Technical data

3-2 Chapter 3
Adjustments and Correction Constants
This chapter contains the following adjustment procedures:
• A9 Switch Positions on page 3-6
• Source Default Correction Constants (Test 44) on page 3-7
• Source Pretune Default Correction Constants (Test 45) on page 3-8
• Analog Bus Correction Constants (Test 46) on page 3-9
• Source Pretune Correction Constants (Test 48) on page 3-10
• RF Output Power Correction Constants (Test 47) on page 3-11
• IF Amplifier Correction Constants (Test 51) on page 3-16
• ADC Offset Correction Constants (Test 52) on page 3-18
• Sampler Magnitude and Phase Correction Constants (Test 53) on page 3-19
• Cavity Oscillator Frequency Correction Constants (Test 54) on page 3-25
• Serial Number Correction Constants (Test 55) on page 3-30
• Option Numbers Correction Constants (Test 56) on page 3-31
• Initialize EEPROMs (Test 58) on page 3-32
• EEPROM Backup Disk Procedure on page 3-33
• Correction Constants Retrieval Procedure on page 3-34
• Loading Firmware on page 3-35
• Fractional-N Frequency Range Adjustment on page 3-39
• Frequency Accuracy Adjustment on page 3-42
• High/Low Band Transition Adjustment on page 3-45
• Fractional-N Spur Avoidance and FM Sideband Adjustment on page 3-47
• Source Spur Avoidance Tracking Adjustment on page 3-50
• Unprotected Hardware Option Numbers Correction Constants on page 3-52