User`s guide

10 Agilent 81600B Tunable Laser Source Family, Fourth Edition
Figure 39 Test Setup for Total Source Spontaneous Emission Test
- Low SSE output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
Figure 40 Test Setup for Total Source Spontaneous Emission Test
- High Power output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131
Figure 41 Test Flow - Dynamic Wavelength Accuracy Measurements . . . . . 136
Figure 42 Setup for wavelength uncertainty verification in swept mode . . . 137
Figure 43 Optimization of reference scans. Sampling points as circled,
threshold in dashed line. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 140
Figure 44 Measurement Setup to Determine the Sweep Speed . . . . . . . . . . . 145