User`s guide

Specifications Definition of Terms
38 Agilent 81689A, 81689B and 81649A Tunable Laser Modules User’s Guide, Third Edition
Conditions: uninterrupted TLS output power, constant wavelength,
temperature within ±1 K, short time span.
Measurement with optical power meter.
NOTE The long-term power repeatability can be obtained by taken the power
repeatability and power stability into account.
Power Stability
The change of the power level during given time span, expressed as ±
half the span (in dB) between the highest and lowest actual power.
Conditions: uninterrupted TLS output power, constant wavelength
and power level settings, temperature within ±1 K, time span as
specified.
Measurement with optical power meter.
Relative Intensity Noise (RIN)
The square of the (spectrally resolved) RMS optical power amplitude
divided by the measurement bandwidth and the square of the average
optical power, expressed in dB/Hz.
Conditions: at specified output power, coherence control off,
temperature within operating temperature range, frequency range 0.1
to 6 GHz.
Measurement with Agilent Lightwave Signal Analyzer.
Relative Wavelength Accuracy
When randomly changing the wavelength and measuring the
differences between the actual and displayed wavelengths, the relative
wavelength accuracy is ± half the span between the maximum and the
minimum value of all differences.
Conditions: uninterrupted TLS output power, constant power level,
temperature within operating temperature range, observation time 10
minutes maximum (constant temperature), coherence control off,
measured at high power output.
Measurement with wavelength meter. Averaging time given by
wavelength meter, ≥1 s.