User`s guide

Index
Index-11
S-parameters, 7-21
S-parameter menu
, 7-23
understanding
, 7-21
S-parameters menu
input ports menu
, 7-24
specific amplitude
, 1-40
bandwidth, searching for
, 1-42
maximum amplitude, searching
for
, 1-40
minimum amplitude, searching
for
, 1-40
target amplitude, searching for
,
1-41
tracking the amplitude
, 1-42
spreadsheet, saving test file for a
,
4-42
spur avoidance, understanding
,
5-18
spurious responses, reducing the
effect of
, 2-5
standards, calibration
, 6-5
start frequency, setting
, 1-35
starting the ripple test
, 1-90
statistics of measurement data,
calculating
, 1-43
stepped edit list menu
, 7-17
stepped edit subsweep menu
, 7-17
stepped list frequency sweep
, 7-16
segment menu
, 7-17
stepped edit list menu
, 7-17
stepped edit subsweep menu
,
7-17
stepped list mode
, 1-71
stimulus state, error-correction
,
6-9
stop frequencies, minimum
allowable
, 3-16
stop frequency, setting
, 1-36
stopping a sequence
, 1-103
stopping the ripple test
, 1-90
storing
exit HPGL mode and form feed
sequence
, 4-24
HPGL initialization sequence
,
4-23
sequence on a disk
, 1-106
sweep
rate, decreasing
, 5-8
speed, increasing
, 5-9
type, setting
, 5-11
sweep time
, 7-12
auto sweep time mode
, 7-12
manual sweep time mode
, 7-12
minimum sweep time
, 7-12
sweep types
, 7-16
CW time sweep
, 7-20
linear frequency sweep
, 7-16
logarithmic frequency sweep
,
7-16
power sweep
, 7-20
selecting sweep modes
, 7-20
stepped list frequency sweep
,
7-16
swept list frequency sweep
, 7-18
sweep-to-sweep averaging
, 7-7
swept edit list menu
, 7-18
swept edit subsweep menu
, 7-18
swept list frequency sweep
, 7-18
setting segment IF bandwidth
,
7-19
setting segment power
, 7-19
swept edit list menu
, 7-18
swept edit subsweep menu
, 7-18
swept list mode
calibrate
, 1-74
characteristics of the filter
, 1-72
device under test, connect
, 1-71
measure
, 1-74
measurement parameters
, 1-72
stepped list mode
, 1-71
to test a device
, 1-71
swept list mode, using
, 5-9
swept RF/IF conversion loss, high
dynamic range
, 2-20
switch protection, source
attenuator
, 7-14
SWR format
, 7-31
SWR/return loss
, 2-49
synthesized source, built-in
, 7-4
system
bandwidth, changing
, 5-15
bandwidth, widening
, 5-11
parameters
, 5-17
system controller mode
, 7-80
system operation
, 7-3
built-in synthesized source
, 7-4
built-in test set
, 7-4
microprocessor
, 7-5
receiver block
, 7-4
required peripheral equipment
,
7-5
systematic errors
, 7-43
T
taking care of microwave
connectors
, 5-3
talker/listener mode
, 7-80
target amplitude, searching for
,
1-41
temperature drift
, 5-5
terminology, TRL
, 7-69
test
bandwidth
, 1-95–1-100
ripple limit
, 1-85–1-94
test port coupling
, 7-11
test port input power, increasing
,
5-14
test sequencing
, 1-101
changing the sequence title
,
1-105
clearing a sequence from
memory
, 1-105
creating a sequence
, 1-101
editing a sequence
, 1-103
generating files in a loop counter
example
, 1-118
in-depth sequencing
information
, 1-108
inserting a command
, 1-104
limit test example sequence
,
1-120
loading a sequence from a disk
,
1-107
loop counter example sequence
,
1-117
modifying a command
, 1-104
naming files generated by a
sequence
, 1-106
printing a sequence
, 1-107
purging a sequence from a disk
,
1-107
running a sequence
, 1-103
stopping a sequence
, 1-103
storing a sequence on a disk
,
1-106
using to test a device
, 1-116
test set, built-in
, 7-4
text file, saving measurements as
a
, 4-42
thru, manual
, 6-60
time delay, decreasing
, 5-8
time domain bandpass mode
, 3-4,
3-12
adjusting the relative velocity
factor
, 3-12
reflection measurements using
bandpass mode
, 3-12
transmission measurements
using bandpass mode
, 3-14
time domain low pass impulse
mode
, 3-4
time domain low pass mode
, 3-15
fault location measurements
using low pass
, 3-18
minimum allowable stop
frequencies
, 3-16
reflection measurements in time
domain low pass
, 3-16
setting frequency range for time
domain low pass
, 3-15