring as described previously. 2 Press ± .
Operating the Measurement/Storage Module To automatically save test violations Saving Test Violation Data Operating Hint When Increment On is selected, traces ≥3 to 100 are stored in the compressed state. During the compression and storage of data, new signals are not acquired or tested. The time it takes to compress and store data is less than 10 seconds. When Increment On is selected, and multiple violations are desired, the On Fail softkey must be set to Run (in the Test Options menu).
Operating the Measurement/Storage Module Creating a delay testing mask Creating a delay testing mask A mask can be used to test the channel to channel delay of two input signals. The shape of the mask varies depending on the channel 2 edge selected (stop edge). Different masks are needed for different edge selections. To test the channel to channel delay of the signal connected to channel 2, the stop edge of the signal is tested instead of actually measuring the delay.
Operating the Measurement/Storage Module Creating a delay testing mask The following procedure can be used to setup a mask template for testing channel to channel delay. In the oscilloscope setup, the controls should be selected to display the start edge (channel 1) as the first edge on the display, and the stop edge (channel 2) as the last edge on the display. The trigger source should be set to trigger from channel 1.
Operating the Measurement/Storage Module Creating a frequency testing mask Creating a frequency testing mask A mask can be used to test the frequency of the input signal. The shape of the mask varies depending on the shape of the signal to be tested. A mask designed for testing a sine wave cannot be used to test a square wave. Different masks are needed for different shapes of signals.
Operating the Measurement/Storage Module Creating a frequency testing mask The following procedure can be used to setup a mask template for testing the frequency of a sine wave or a square wave. Similar methods can be used to generate masks for testing the frequency of signals of other shapes. In the oscilloscope setup, the vertical sensitivity and position should be adjusted so that the amplitude is almost full scale. The trigger level should be adjusted to the middle of the input signal.
Operating the Measurement/Storage Module Creating an overshoot testing mask Creating an overshoot testing mask There are two parameters associated with the overshoot of a signal: the percentage of overshoot and the settling time of the overshoot. A mask template can be created to test the upper limit of these two parameters at the same time. The following figure shows an example of a mask template for testing overshoot.
Operating the Measurement/Storage Module Creating an overshoot testing mask The critical factors for creating the mask template are: • The vertical window of the middle region of the mask template determines the upper limit of the overshoot. • The horizontal window of the middle region determines the upper limit of the settling time. • The vertical window of the rightmost region determines the settling window. Normally, the settling window is ±5% or ±10% of the V top voltage.
Operating the Measurement/Storage Module Creating a rise time testing mask Creating a rise time testing mask Mask template testing can be used to test the rise time of a signal, including specifying an upper limit for rise time. For example, you can specify that the rise time must be 15 ns or faster to pass the test. Use the voltage and time readouts of the mask editor to ensure the correct settings.
Operating the Measurement/Storage Module Creating a rise time testing mask 1 Determine the top and base of the signal. Use the automatic measurement Vtop and Vbase of the oscilloscope to determine these values. 2 Calculate the 10% and 90% points. 3 Determine the upper limit for the rise time. 4 Draw the mask template using the mask editor. The mask should look similar to the one in the following figure.
Operating the Measurement/Storage Module Testing the eye opening of an eye-pattern signal Testing the eye opening of an eye-pattern signal There are generally two tests that you want to perform on an eye-pattern signal: an eye boundary test and an eye opening test. Since the eye boundary can be easily tested by using the normal mask template testing, this section mainly focuses on how to create the mask for testing the eye opening.
Operating the Measurement/Storage Module Testing the eye opening of an eye-pattern signal 1 Set up the oscilloscope for proper viewing of the eye-pattern signal. 2 Determine the fail region. 3 Create the mask using the line drawing capabilities of the mask editor. The voltage and time readouts in the mask editor can be used to ensure the correct shape and position of the mask. An example of how the mask template looks during testing is shown below. 4 Select the fail region as Inside of the mask template.
Operating the Measurement/Storage Module To save or recall traces To save or recall traces With the Measurement/Storage Module installed, the two volatile pixel memories are replaced with four high-speed non-volatile memories. In addition, 64 Kbytes of nonvolatile trace memory with data compression is also provided. A data compression algorithm maximizes the number of traces and front-panel setups that can be stored into this memory.
Operating the Measurement/Storage Module To save or recall traces • Recall Setup Recalls the previously stored front-panel setup that was saved with the waveform for the trace selected. • Edit Label Used to enter a 20 character label that identifies the stored waveform. See "Create a Label for Trace Memory" later in this chapter for more information. 3 Turn the knob closest to the Cursors key to move the cursor in the character area to select the desired trace location (from 1 to 100).
Operating the Measurement/Storage Module To create a label for a trace memory To create a label for a trace memory Each trace stored in Measurement/Storage Module can have a label up to 20 characters long to identify the stored waveform. 1 Press Trace . 2 Press the Edit Label softkey. A softkey menu with six softkey choices appears. Five of them are related to editing the message. • Enter Enters the highlighted character in the character area into the message area under the cursor position.
Operating the Measurement/Storage Module To set real-time clock To set real-time clock Time (24-hour format) and date tagging of hard copy and nonvolatile trace memories is provided using a built in, battery backed up real-time clock. To set time and date, or view current contents: 1 Press Print/Utility . 2 Press the Set Clock softkey. 3 Press the Set Time softkey. A softkey menu with five choices appears. Four of them are related to setting the real-time clock time.
Operating the Measurement/Storage Module To set real-time clock 4 Press the Set Date softkey. A softkey menu with six choices appears. Five of them are related to setting the real-time clock date. • Day Selects the day. Current selection can be changed using the knob closest to the Cursors key, or by repeatedly pressing the softkey. • Month Selects the month. Current selection can be changed using the knob closest to the Cursors key, or by repeatedly pressing the softkey.
3 Reference Information
Reference Information This chapter contains reference information for the Measurement/Storage Modules including its operating characteristics.
Reference Information Operating Characteristics Operating Characteristics Operating Characteristics are specified with the Measurement/Storage Module installed on an Agilent 54600–Series Oscilloscope. Measurements Voltage Vamp, Vavg, Vrms, Vpp, Vpre, Vovr, Vtop, Vbase, Vmin & Vmax Time Delay, Duty Cycle, Frequency, Period, Phase Angle, Rise Time, Fall Time, +Width, & –Width Thresholds User-selectable among, 10%/90%, 20%/80% or voltage levels Cursor Readout Voltage, time, percentage, and phase angle.
Reference Information Operating Characteristics Selectable Windows Four windows are selectable: Hanning, for best frequency resolution and general purpose use; flattop, for best amplitude accuracy; rectangular, for single-shot signals such as transients and signals where there are an integral number of cycles in the time record, and exponential for best transient analysis.
Reference Information Operating Characteristics Figure 3–1 Effective Sample Rate Frequency Span 5 GHz 5.E+09 5 GSa/s 5.E+08 500 MSa/s 500 MHz 5.E+07 50 MSa/s 50 MHz 5.E+06 5 MSa/s 5 MHz 5.E+05 500 kSa/s 500 kHz FFT operation limited by bandwidth of scope 5.E+04 50 kHz 5.E+03 5 kHz 5.E+02 500 Hz 5.E+01 50 Hz Frequency Span in Hz Samples/s 5.E+10 0.
Reference Information Operating Characteristics Mask Template Testing Number of mask templates 2, nonvolatile Mask template generation Automask generates a mask from waveform data with variable tolerances. Mask editor allows pixel-by-pixel editing and line drawing editing. Smooth mask function performs a running average of 3 pixels. Test Region Each pixel is selectable to be tested or not Fail Region Inside-signal fails if it falls inside the region bounded by the maximum and minimum limit lines.
Reference Information Operating Characteristics RS-232 Configurations Connector Type With the adapter cable connected, at the end of the cable is a 9 pin/25 pin DTE port; a printer cable is required to connect it to hardcopy devices or a computer. Protocols XON/XOFF, hardware. Data Bits 8 Stop Bits 1 Parity: none. Baud Rates 1200, 2400, 9600, 19200. Programmability All instrument settings and operating modes may be remotely programmed via RS-232 and GPIB (IEEE-488).
3–8
Index ! ∫dt, 2–5 A aliasing, 2–9 Automask, 2–30 automatic measurements, 2–14 delay, 2–19 phase, 2–21 Vamplitude, 2–23 voltage, 2–23 Vovershoot, 2–23 Vpreshoot, 2–23 Autostore, 2–31 C cable, 1–4 GPIB, 1–4 parallel, 1–4 RS-232, 1–4, 1–6 to 1–7 center frequency, 2–11 clock, set, 2–55 compatibility, 1–2 configure module, 1–4 connector DB25, 1–5 DB9, 1–7 create a mask Automask, 2–30 Autostore, 2–31 delay, 2–42 eye-pattern, 2–50 frequency, 2–44 line segments, 2–33 overshoot, 2–46 rise time, 2–48 create a trace m
Index N Nyquist frequency, 2–9 O operating characteristics, 3–3 FFT, 3–3 hardcopy output, 3–6 mask template testing, 3–6 measurments, 3–3 programmability, 3–7 real-time clock, 3–6 RS-232 configurations, 3–7 trace memory, 3–6 operating system, 1–2 oscilloscope compatibility, 1–2 overshoot testing mask, 2–46 P parallel cable, 1–4 phase measurements, 2–21 phase shift, 2–21 pixel editing, 2–35 plus (+), 2–4 programmability, operating characteristics, 3–7 R real time clock, operating characteristics, 3–6 real-t
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Product Regulations Safety IEC 1010-1:1990+A1 / EN 61010-1:1993 UL 3111 CSA-C22.2 No.1010.1:1993 EMC This Product meets the requirement of the European Communities (EC) EMC Directive 89/336/EEC. Emissions EN55011/CISPR 11 (ISM, Group 1, Class A equipment) Immunity EN50082-1 IEC 555-2 IEC 555-3 IEC 801-2 (ESD) 4kV CD, 8kV AD IEC 801-3 (Rad.) 3 V/m IEC 801-4 (EFT) 0.5 kV, 1kV Sound Pressure Level Code1 1 1 1,2 2 1,2 Notes2 * * 1 Performance Codes: 1 PASS - Normal operation, no effect.
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Press this key . . . Voltage Time Cursors . . .
Press this key . . . Print Utility Trace Trace . . .
