User`s guide

Performance Tests Power Tests
122 Agilent 81600B Tunable Laser Source Family, Fourth Edition
12
Calculate spectral SSE by using the following equation:
Spectral SSE
= |power@SSE_peak| - |max_SSE_power| + 3 [dB/nm]
Note the value in the Test Record.
Signal-to-Total-Source Spontaneous
Emission Ratio - Low SSE Ouptput
For definition, see “Signal to total source spontaneous emission ratio” on
page 47.
Measurement Principle
The TLS module is set to a number of wavelengths. For each wavelength,
the Signal-to-Source Spontaneous Emission Ratio (SSE) spectrum is
measured in the specified wavelength range using an OSA resolution
bandwidth of 1 nm. One sample per nm is taken and summed to the total
SSE. The SSE spectrum near the signal (within a ±3 nm window) is
substituted by the average SSE based on the last sample on the left, at -3
nm, and the first sample on the right, at +3 nm.
Extrapolation to an RBW of 1 nm: The measurements were performed
at a resolution bandwidth of 0.5 nm. Adding 3 dB takes the resolution to
1 nm, so giving the SSE in [dB/nm]
(A factor of 2 in the RBW gives 2 x power = 3 dB).
For example:
RBW = 0.5 nm results in |SSE
0.5 nm
| = 44.3 dB measured
RBW = 1 nm extrapolates to |SSE
1nm
| = |SSE
0.5 nm
| - 3 dB
= 44.3 dB - 3 dB = 41.3 dB.
NOTE
Qualified Agilent Service Center recommended: Although the
following description should allow users to verify their products'
performance, due to the high complexity of this test Agilent recommends
that it be performed in a qualified Agilent Service Center.
NOTE