Specifications
132 Glossary 
ITA 
Interface Test Assembly - The DUT half of the mass interconnect. It is the base of the test fixture.
J
Jumper Comb 
A comb-shaped shorting bar with a plastic covering over the metal spine of the comb. It is used to jumper 
together some or all the NO or NC terminals on a load card. 
K
Keyword 
An identifier used to restrict the number of matches found when searching for a specific item. Keywords 
often describe the item; for example, suitable keywords for an action might be “trigger” or “range” to 
identify what the action does or how it is used.
L
LADDR 
 Logical Address - The address set on a VXIbus module that is unique to that system. In the TS-5400 
system this usually corresponds to its slot number. If the module goes in the second mainframe of a two 
mainframe system, then the LADDR would be the slot number plus 128.
LEM module
A current transducer which measures currents with galvanic isolation between the primary and the 
analog output signal. The LEM module tested with the TS-5400 has multiple primary coil taps that 
allows it to be set for five different current levels.
Library
A collection of related code stored in one or more directories. Agilent TestExec SL supports libraries of 
actions and libraries of tests. Organizing actions and tests into libraries makes it easier to find and 
manage existing code so you can reuse it.
Load Card
A C-sized card designed to fit in the Switch/Load Unit that provides switching for the various loads, and 
provisions for either internal load mounting, or connections for external load mounting. Load cards 
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