Specifications

Test Capabilities and System Requirements 109Appendix A
Appendix A
Test Capabilities and System
Requirements
Appendix Contents
This appendix lists the test capabilities of the Agilent TS-5400 System, and
the physical and electrical requirements to operate the system. This
appendix is separated as follows:
• Test Capabilities – Measurement Sample Methods . . . . . . . page 109
• System Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 114
• Miscellaneous Specifications . . . . . . . . . . . . . . . . . . . . . . . . page 117
• Electromagnetic Compatibility Requirements . . . . . . . . . . . page 117
Test Capabilities – Measurement Sample Methods
The following test capabilities calculations help you determine if the Agilent
TS-5400 Test System can meet your Device Under Test (DUT) test
requirements. The test capabilities of the Agilent TS-5400 system include
the specifications of the VXI modules (see Chapter 1 on page 11) used in the
test(s) and the offsets in the system environment due to the measurement
paths. The largest contributors to measurement variations are the VXI
instruments and the relays in the paths.
The process for determining system capabilities is:
1. Determine the accuracy required to test the DUT. For example, a
particular output driver test measurement requires a measurement of
12.5 volts ±10 mV.
2. Determine the path, including the number of relays, to the DUT from
the Agilent E1411B DMM.
3. Determine the specification of the instrument from the module
manual specifications section (usually in Appendix A) for the
particular range which will be used for the test.
4. Calculate the sum of the accuracy uncertainty due to VXI modules'
specifications and system switch paths, and compare it to accuracy
required by the DUT.
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