Specifications

12
Innovative
Applications
Fast and accurate
noise figure
measurements
(Options 028, 029)
Noise figure measurement challenges with traditional, Y-factor approach
• Multiple instruments and multiple connections required
to fully characterize DUT
• Measurement accuracy degrades in-fixture, on-wafer,
and automated-test environments, where noise source
cannot be connected directly to DUT
• Measurements are slow, often leading
to fewer measured data points and
misleading results due to under-sampling
PNA-X noise figure solution provides:
• Amplifier and frequency converter measurements with the highest accuracy
in the industry, using advanced error-correction methods
• Fast measurements: typically 4 to 10 times faster than Agilent’s NFA Series
noise figure analyzers
• Ultra-fast noise-parameter measurements when used with Maury Microwave
automated tuners, giving 200 to 300 times speed improvements
0
1
2
3
4
5
0 5 10 15 20 25
Frequency (GHz)
PNA-X method using source correction
Traditional Y-factor technique
Under-sampled data
Noise Figure (dB)
On-wafer
automated-test
environment
Noise source
AUT
Wafer
probes
For Y-factor measurements, any electrical network connected
between the noise source and the DUT, such as cables, switch
matrices, and wafer probes, causes significant accuracy
degradation.
For this 401 point measurement of an unmatched transistor, the
PNA-X exhibits much less ripple compared to the Y-factor method.
The NFA default of 11 trace points would give under-sampled and
therefore misleading results of the amplifier’s performance.
“I haveseveral instruments in my equipment pool that can measure noise figure —
8970s, NFAs, and spectrum analyzers. My biggest problem for noise figure
measurements was lack of correlation—I’d get different answers depending
on which instrument I used. Now, with the PNA-X’s high accuracy, I know I’ll get
the right answer every time, no matter which PNA-X I use.”
Test Engineering Manager