User`s guide

Index
Index-3
device measurements, 6-4
device under test
measuring
, 1-5
device under test, connecting
, 1-4
device, bilateral
, 6-22, 6-25
device, noninsertable
, 6-69
direct sampler access
configurations, using
, 5-16
directional coupler response,
compensating for
, 6-35
discrete markers
, 1-24
disk
formatting
, 4-51
disk, plotting a measurement to
,
4-11
display elements, choosing
, 4-13
display functions
, 1-10
active channel display
, 1-11
titling
, 1-11
adjusting colors of the display
,
1-22
blanking the display
, 1-21
data trace
saving to display memory
,
1-19
four-channel display
4 Param Displays softkey
,
1-18
Channel Position softkey
, 1-17
customizing
, 1-17
viewing
, 1-14
measurement data
dividing by the memory trace
,
1-20
subtracting memory trace
,
1-20
viewing
, 1-20
memory math functions
, 1-19
memory trace
viewing
, 1-20
memory traces
, 1-19
primary measurement
dual channel mode with
decoupled channel power
,
1-14
dual channel mode with
decoupled stimulus
, 1-13
primary measurement
channels
, 1-12
viewing
, 1-12
ratio measurements in channel
1 and 2, to
, 1-20
display intensity
, 1-22
display markers
coupling
, 1-31
uncoupling
, 1-31
display markers, activating
, 1-25
display memory
, 1-19, 7-9
display reference value, setting
,
1-38
display ripple test limits
, 1-91
display ripple test values
, 1-92
displayed measurement, titling
,
4-30
displaying the bandwidth
markers
, 1-98
displaying the bandwidth value
,
1-99
drift, frequency
, 5-5
drift, temperature
, 5-5
dual channel mode with decoupled
power
, 1-14
dual channel mode with decoupled
stimulus
, 1-13
dual-channel operation
, 1-58,
7-88
duplexer, characterizing
, 1-50
dynamic range, increasing
, 5-14
E
ECal
, 6-58–??
adapter removal calibration,
6-69–??
calibration, 6-58–6-68
confidence check
, 6-65
equipment
, 6-59
isolation calibration
, 6-60
manual thru
, 6-60
module information
, 6-64
options
, 6-60
service menu
, 6-67
edit limits menu
, 7-83
edit segment menu
, 7-83
editing a sequence
, 1-103
deleting commands
, 1-103
editing line segments
, 1-82
editing ripple limits
, 1-88–1-90
electrical
length
, 1-44
offset
, 6-6
electrical delay
, 7-35
electrical delay block
, 7-8
electrical delay, determining
, 6-73
electrical delay, setting
, 1-39
electrically long devices
, 5-4
electronic calibration. See ECal
eliminating unwanted mixing and
leakage signals
, 2-6
embedding loop counter value in
title
, 1-109
enhanced frequency response
error correction
, 6-22
enhanced reflection error
correction
, 6-22, 6-25
enhancement, accuracy
, 7-39
entering the power sensor
calibration data
, 6-34
deleting frequency signals
, 6-35
editing frequency segments
,
6-34
error
minimizing error while using
adapters
, 6-47
error correcting measurements
,
6-10
error correction
enhanced frequency response
,
6-22
enhanced reflection
, 6-22, 6-25
frequency response
, 6-12
full two-port
, 6-29
one-port reflection
, 6-26
error-correction
, 1-5
stimulus state
, 6-9
error-correction, vector
, 7-8
errors, measurement
, 7-40
exit HPGL mode
, 4-24
sending to the printer
, 4-24
external
calibration
, 5-12
disk drive
, 4-51
R channel inputs
, 2-10
switches, controlling
, 1-122
external source mode
, 7-84
capture range
, 7-86
compatible sweep types
, 7-86
CW frequency range
, 7-86
external source auto
, 7-85
external source manual
, 7-85
in-depth description
, 7-85
locking onto a signal with
frequency modulation
component
, 7-86
primary applications
, 7-84
requirements
, 7-86
typical test setup
, 7-84
F
fabricating and defining
calibration standards for
TRL/LRM
, 7-74
fast 2-port calibration
, 5-12
fault location measurements
using low pass
, 3-18
features that operate differently
in sequence
, 1-108
feedthrough, RF
, 2-46
file
deleting
, 4-49
index numbers
, 4-43
recalling
, 4-50