User`s guide

Index-6
Index
introduction to time domain
measurements
, 3-3
isolation
, 7-42, 7-70
averaging
, 6-60
calibrating using ECal
, 6-60
calibration, omitting
, 6-4
error corrections and frequency
response
, 6-17
isolation example measurements
,
2-44
LO to RF isolation
, 2-44
RF feedthrough
, 2-46
SWR/return loss
, 2-49
J
jpeg files, saving results as
, 4-44
K
knowing the instrument modes
,
7-84
L
labeling the screen
, 2-31
leakage signals, eliminating
unwanted
, 2-6
limit line operation
, 7-82
edit limits menu
, 7-83
edit segment menu
, 7-83
offset limits menu
, 7-83
limit lines
creating flat limit lines
, 1-77
creating single point limits
, 1-81
editing line segments
, 1-82
measurement parameters
, 1-76
offsetting limit lines
, 1-83
running a limit test
, 1-82
sloping limit line
, 1-79
using to test a device
, 1-76
limit test
decision making
, 1-114
example sequence
, 1-120
limit test, running
, 1-82
activating the limit test
, 1-82
reviewing the limit line
segments
, 1-82
line segments, editing
, 1-82
deleting line segments
, 1-82
line types, selecting
, 4-15
linear frequency sweep
, 7-16
linear magnitude format
, 7-30
linear phase, deviation
, 1-47
linear sweep
, 1-62
linearity, phase
, 2-34
list values, printing or plotting
,
4-32
LO frequency accuracy and
stability
, 2-10
LO to RF isolation
, 2-44
load match
, 7-41, 7-72
load mismatches, minimizing
, 2-4
loading a sequence from a disk
,
1-107
local key
, 7-79
locking onto a signal with
frequency modulation
component
, 7-86
log magnitude format
, 7-25
logarithmic frequency sweep
, 7-16
loop counter
decision making
, 1-115
example sequence
, 1-117
value
, 2-29
loss of power meter calibration
data
, 6-33
low pass impulse mode
, 3-20
lower stopband parameters
, 1-73
M
magnitude
measuring
, 1-7
measuring response
, 1-7
maintenance
, 8-2
making a basic measurement
, 1-4
choosing measurement
parameters
, 1-4
connecting required test
equipment
, 1-4
connecting the device under
test
, 1-4
error-correction
, 1-5
frequency range, setting
, 1-5
measurement, setting
, 1-5
measuring the device under
test
, 1-5
outputting measurement
results
, 1-6
source power, setting
, 1-5
making harmonic measurements
,
1-56
making non-coaxial
measurements
, 6-48
fixtures
, 6-48
making reflection response
measurements
, 3-9
making transmission response
measurements
, 3-5
manual mode
, 7-10
manual sweep time mode
, 7-12
manual thru
, 6-60
margin
ripple test value
, 1-92, 1-94
markers
, 1-24
calculating statistics of
measurement data
, 1-43
continuous
, 1-24
coupling display markers
, 1-31
CW frequency, setting
, 1-39
delta markers
, 1-28
discrete
, 1-24
display markers
activating
, 1-25
fixed marker
activating
, 1-29
moving marker information off
of the grids
, 1-26
polar format markers
, 1-32
setting measurement
parameters
, 1-35
smith chart markers
, 1-34
specific amplitude, searching
for
, 1-40
uncoupling display markers
,
1-31
masking
, 3-26
matched adapters
, 6-45
maximum amplitude, searching
for
, 1-40
maximum and minimum
, 1-97
maximum bandwidth
, 1-97
measurement
accuracy, increasing
, 5-4
calibration, power meter
, 6-33
fault location using low pass
,
3-18
high dynamic range
, 2-23
isolation example
, 2-44
non-coaxial
, 6-48
plotting to a disk
, 4-11
printing or plotting results
, 4-3
reflection response
, 3-9
results, outputting
, 1-6
results, saving
, 4-37
results, saving graphically
, 4-44
setting
, 1-5
time domain
, 3-3
transmission measurements in
time domain low pass
, 3-19
transmission response
, 3-5
measurement calibration
, 7-39
accuracy enhancement
, 7-39,
7-53
characterizing microwave
systematic errors
, 7-43
measurement errors
, 7-40
measurement considerations
, 2-4
eliminating unwanted mixing
and leakage signals
, 2-6
frequency offset mode operation
,
2-10