Help Volume © 1992-2002 Agilent Technologies. All rights reserved.
Agilent Technologies 16760A Logic Analyzer The Agilent Technologies 16760A 1500 Mb/s State/800 MHz Timing logic analyzer offers 64M deep memory with up to 170 channels on a single time base (5 cards, 34 channels per card). Differential probing captures input signals as low as 200 mV p-p.
Agilent Technologies 16760A Logic Analyzer “Using the Logic Analyzer in Eye Scan Mode” on page 117 “Reference” on page 153 “Concepts” on page 239 • “Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only)” on page 78 • “Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only)” on page 83 • “Saving/Recalling Trigger Setups” on page 90 • “Running Measurements” on page 91 • “Displaying Captured Data” on page 94 • “Using Symbols” on page 101 • “Printing/Exporting Captured Da
Agilent Technologies 16760A Logic Analyzer See Also Main System Help (see the Agilent Technologies 16700A/B-Series Logic Analysis System help volume) Glossary (see page 263) 4
Contents Agilent Technologies 16760A Logic Analyzer 1 Getting Started Probing and Sampling Mode Selection Steps 15 Step 1. Connect logic analyzer to the device under test Step 2. Choose the sampling mode 16 Step 3. Format labels for the probed signals 19 Timing Mode or State Mode Steps 15 22 Step 4. Define the trigger condition 22 Step 5. Run the measurement 23 Step 6. Display the captured data 24 Eye Scan Mode Steps 26 Step 4. Select channels for the eye scan measurement Step 5.
Contents Choosing the Sampling Mode 43 Selecting the Timing Mode (Asynchronous Sampling) 43 Selecting the State Mode (Synchronous Sampling) 46 In Either Timing Mode or State Mode 53 Selecting the Eye Scan Mode 55 Formatting Labels for Logic Analyzer Probes 57 To assign pods to the analyzer 57 To set pod threshold voltages 58 To set clock threshold voltages 59 To assign probe channels to labels 60 To import label names and assignments from a netlist To import label definitions from an ASCII file 63 To
Contents Using Symbols 101 To load object file symbols 102 To adjust symbol values for relocated code To create user-defined symbols 104 To enter symbolic label values 105 To create an ASCII symbol file 106 To create a readers.
Contents Displaying Captured Eye Scan Data 133 To open the Eye Scan display 133 To select the channels displayed 134 To scale the Eye Scan display 135 To set Eye Scan display options 136 To make measurements on the eye scan data 142 To display information about the eye scan data 149 To comment on the eye scan data 151 Saving and Loading Captured Eye Scan Data 152 5 Reference The Sampling Tab 155 Timing Mode 156 State Mode 158 Sampling Positions Dialog Eye Scan Mode 172 The Format Tab 174 Pod Assi
Contents The Eye Scan Tab 204 Labels Subtab 204 Scan Settings Subtab 205 Advanced Subtab 206 Qualifier Subtab 208 Comments Subtab 209 The Calibration Tab Error Messages 210 211 Analyzer armed from another module contains no "Arm in from IMB" event 212 Branch expression is too complex 212 Cannot specify range on label with clock bits that span pod pairs 217 Counter value checked as an event, but no increment action specified 218 Goto action specifies an undefined level 218 Hardware Initialization Fail
Contents Specifications and Characteristics 227 E5378A Single-Ended Probe Specifications and Characteristics 228 E5379A Differential Probe Specifications and Characteristics 228 E5380A MICTOR-Compatible Probe Specifications and Characteristics 1500 Mb/s Sampling Mode Specifications and Characteristics 230 1250 Mb/s Sampling Mode Specifications and Characteristics 231 800 Mb/s Sampling Mode Specifications and Characteristics 232 400 Mb/s Sampling Mode Specifications and Characteristics 233 200 Mb/s Sampli
Contents Glossary Index 11
Contents 12
1 Getting Started After you have connected the logic analyzer probes to your device under test (see “Step 1.
Chapter 1: Getting Started • “Step 2. Choose the sampling mode” on page 16 • “Step 3. Format labels for the probed signals” on page 19 In the timing (asynchronous) or state (synchronous) sampling modes, measurements will have these steps: • “Step 4. Define the trigger condition” on page 22 • “Step 5. Run the measurement” on page 23 • “Step 6. Display the captured data” on page 24 In the eye scan sampling mode, measurements will have these steps: • “Step 4.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps Probing and Sampling Mode Selection Steps You will always take the following steps regardless of the sampling mode you plan to use. • “Step 1. Connect logic analyzer to the device under test” on page 15 • “Step 2. Choose the sampling mode” on page 16 • “Step 3. Format labels for the probed signals” on page 19 Step 1.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps Step 2. Choose the sampling mode There are three logic analyzer sampling modes to choose from: timing mode, state mode, and eye scan mode. In timing mode, the logic analyzer samples asynchronously, based on an internally-generated sampling clock. In state mode, the logic analyzer samples synchronously, based on a sampling clock signal from the device under test.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps If you chose Timing Mode 1. Select the timing analyzer conventional/transitional configuration. In the transitional timing configuration, the logic analyzer can capture a greater period of execution because only transitions are stored in memory. 2. If you chose the transitional timing configuration, set the sample period.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps 3. Specify the sampling position. Select the Sampling Positions... button, then select the Run Eye Finder button to locate the data valid window in relation to the sampling clock, and automatically set the sampling position of the logic analyzer. See Also “To automatically adjust sampling positions” on page 49 In either Timing Mode or State Mode 1. Specify the trigger position.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps Step 3. Format labels for the probed signals When a logic analyzer probes hundreds of signals in a device under test, you need to be able to give those channels more meaningful names than "pod 1, channel 1". The Format tab is mainly used for assigning bus and signal names (from the device under test) to logic analyzer channels. These names are called labels. Labels are also used when setting up triggers and displaying captured data.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps To assign pods to the logic analyzer 1. In the Format tab, select the Pod Assignment button. 2. In the Pod Assignment dialog, drag a pod to the appropriate logic analyzer. 3. Select the Close button. To specify threshold voltages The threshold voltage is the voltage level that a signal must cross before the logic analyzer recognizes a change in logic levels. 1. In the Format tab, select the button under the pod name. 2.
Chapter 1: Getting Started Probing and Sampling Mode Selection Steps Defined threshold voltage. 7. Select the Close button. 8. Select the Close button. To assign names to logic analyzer channels 1. Select a label button, and either: • Choose the Rename command, enter the label name, and select the OK button. • Or, choose the Insert before or Insert after command, enter the label name, and select the OK button. 2.
Chapter 1: Getting Started Timing Mode or State Mode Steps Timing Mode or State Mode Steps When you have selected the timing or state sampling modes, you need to perform the following steps. • “Step 4. Define the trigger condition” on page 22 • “Step 5. Run the measurement” on page 23 • “Step 6. Display the captured data” on page 24 Step 4. Define the trigger condition The trigger is the event in the device under test that you want to capture data around. 1.
Chapter 1: Getting Started Timing Mode or State Mode Steps 2. In the Trigger Sequence portion of the Trigger tab, select the buttons to define the label values and/or other conditions you want to trigger on. Next: “Step 5. Run the measurement” on page 23 Step 5. Run the measurement Once the trigger condition has been defined, you can run the measurement. 1. Select the Run Single button .
Chapter 1: Getting Started Timing Mode or State Mode Steps Logic analyzers with deep acquisition memory take a noticeable amount of time to complete a run; however, messages like "Waiting in level 1" may indicate you need to stop the measurement and refine the trigger condition. When the trigger condition is found, logic analyzer acquisition memory is filled, the captured data is processed to the display tools, and the Run Single button becomes available again. Next: “Step 6.
Chapter 1: Getting Started Timing Mode or State Mode Steps To add display tools via the Workspace window 1. Select the Workspace button (or from the Window menu, select System and Workspace). 2. In the Workspace window, scroll down to the Display portion of the tool icon list. 3. Drag the display tool icon and drop it on the analyzer icon. 4. To open the display tool, select its icon and choose the Display command. Next: “For More Information...
Chapter 1: Getting Started Eye Scan Mode Steps Eye Scan Mode Steps When you have selected the eye scan sampling mode, you need to perform the following steps. • “Step 4. Select channels for the eye scan measurement” on page 26 • “Step 5. Set the eye scan range and resolution” on page 27 • “Step 6. Run the eye scan measurement” on page 28 • “Step 7. Display the captured eye scan data” on page 29 Step 4. Select channels for the eye scan measurement 1.
Chapter 1: Getting Started Eye Scan Mode Steps Next: “Step 5. Set the eye scan range and resolution” on page 27 Step 5. Set the eye scan range and resolution 1. In the Eye Scan tab, Scan Settings subtab, select the settings for the eye scan measurement.
Chapter 1: Getting Started Eye Scan Mode Steps These settings define the number and size of the time and voltage windows used in the eye scan. Measurements using the coarse settings run faster because there are fewer time and voltage windows to scan, but the resulting eye diagrams have less resolution. Measurements using the fine settings result in eye diagrams with better resolution, but the measurements take longer to run because there are more time and voltage windows to scan. Next: “Step 6.
Chapter 1: Getting Started Eye Scan Mode Steps Once the eye scan settings have been selected, you can run the measurement. 1. Select the Run Single button . The Eye Scan display window opens, and the captured measurement data begins to appear. While the eye scan measurement runs, the Stop button becomes available. The estimated time of the measurement is shown in the status field. Next: “Step 7. Display the captured eye scan data” on page 29 Step 7.
Chapter 1: Getting Started Eye Scan Mode Steps In the Eye Scan display window, use the following subtabs: • Scale to zoom in or out on the captured data. • Display to change the display options. • Measurements to use tools for displaying useful information about the data. • Info to display textual information about the captured measurement data. • Comments to save your comments with the data. Next: “For More Information...
Chapter 1: Getting Started For More Information... For More Information... On connecting the logic analyzer: • “Probing the Device Under Test” on page 35 • Setup Assistant (see the Setup Assistant help volume) (when using analysis probes). • Logic Analysis System and Measurement Modules Installation Guide for probe pinout and circuit diagrams.
Chapter 1: Getting Started For More Information...
2 Probing and Selecting the Sampling Mode • “Probing the Device Under Test” on page 35 33
Chapter 2: Probing and Selecting the Sampling Mode • • 34 “Choosing the Sampling Mode” on page 43 • “Selecting the Timing Mode (Asynchronous Sampling)” on page 43 • “Selecting the State Mode (Synchronous Sampling)” on page 46 • “In Either Timing Mode or State Mode” on page 53 • “Selecting the Eye Scan Mode” on page 55 “Formatting Labels for Logic Analyzer Probes” on page 57
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test Probing the Device Under Test When using the 16760A logic analyzer, there are four probing options available: • “Using the E5378A Single-Ended Probe” on page 35 • “Using the E5379A Differential Probe” on page 37 • “Using the E5380A Mictor-Compatible Probe” on page 39 • “Using the E5382A Single-ended Flying Lead Probe Set” on page 40 • “Using an Analysis Probe” on page 41 Using the E5378A Single-Ended Probe The E5378A
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test You can order mating connectors separately using the Agilent part number: • 1253-3620 (or Samtec #ASP-65067-01) You can order support shrouds separately using the Agilent part numbers: Electrical Considerations • 16760-02302 for PC board thicknesses up to 0.062 in. • 16760-02303 for PC board thicknesses up to 0.120 in.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test If the clock input is a single-ended signal, either ground the negative clock input and adjust the clock threshold voltage in the user interface, or connect the negative clock input to the DC clock threshold reference voltage. In the user interface, the clock input threshold voltage adjustment is separate from the data input threshold voltage adjustments.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test You can order mating connectors separately using the Agilent part number: • 1253-3620 (or Samtec #ASP-65067-01) You can order support shrouds separately using the Agilent part numbers: Electrical Considerations • 16760-02302 for PC board thicknesses up to 0.062 in. • 16760-02303 for PC board thicknesses up to 0.120 in.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test Using the E5380A Mictor-Compatible Probe The E5380A MICTOR-compatible probe has a MICTOR connector end. If you have a device under test with connectors designed for the Agilent E5346A high-density probe adapter, you can also use the E5380A probe. However, the lower bandwidth of the E5380A probe limits the maximum state speed of the logic analyzer to 600 Mbits/second.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test The clock input on the E5380A probe is single-ended. The clock threshold voltage may be adjusted independently of the data threshold voltages.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test single-ended signal. If the clock input is a differential signal, select the "differential" option in the clock threshold user interface. If the clock input is a single-ended signal, ground the negative clock input and adjust the clock threshold voltage in the user interface. The minimum voltage swing for single-ended clock operation is 250 mV p-p.
Chapter 2: Probing and Selecting the Sampling Mode Probing the Device Under Test analysis system helps you to properly configure the logic analyzer.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode Choosing the Sampling Mode There are three logic analyzer sampling modes to choose from: timing mode, state mode, or eye scan mode. In timing mode, the logic analyzer samples asynchronously, based on an internally-generated sampling clock. In state mode, the logic analyzer samples synchronously, based on a sampling clock signal (or signals) from the device under test.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode To select the timing mode 1. Open the logic analyzer Setup window. 2. Select the Sampling tab. 3. Choose the Timing Mode option. You can also select the timing sampling mode in the “Pod Assignment Dialog” on page 175. To select the conventional/transitional configuration 1. In the Sampling tab with Timing Mode selected, select the timing analyzer configuration.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode NOTE: If all pods are used, memory depth is reduced by half in order to store the required time tags. NOTE: With the Sample Period at 2.5 ns, data is acquired at two times the trigger sequencer rate. This means that data must be present for at least two samples before the trigger sequencer can reliably detect it. The trigger sequencer could miss data present for less than two sample periods.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode Selecting the State Mode (Synchronous Sampling) In state mode, the logic analyzer samples synchronously, based on a sampling clock signal from the device under test. Typically, the signal used for sampling in state mode is a state machine or microprocessor clock signal. The clock signal can be either Periodic (synchronous all the time), or Aperiodic (bursted or varying in frequency).
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode To select the state mode 1. Open the logic analyzer Setup window. 2. Select the Sampling tab. 3. Choose the State Mode option. You can also select the state sampling mode in the “Pod Assignment Dialog” on page 175. To select the state speed configuration 1. In the Sampling tab, with State Mode selected, select one of the state analyzer configurations.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode • 800 Mb/s / 64M State In this configuration: The input clock signal can be periodic or aperiodic, and either rising, falling, or both edges can indicate valid data. The logic analyzer setup/hold window is 1 ns, and sampling positions may be adjusted automatically or manually. The limited set of 16760 State trigger functions are available.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode 3. Specify when to sample. Your choices are Rising Edge, Falling Edge, or Both Edges. Only Both Edges is available in the 1250 and 1500 Mb/s configurations.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode 6. In the Sampling Positions dialog, select the Eye Finder option. 7. In the Eye Finder Setup tab, select the Use signals from Device Under Test option. The Use demo data (no probes required) option is for demonstration purposes only. 8. Choose the labels that you wish to run eye finder on.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode In the Eye Finder Results tab, you can see how the stable and transitioning areas vary over time. 3. Select the Stop Eye Finder button. To view eye finder data as a bus composite When you want a compressed, high-level view of the eye finder data: 1. In the Eye Finder Results tab, select the label button and choose the View as Bus Composite command.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode eye finder data must be saved and loaded separately. 1. In the File Info tab, select the Save As... or Load... buttons. You can also choose the Save Eye Finder or Load Eye Finder command from the File menu. 2. In the file browser dialog, name the file to be saved or select the file to be loaded. For more information on save/load messages, see “Eye Finder Load/Save Messages” on page 167.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode See Also “Understanding State Mode Sampling Positions” on page 256 “To automatically adjust sampling positions” on page 49 In Either Timing Mode or State Mode • “To specify the trigger position” on page 53 • “To set acquisition memory depth” on page 53 • “To name an analyzer” on page 54 • “To turn an analyzer off or on” on page 54 To specify the trigger position 1.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode 1. In the Sampling tab (or in the Settings subtab of the Trigger tab), select the acquisition depth. The number of samples that can be chosen for the Acquisition Depth are approximations. The combination of count tags, pod assignments, and configuration modes affect what choices are available. To name an analyzer You can give more descriptive names to a logic analyzer. 1. In the Sampling tab, select the Analyzer Name field. 2.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode turn it on again by selecting the Setup button in the System window or by dragging the analyzer's instrument tool icon to the workspace in the Workspace window. Selecting the Eye Scan Mode In eye scan mode, the logic analyzer becomes a tool for validating and characterizing the data valid windows of signals latched by a clock.
Chapter 2: Probing and Selecting the Sampling Mode Choosing the Sampling Mode configuration, the input reference clock edges can occur at rates up to 800 MHz. You can choose from: • 800 Mb/s / Eye Scan In this configuration: Either rising, falling, or both edges of the input reference clock can indicate valid data. All of the logic analyzer channels are available. The maximum number of clocks that can be processed at each scan point is 60,000,000.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes Formatting Labels for Logic Analyzer Probes The Format tab is mainly for assigning bus and signal names (from the device under test), to logic analyzer channels. These names are called labels. Labels are used when setting up triggers and displaying captured data.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes Capturing Data on 17 Channels in State Mode On a single-card 16760A logic analyzer in the state (synchronous) sampling mode, you can assign pod 2 to the logic analyzer and unassign pod 1. (One pod must be unassigned in order to store time tags.) Even though pod 1 is unassigned, its J clock input is still used as the sampling clock input.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes appropriate threshold voltage reference level. • Select the Differential option. This option appears when the E5379A differential probe is used. It should be selected when differential signals are probed. The difference voltage (Vin+ - Vin-) must be greater than or equal to 200 mV p-p. • Select the User Defined option and enter the desired threshold voltage value. The threshold level is selectable from -6.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes 2. In the Clock Thresholds dialog, select the button of the clock whose threshold voltage you wish to set. 3. In the J, K, etc., threshold dialog, either: • Select the Standard option; then, select one of the predefined threshold voltages from the drop-down list. • Select the Differential option. This option appears when the E5378A single-ended probe or the E5379A differential probe is used.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes • Or, choose the Insert before or Insert after command, enter the label name, and select the OK button. 2. In the label row, select the button of the pod that contains the channels you want to assign. 3. Either choose one of the standard label assignments or choose Individual. ( * ) (asterisk) indicates an assigned bit. ( . ) (period) indicates an unassigned bit.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes “To change the label polarity” on page 64 To import label names and assignments from a netlist You can create label names and assign logic analyzer probe channels by importing netlists.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes “To assign probe channels to labels” on page 60 “To import label definitions from an ASCII file” on page 63 To import label definitions from an ASCII file You can create label names and assign logic analyzer probe channels by importing label definitions from an ASCII file. 1. In the Format tab, select File from the menu; then, select the Import Labels... menu item. 2.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes To assign label name "Orange" to channels 15 through 5 on pod A3, channel 5 on pod A2, and channel 6 on pod A1: Orange;A3[15:5];A2[5];A1[6] To assign label name "Red" to the K clock of the logic analyzer in slot A: Red;CK[AK] See Also “To assign probe channels to labels” on page 60 “To import label names and assignments from a netlist” on page 62 “To export label definitions to an ASCII file” on page 64 “To tu
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes Positive polarity means that a high voltage is a logic "1". Negative polarity means that a high voltage is a logic "0". Changing the label polarity will have the following effects: • "1" and "0" values flip in the trigger condition. • Waveforms and bus values (where shown) invert in the Waveform display tool. • "1" and "0" values flip in the Listing display tool.
Chapter 2: Probing and Selecting the Sampling Mode Formatting Labels for Logic Analyzer Probes NOTE: Labels with reordered bits cannot be used as range terms or <, <=,>, >= in triggers. To turn labels off or on When you temporarily want to remove a label and its data, you can turn off the label. The label name and its bit assignments are preserved.
3 Using the Logic Analyzer in Timing or State Mode • “Setting Up Triggers and Running Measurements” on page 69 67
Chapter 3: Using the Logic Analyzer in Timing or State Mode • “Using Trigger Functions” on page 70 • “Using Other Trigger Features” on page 75 • “Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only)” on page 78 • “Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only)” on page 83 • “Saving/Recalling Trigger Setups” on page 90 • “Running Measurements” on page 91 • “Displaying Captured Data” on page 94 • “Using Symbols” on page 101 • “Printing/Exporting Captured Data
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements Setting Up Triggers and Running Measurements This section describes setting up triggers for the timing and state sampling modes and for all configurations within these modes. Some triggering functionality is only available in certain modes and configurations. In General...
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements State and transitional timing analysis trigger definitions are made simpler with a default storage qualifier. This makes it possible to ignore, at all trigger sequence levels, the question about what to do with the captured data samples. Of course, sometimes it's useful to specify storage qualifiers at certain levels in the trigger sequence.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements trigger function. A picture describing the trigger function is shown. 2. Select the Replace button (or Insert before or Insert after button) to move it to the Trigger Sequence below. 3. In the Trigger Sequence, select and/or enter the appropriate labels, values, and options. To specify a label pattern event (Timing only) Label pattern events let you specify patterns or ranges on a bus. 1.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements “To enter symbolic label values” on page 105 “Symbols Selector Dialog” on page 195 To specify a label edge event Label edge events let you specify edges and glitches on a bus. Label edge events are only available in certain timing mode trigger functions. 1. Select the label name button and choose the label that you want to look for a pattern on.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements taken place). If you only want to look the advanced trigger function, without editing it, you can expand the trigger function. 3. Select OK in the confirmation dialog. To expand a trigger function 1. In the Trigger tab, select the number button of the trigger sequence level whose trigger function you want to expand. 2. Choose Expand function.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements description, and select the levels from the current trigger sequence that be the trigger function; then, select OK. Once you have created a trigger function library with trigger functions, you can: NOTE: • Load or unload the trigger function library. • Insert and break down trigger functions from the loaded library just like normal trigger functions.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements page 72 “Saving/Recalling Trigger Setups” on page 90 Using Other Trigger Features Other subtabs in the Trigger tab let you do things like: specifying whether a state or time count is stored with samples, or setting up the default storing options.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements pod to be left unassigned. See Also “To select the state speed configuration” on page 47 “To assign pods to the analyzer” on page 57 To specify default storing You can set up default storing so that only the data samples you're interested in are saved in logic analyzer acquisition memory.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements the context of the measurement): a. Select the Select Labels button. b. In the Transitional Label Select dialog, highlight the desired label from the Available Labels list; then, select the right-arrow button to move that label to the Ignore Edges On list. c. Repeat as needed for additional labels. d. Select OK to save the selection and close the dialog.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements “To select the conventional/transitional configuration” on page 44 To specify whether default storing is initially on or off In the state sampling mode, or in the timing sampling mode's 400 MHz / 32M Sample Transitional or Store Qualified configuration when Transitions are not stored by default, you can specify whether the default storing is initially on or off. 1.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements • See Also “To clear the trigger sequence” on page 83 “Sequence Levels” on page 242 in “Understanding Logic Analyzer Triggering” on page 240 To insert/replace/delete sequence levels To insert sequence levels 1. In the Trigger tab's Trigger Sequence area, select the level that you want to insert before or after. A yellow box appears around the level. 2.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements See Also “To cut/copy-and-paste sequence levels” on page 80 To cut/copy-and-paste sequence levels You can change the order of levels in the trigger sequence by cuttingand-pasting or you can copy levels by copying-and-pasting. 1. In the Trigger tab's Trigger Sequence area, select the level that you want to cut or copy. A yellow box appears around the level. 2.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements evaluation of the sample. You can set up multi-way branches using advanced trigger functions or by selecting an If button and choosing Insert BRANCH. NOTE: When you want to test a single sample for multiple conditions and take different actions based on which is true, use branches within a trigger sequence level. When you want to test different samples, use different sequence levels.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements Note that the e-mail is sent when the trigger occurs and not after the logic analyzer's acquisition memory is full. You only need to specify one send e-mail action per trigger sequence. As long as one trigger action sends e-mail, any trigger in the sequence will result in e-mail being sent. (You cannot specify different send email setups in a trigger sequence.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements • HTTP, FTP, SMTP and other protocols, each with defined sets of rules to use with other Internet points relative to a defined set of capabilities. To view a picture of the trigger sequence 1. In the Trigger tab, select the Overview subtab. A picture of the trigger sequence is shown.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements (label events), and the action is to trigger the logic analyzer. However, events can also test timer, counter, and/or flag values that are set up in the logic analyzer, and actions can include setting up timers, counters, and flags as well as specifying special store actions.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements 2. Enter an occurrence count value. 3. If the occurrence count is greater than 1, select whether the event should occur consecutively or eventually. The event must occur the specified number of times before the action is taken.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements To insert a timer event Timer events are like other events in that they evaluate to either true or false. 1. In the Trigger tab's Trigger Sequence area, select one of the existing event buttons (for example, a label name, Anything, Timer, Counter, or Flag) and choose to insert or replace a Timer. 2. Select the timer number button and choose the number of the timer you want to test. 3.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements 4. Enter the counter value. To insert flag actions/events Flags can be used to signal between modules in the logic analysis system mainframe, an expansion frame, or in multiple frames connected with the multiframe module. There are 4 flags that are shared across all connected logic analysis system frames. A flag may be driven or received by multiple modules.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements insert a Pulse set action for a flag in one analyzer, you cannot insert a Pulse clear action for the same flag in a different analyzer. NOTE: Within an analyzer, the same flag cannot be used in both Pulse and Level (Set/ Clear) modes. If a flag action is inserted or modified with a different mode than other actions for the same flag, all actions for that flag will change to match the new mode. 2.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements When driving the Port Out signal with a flag, you can select the Feedthrough type to pass the current state of the flag (set or clear) directly to Port Out. 3. For the Armed by option, select the flag that will drive the Port Out signal. 4. Close the Port Out dialog. 5. Insert a flag action in one of the logic analyzer modules to drive the flag.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements To give an event list a name 1. In the Trigger tab's Trigger Sequence area, select the If, If not, Else if, or Else if not button, and choose Name event list. 2. In the Name Event List dialog, enter the name and select the OK button. To insert a named event 1. In the Trigger tab's Trigger Sequence area, select a label name button and choose to insert or replace a Named event. 2.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements 3. Select a memory location to store the trigger setup in. 4. In the Buffer Name dialog, enter a descriptive name for the trigger setup. To recall a trigger setup 1. In the Trigger tab's Save/Recall subtab, select the Recall button. 2. Choose the trigger setup from one of the previous measurements or one of the save/recall memories.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements Group Run Repetitive, or Run All button. Run starts only the instrument you are using. Single runs gather data until the logic analyzer memory is full, and then stop. Repetitive runs keep repeating the same measurement and are useful for gathering statistics. Group Run (or repetitive group run) starts all instruments attached to group run in the Intermodule window.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Setting Up Triggers and Running Measurements “Error Messages” on page 211 To view the trigger status While a logic analyzer measurement is running, you can view the trigger status to see the sequence level that is evaluating captured data, occurrence and global counter values, and flag values. 1. In the Trigger tab, select the Status subtab. See Also Run status (in the system help volume).
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data Displaying Captured Data Once you have run a measurement and filled the logic analyzer's acquisition memory with captured data, you can display the captured data with one of the display tools. You can use analysis tools to filter data and compare data sets. You can also analyze captured data with toolsets like the Serial Analysis Toolset and the System Performance Analysis Toolset.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data Waveform and Listing (and other) display tools provide global markers that can be used to correlate data that is captured by different instrument modules or displayed differently in other display tool windows. The Waveform and Listing display tools also give you the ability to search for particular data values captured on labels.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data 3. Drag the display tool icon and drop it on the analyzer icon. 4. To open the display tool, select its icon and choose the Display command. You can use the Chart display tool to chart the data on a label over time. For example, if you use storage qualification (in the state sampling mode) or the Pattern Filter analysis tool, you can chart variable values.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data You can use the Serial Analysis toolset to convert streams of serial data into parallel words which are easier to view and analyze. You can use the System Performance Analysis toolset to do things like: isolate the root cause of performance bottlenecks, measure function execution times, view the occurrence rate of an event, analyze bus occupation and bandwidth, analyze bus stability, analyze jitter or time dispersion, etc.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data the actual write to this variable. Although the instruction is prefetched, the analyzer can be set to only trigger when the write is executed. Capacitive Loading on Excessive capacitive loading can degrade signals, resulting in the Device Under Test suspicious data or even system lockup. All analysis probes add capacitive loading, as can custom probes you design for your device under test.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data 3. In the filter terms, assure the default pattern of all "Don't Cares" (Xs). This configuration will always transfer all data from acquisition memory. While this configuration will increase the time of each run, it will guarantee that repetitive run data is available regardless of when it is stopped.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Displaying Captured Data To cancel the display processing of captured data You can cancel the processing of captured data if it is taking too long. 1. Select the Cancel 100 button.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols Using Symbols You can use symbol names in place of data values when: • Setting up triggers • Displaying captured data • Searching for patterns in Listing displays • Setting up pattern filters • Setting up ranges in the System Performance Analyzer Symbol names can be: variable names, procedure names, function names, source file line numbers, etc.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols To load object file symbols Object files are created by your compiler/linker or other software development tools. 1. Generate an object file with symbolic information using your software development tools. 2. If your language tools cannot generate object file formats that are supported by the logic analyzer, create an ASCII symbol file (see page 106). 3. Select the Symbol tab and then the Object File tab. 4.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols the object file symbols are reloaded. To delete object file symbol files 1. Select the Symbol tab, and then the Object File tab. 2. Select the file name you want to delete in the text box labeled, Object Files with Symbols Loaded For Label. 3. Select Unload. See Also “Symbol File Formats” on page 197 To adjust symbol values for relocated code Use this option to add offset values to the symbols in an object file.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols whose symbols you wish to relocate. 3. Select the Relocate Sections... button. 4. Enter the desired offset in the Offset all sections by field. The offset is applied from the linked address or segment. 5. Select Apply Offset. 6. Select Close. To create user-defined symbols 1. Under the Symbol tab, select the User Defined tab. 2. Select the label name you want to define symbols for. 3.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols To delete user-defined symbols 1. Under the Symbol tab, select the User Defined tab. 2. Select the label you want to delete symbols from. 3. Select the symbol to delete. 4. Select the Delete button. 5. Repeat steps 3 and 4 to delete other symbols, if desired. To load user-defined symbols If you have already saved a configuration file, and the configuration included user-defined symbols, load the file with its symbols, as follows: 1.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols Pattern. • Use the Find Symbols of Type selections to filter the symbols by type. 4. Select the symbol you want to use from the list of Matching Symbols. 5. If you are using object file symbols, you may need to: • Set Offset By (see page 196) to compensate for microprocessor prefetches. • Set Align to x Byte (see page 197) to trigger on odd-byte boundaries. 6. Select the Beginning, End, or Range of the symbol. 7.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols To create a readers.ini file You can change how an ELF/Stabs, Ticoff or Coff/Stabs symbol file is processed by creating a reader.ini file. 1. Create the reader.ini file on your workstation or PC. 2. Copy the file to /logic/symbols/readers.ini on the logic analysis system.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols section will be read completely. This can occur if the file was created without a "generate debugger information" flag (usually -g). Using the g will create a Dwarf or Stabs debug section in addition to the ELF section.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Using Symbols C MaxSymbolWidth=60 StabsType=2 Example for Coff/Stabs (using Ticoff reader) [ReadersTicoff] C C MaxSymbolWidth=60 StabsType=2 Example for Ticoff [ReadersTicoff] C C MaxSymbolWidth=60 ReadOnlyTicoffPage=4 AppendTicoffPage=1 109
Chapter 3: Using the Logic Analyzer in Timing or State Mode Printing/Exporting Captured Data Printing/Exporting Captured Data To print captured data You can print captured data from display tool windows. 1. In the display tool window, select Print this window from the File menu. To export captured data You can use the File Out tool to save measurement data to an ASCII format file which can then be imported into a spreadsheet application, a debugger, or some other post-processing tool. 1.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Printing/Exporting Captured Data 5. Select the file name and automatic file sequencing options. 6. Select the Read File button. 7. Drag display, analysis, or toolset icons and drop them on the File In tool icon to view the imported data.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Cross-Triggering Cross-Triggering An instrument must be armed before it can look for a trigger. By default, instruments are set to be armed immediately when you Run the measurement. However, you can set an analyzer instrument to be armed by another instrument (in a different slot or frame). • “To cross-trigger with another instrument” on page 112 To cross-trigger with another instrument 1.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Cross-Triggering 2. Choose the Arm in from IMB menu item. When the logic analyzer drives the arm signal 1. Set up the logic analyzer trigger as you would normally. In the Trigger tab's Trigger Sequence area, the trigger actions will show arm out to indicate that the logic analyzer's trigger will drive the arm signal when it's trigger condition is satisfied. 2. Run the measurement.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Solving Logic Analysis Problems Solving Logic Analysis Problems See Also • “To test the logic analyzer hardware” on page 114 • “If nothing happens when you start a measurement” on page 92 • “If the captured data doesn't look correct” on page 97 • “If there are filtered data holes in display memory” on page 98 To test the logic analyzer hardware In order to verify that the logic analyzer hardware is operational, run the Self Test utility.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Solving Logic Analysis Problems If any test fails, contact your local Agilent Technologies Sales Office or Service Center for assistance.
Chapter 3: Using the Logic Analyzer in Timing or State Mode Saving and Loading Logic Analyzer Configurations Saving and Loading Logic Analyzer Configurations The Agilent Technologies 16760A logic analyzer settings and data can be saved to a configuration file. The configuration file will include references to any custom trigger libraries you have created, but if the configuration is loaded into an analyzer on a system that does not have the trigger libraries, they will not work correctly.
4 Using the Logic Analyzer in Eye Scan Mode • “Setting Up and Running Eye Scan Measurements” on page 119 117
Chapter 4: Using the Logic Analyzer in Eye Scan Mode • “Displaying Captured Eye Scan Data” on page 133 • “Saving and Loading Captured Eye Scan Data” on page 152 118
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements Setting Up and Running Eye Scan Measurements The Eye Scan tab lets you set up and run Eye Scan measurements. Eye Scan measurements sample small windows of time and voltage on logic analyzer data channels. The time windows are relative to a clock signal from the device under test. Captured measurement data is displayed as eye diagrams in the Eye Scan display.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements when certain bus signals transition in one of the device under test's operating modes and other bus signals transition in a different operating mode. 1. In the Eye Scan tab, select the Labels subtab. 2. Select the bus/signal labels for the next eye scan measurement.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements To quickly set up another measurement using the scale (see page 136) To run an eye scan measurement 1. After selecting the scan ranges and resolution (see “To set the eye scan range and resolution” on page 120), select the Use Signals from Device Under Test option. The Use Demo Data (No probes required) option is primarily for demonstration purposes only.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 1. In the Eye Scan tab, select the Advanced subtab. Select Quick Scan for a relatively fast Eye Scan. Select Complete Scan if you are concerned about capturing noise and signal anomolies that lie outside the area of the most regular signal activity. Complete Scan will take significantly longer than Quick Scan. 2. Select the number of clocks to be processed at each scan point option.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements memory device versus a memory controller. Requirements Qualified eye scans are performed with double edge clocks. Qualified eye scans are available only in the 800 Mb/s mode of the 16760 logic analyzer.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements A suitable qualification signal is rarely available. Instead, an extra circuit (added to the SUT, in a probe adapter, or other convenient location) is usually required to decode read/write commands and generate the qualifier. The analyzer samples the qualification signal at the beginning of each clock cycle (i.e. at the first of each pair of data transfers).
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements The qualifier is changed on the second clock cycle of the burst. It remains stable until after the next clock cycle following the end of the burst. If the clock pauses between bursts (as shown above), then the qualifier level for the previous burst remains in place until the second clock cycle of the next burst.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 3. If you have only one 16760 logic analyzer card, on the Trigger tab, select the Settings subtab, and set Count to Off. This makes the second pod available for use by the qualifier. If you have a multi-card module (more than one 16760 card), an unassigned pod can be used to store time tags.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 4. Assign pod A2 to the analyzer: • In the analyzer's Format tab select the Pod Assignment button. • Drag the A2 pod from the Unassigned Pods section to the Analyzer section. • Select Close. 5. Define a label for the K clock on the master card (the qualifier input). This will make it easier to see which signal is used as the qualification signal.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 6. Select Sampling Positions... to open the Sampling Positions dialog. Select the label you created and choose Expand to display all the signals (if it is not already expanded). 7. Start your target system and select Run Eye Finder. 8. When Eye Finder completes its run, move the qualifier sampling position to the right of the qualifier transition region at or to the right of the clock position (t = 0).
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements Now, set up eye scan mode 1. Select the Eye Scan button on the Sampling tab. Ensure that eye scan is set to 800 Mb/s / Eye Scan and the Master clock is set to Both Edges.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 2. Select the Eye Scan tab. 3. Select the Qualifier subtab.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements 4. Select the Qualify eye scan sampling using... button. 5. Use the Qualification Level buttons to select whether eye scan data is collected when the qualifier signal is high or low. Note that the names "high" and "low" can be changed using the Names for Qualifier Levels section in this window. 6.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Setting Up and Running Eye Scan Measurements Make eye scan measurements The logic analyzer is now ready to make qualified eye scan measurements. Select the run icon to run the eye scan. All other eye scan settings are available and are the same as they are in non-qualified measurements. To make non-qualified eye scan measurements, turn off the qualifier by clicking the box in the upper left of the "Qualifier" tab.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data Displaying Captured Eye Scan Data Once you have run an eye scan measurement, captured measurement data is displayed as eye diagrams in the Eye Scan display. The Eye Scan display has the following measurement tools: slope, limits, 4 point, 6 point, diamond, histogram, and cursors. You can also display measurement information in text format. The Eye Scan display can be scaled, and there are several display options.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data NOTE: There is no Eye Scan display tool icon in the Workspace window because the Eye Scan display doesn't work with the standard form of captured logic analyzer data (like, for example, the Waveform and Listing display tools do). Instead, the Eye Scan display window is a sub-window of the instrument icon (much like the Source Viewer window is a sub-window of the Listing display tool).
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data To scale the Eye Scan display The Eye Scan display's scaling options on the Scale tab let you change the display scale of the captured eye scan data. Also, you can click-anddrag to zoom in on a portion of the Eye Scan display. To use the scaling options 1. In the Eye Scan display window, select the Scale tab.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data To zoom-in on the displayed data using the click-and-drag method To zoom in on a selected portion of the Eye Scan display, select the upper left corner of the area you want to enlarge, drag down and to the right, then release the selection tool (mouse button or touch screen).
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data In the Display tab, you can: • Change the Display Mode. The Gray Scale option shows the measurement data in gray-scale where the brightness of a region indicates the number of transitions detected in that region. The Color Graded option shows the measurement data in color where the color of a region indicates the number of transitions detected in that region.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data The Solid Color option shows measurement data as a solid color in all regions where transitions were detected. The Ch Density Gray option shows the measurement data in shades of gray where the brightness of a region indicates the number of logic analyzer channels which have transistioned in that region.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data The Ch Density Color option shows the measurement data in color where the color of a region indicates the number of logic analyzer channels which have transitioned in that region. 2. Change the Display Mode settings. See “To change the Eye Scan color scale” on page 140. 3. Change the display's Aspect Ratio. The options let you choose from several fixed aspect ratios or a display that is resized with the window.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data See Also “To open the Eye Scan display” on page 133 “To scale the Eye Scan display” on page 135 “To change the Eye Scan color scale” on page 140 “To select the channels displayed” on page 134 To change the Eye Scan color scale Color can be used to differentiate aspects of the eye scan display for increased readability. 1. In the Eye Display window, select the Display tab. 2. Select the Settings... button.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data 3. Select the Linear button to equally divide the color scale so that each color represents an equal increment of transitions. Select the Log, Log2, or Log10 scale buttons to separate the display of transitions detected using a logarithmic scale. 4. Use the Parts per Million (ppm) slider bars above and below the color bars to bring out detail in the eye diagram. The bottom slider bar controls the black level.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data box associated with the white color bar to bring out detail in the eye diagram. The Default Limits button can be used to return the black and white limit values to settings that should produce a typical eye diagram. The Default button at the bottom of the window can be used to reset both the limits and the Scale mode at once.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • Turn on the 4 Pt Box tool. This tool is a box that displays time (box width), voltage (box height), and number of transitions detected. Each point of the box can be repositioned.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • 144 Turn on the 6 Pt Box tool. This tool is also for measuring time, voltage, and the number of transitions detected within the area. The 6 Pt Box has 6 points that can be repositioned to match the shape of an eye. Because of the box's symmetry, it's easiest to position the box's upper and lower points before the middle points.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • Turn on the Diamond tool. This tool is also for measuring time, voltage, and number of hits. Number of hits refers to the number of transitions detected within the area. The Diamond tool has 4 points that can be repositioned to match the shape of an eye.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • 146 Turn on the Slope Tool tool. This tool is for measuring the slope of rising and falling edges in an eye. It also shows the change in time and voltage between two points. The slope tool is a line with two endpoints that can be repositioned.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • Turn on the Histogram tool. This tool displays a histogram of the relative number of transitions at a particular voltage between two times. The histogram tool is a horizontal line in the display with two endpoints that can be repositioned. There is a slider bar on the line that can be positioned for exact measurements at a particular time. The histogram can be displayed using a linear or logarithmic scale.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data • 148 Turn on the Cursor1 or Cursor2 tools. Cursors are single points that display the time and voltage where they are positioned. (To display the change in time and voltage between two points, use the Slope tool instead of two cursors.) Cursors also show the number of channels that contribute to the data at a particular point.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data Any combination of the measurement tools can be used at the same time. Information for all selected tools is displayed. You can use the scroll bars to navigate through the information. See Also “To open the Eye Scan display” on page 133 “To select the channels displayed” on page 134 To display information about the eye scan data 1. In the Eye Scan display window, select the Info tab.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data In the Info tab, you can: • View information about which logic analyzer the Eye Scan data is from, how many channels are displayed, and when the data was acquired. • Select the Show Info for All Channels button to display detailed information about the Eye Scan measurement.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Displaying Captured Eye Scan Data point (see “To set advanced eye scan options” on page 121), the number of scan points that were measured, and the amount of system memory required for the data. When you save a configuration that includes data, Mem size also shows the amount of disk space required for the eye scan data.
Chapter 4: Using the Logic Analyzer in Eye Scan Mode Saving and Loading Captured Eye Scan Data Saving and Loading Captured Eye Scan Data When the logic analyzer configuration is saved with data, captured eye scan data is included. Eye scan data can be restored by loading a logic analyzer configuration file. For more information, see “Saving and Loading Logic Analyzer Configurations” on page 116.
5 Reference • “The Sampling Tab” on page 155 • “The Format Tab” on page 174 • “The Trigger Tab” on page 176 153
Chapter 5: Reference • “The Symbols Tab” on page 193 • “Error Messages” on page 211 • “Specifications and Characteristics” on page 227 154
Chapter 5: Reference The Sampling Tab The Sampling Tab The Sampling tab lets you choose between the logic analyzer's: • Asynchronous sampling Timing Mode • Synchronous sampling State Mode • Time and voltage scanning (relative to a clock from the device under test) Eye Scan Mode. This tab also lets you set controls for the selected mode and adjust the logic analyzer sampling positions.
Chapter 5: Reference The Sampling Tab Timing Mode When you select Timing Mode, the Timing Mode Controls area appears. Conventional/ Transitional Configuration Lets you configure the timing analyzer to use memory for all samples (conventional) or just samples that are different than previously stored sample (transitional). Trigger Position Lets you specify where the sample that triggered the analyzer should appear among all the other samples that are stored in acquisition memory.
Chapter 5: Reference The Sampling Tab “In Either Timing Mode or State Mode” on page 53 How Samples are Stored in Transitional Timing In the timing mode's 400 MHz / 32M Sample Transitional or Store Qualified configuration, with the exception of the first sample, the logic analyzer must store two samples (four when sampling at 2.5 ns) so that no data is lost during the time it takes for the edge detectors to reset.
Chapter 5: Reference The Sampling Tab State Mode When you select State Mode, the State Mode Controls area appears. State Speed Configuration Lets you configure the state analyzer for faster sampling, but with half of the channels. Trigger Position Lets you specify where the sample that triggered the analyzer should appear among all the other samples that are stored in acquisition memory.
Chapter 5: Reference The Sampling Tab as the sampling clock. Generally, the state mode sampling clock is taken from the signals that clock valid data in the device under test.
Chapter 5: Reference The Sampling Tab Sampling Positions Tab The Sampling Positions display is a digital "eye" diagram in that it represents many samples of data captured in relation to the sampling clock. The transitioning edges measured before and after the sampling clock result in a picture that is eye-shaped. You should have already specified the logic analyzer threshold voltage, but you may adjust it to maximize the width of the measured stable regions.
Chapter 5: Reference The Sampling Tab view, set the sampling positions to the suggested sampling positions, and remove all eye finder data. Label buttons Let you expand/collapse the signals in a label, set the bus view, choose the suggested sampling position, and show message or time stamp information. Display Area Shows: • Transitioning (dark) and stable (light) regions on the signals. • Suggested sampling positions (green triangles). • The current sampling positions (blue lines).
Chapter 5: Reference The Sampling Tab How the Selected Position Behaves 1. When eye finder is enabled, the selected position (blue line) is set based on the manual setup/hold value. 2. Whenever the selected position is moved, the manual setup/hold value is also updated. They always track each other. 3. When the manual setup/hold is enabled again, the position changes made while eye finder was enabled can be kept or discarded.
Chapter 5: Reference The Sampling Tab An eye finder measurement is currently running. Stop the eye finder or wait for it to complete before running the eye finder. The eye finder is already running on the other machine defined for this analyzer. Eye finder cannot run on both machines at the same time. "Cannot run the Logic Analyzer at this time." An eye finder measurement is currently running. Stop the eye finder measurement or wait for it to complete before running the logic analyzer measurement.
Chapter 5: Reference The Sampling Tab "From Eye Finder: After hardware calibration, the sampling positions for the following channels may have shifted out of the selected stable region by the amount shown: CHANNEL: AMOUNT ps ... (NNN more)" Each time a measurement is started, the hardware is re-calibrated. The new calibration values are checked against those used when the eye finder measurements were taken.
Chapter 5: Reference The Sampling Tab request or when the Sampling Positions dialog is closed or iconified. "Timeout: < N K clocks in 5 sec" Eye finder requires stimulus at a minimum rate to perform its measurements. Too few state clocks were seen in the time allotted. Check clock inputs, clock definition, threshold voltage settings, and the operation of the device under test. Eye Finder Info Messages. These messages appear in the Eye Finder Results tab after an eye finder measurement is run.
Chapter 5: Reference The Sampling Tab 2. The stable region(s) are too small for eye finder to detect. In this case you must resort to adjusting the sample position manually and checking its validity by running an ordinary analyzer measurement to see if the data values you expect are sampled. You can adjust the sample position manually by selecting the arrow buttons or by dragging the blue sampling position indicator in the display. "Only a few transitions detected.
Chapter 5: Reference The Sampling Tab than 5 nsec and the clock period is greater than 10 nsec (slower than 100 MHz). Eye Finder Load/Save Messages. These messages can appear when saving or loading eye finder data. "... (at line XX in the file)" Indicates where the error occurred in the file being read. Since eye finder data files are ASCII text, you can use a text editor to examine the file at the indicated line to determine how to repair the problem.
Chapter 5: Reference The Sampling Tab "Failed to open file for reading/writing: NAME" The selected file could not be opened. Check access and file permissions. "File NAME already exists. Overwrite?" The selected file exists. Answering "Yes" will cause the existing contents of the file to be replaced with current eye finder information. "Invalid true/false flag" The boolean value for the item could not be read. Boolean values start with either a 't' or 'f' ('T' or 'F'are also accepted).
Chapter 5: Reference The Sampling Tab Eye Finder Setup Tab File menu Lets you save/load eye finder data. EyeFinder menu Lets you run eye finder, choose the run mode, and access the “Eye Finder Advanced Settings Dialog” on page 170. Run Mode Lets you look at eye finder with demo data or in normal operating mode by sampling signals from the device under test. Repetitive Run Runs the eye finder repetitively, so you can see how stable and transitioning signals vary over time.
Chapter 5: Reference The Sampling Tab channel will select it in each of those labels. See Also “Understanding State Mode Sampling Positions” on page 256 “To automatically adjust sampling positions” on page 49 Eye Finder Advanced Settings Dialog. Short Eye finder looks at 100,000 clock cycles on each channel to determine the suggested sampling positions. This setting requires frequent transitions on all channels.
Chapter 5: Reference The Sampling Tab • Data buses that are driven by different circuitry at different times. When different channels require different settings, you can run eye finder on channel subsets to avoid using the Long setting on a large number of channels. File Info Tab When the Eye Finder option is selected, the File Info subtab lets you save and load eye finder data. File: Name of the eye finder data file. Created: Date and time the eye finder data file was created.
Chapter 5: Reference The Sampling Tab Reload Reloads eye finder data from the named file, deleting unsaved changes. Save Saves current eye finder data to the named file. Save As... Saves current eye finder data to a new file. See Also “To automatically adjust sampling positions” on page 49 Eye Scan Mode When you select Eye Scan Mode, the Eye Scan Mode Controls area appears. Eye Scan Speed Configuration Lets you configure the analyzer for faster signals, but with only half of the channels.
Chapter 5: Reference The Sampling Tab See Also “Selecting the Eye Scan Mode” on page 55 “Understanding Eye Scan Measurements” on page 259 173
Chapter 5: Reference The Format Tab The Format Tab The Format tab is used to assign bus and signal names (from the device under test), to logic analyzer channels. These names are called labels. Labels are also used when setting up triggers and displaying captured data. The Format tab also lets you assign pods to the logic analyzer and specify the logic analyzer pod and clock threshold voltages.
Chapter 5: Reference The Format Tab Pod Assignment Dialog Name: Lets you name the analyzer. Type: Lets you select the timing (asynchronous) sampling mode, the state (synchronous) sampling mode, or turn the analyzer off. Pods Can be dragged-and-dropped under the analyzer to assign those channels to the analyzer or can be left unassigned.
Chapter 5: Reference The Trigger Tab The Trigger Tab The Trigger tab is used to tell the analyzer when to capture data. The key event is the trigger. In the Agilent Technologies 16760A logic analyzer, you can insert multiple trigger actions. When you insert multiple trigger actions, the trigger marker in the display windows is placed on the first sample whose evaluation caused a branch through an associated trigger action.
Chapter 5: Reference The Trigger Tab See Also “Understanding Logic Analyzer Triggering” on page 240 “Setting Up Triggers and Running Measurements” on page 69 “Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only)” on page 78 Trigger Functions Subtab Trigger functions provide a simple way to set up the analyzer to trigger on common events and conditions. Libraries of functions are available for each of the timing and state sampling mode configurations.
Chapter 5: Reference The Trigger Tab See Also • “Using Trigger Functions” on page 70 • “Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only)” on page 83 General Timing Trigger Functions When the timing sampling mode is selected, the following General Timing trigger functions are found in the Trigger Functions tab. You can edit most of these trigger functions to specify particular pattern and edge events or boolean combinations of events.
Chapter 5: Reference The Trigger Tab maximum width specifications. • Find Nth occurrence of an edge Becomes true when the specified edge occurs in the specified number of samples. • Find pattern present/absent for > duration Becomes true when the specified pattern is present or absent for greater than the amount of time specified. • Find pattern present/absent for < duration Becomes true when the specified pattern is present or absent for less than the amount of time specified.
Chapter 5: Reference The Trigger Tab • Wait for arm in When the logic analyzer is armed by another instrument (as specified in the Intermodule window), this trigger function becomes true when the arm signal is received. • Wait for flag Becomes true when the specified flag has the specified value. This trigger function tests for a flag event.
Chapter 5: Reference The Trigger Tab You can expand these trigger functions to see how they are constructed with the underlying advanced trigger functions. You can break down these trigger functions to directly edit the underlying advanced trigger functions. Sometimes you need to break down a trigger function in order to add other event types such as counters, timers, flags, and arming from other instruments.
Chapter 5: Reference The Trigger Tab Becomes true when the second specified pattern occurs in a sample (eventually) after a sample in which the first specified pattern occurs. • Find pattern2 occurring too soon after pattern1 Becomes true when the second specified pattern occurs within a specified time after the first specified pattern.
Chapter 5: Reference The Trigger Tab When the logic analyzer is armed by another instrument (as specified in the Intermodule window), this trigger function becomes true when the arm signal is received. • Wait for flag Becomes true when the specified flag has the specified value. This trigger function tests for a flag event. • Set/clear/pulse flag Becomes true on any sample and sets, clears, pulse sets, or pulse clears the specified flag. This trigger function inserts a flag action.
Chapter 5: Reference The Trigger Tab are true, it executes the actions after "then". • Advanced - 2-way branch This trigger function has two branches, of the form "If - then; else if - then". For each sample, the events in the first "If" branch are checked. If all events are true, the "then" portion is executed. If they are not true, the events in the "else if" branch are checked. If the "else if" events are true, its "then" portion is executed.
Chapter 5: Reference The Trigger Tab • Advanced - pattern1 OR pattern2 Finds either pattern1 or pattern2 or both in a sample. If you set it to look for more than 1 occurrence, you can specify whether the occurrences are consecutive or not. You can also add other events, including labels, to be searched for. See Also “Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only)” on page 83 for more information on using the advanced trigger functions.
Chapter 5: Reference The Trigger Tab You can use the following types of events in these trigger functions: patterns, ranges, flags, and Wait for arm in (see “To cross-trigger with another instrument” on page 112). These trigger functions provide trigger actions. You cannot modify these actions or insert any other actions. Only one of these trigger functions can be used at a time; in other words, they cannot be sequenced to provide more sophisticated triggering.
Chapter 5: Reference The Trigger Tab captured data. For maximum data capture the trigger position should be set to end. A warning message concerning no trigger action will be displayed in the Run Status window. This warning message can be ignored since the intent of the trigger function is not to trigger. The run status window can be prevented from coming up with this warning by setting the Popup On Severity level to errors only.
Chapter 5: Reference The Trigger Tab Sets up to never trigger. You must select the stop button to view the captured data. For maximum data capture the trigger position should be set to end. A warning message concerning no trigger action will be displayed in the Run Status window. This warning message can be ignored since the intent of the trigger function is not to trigger. The run status window can be prevented from coming up with this warning by setting the Popup On Severity level to errors only.
Chapter 5: Reference The Trigger Tab trigger arming, and compensate for timing skew between modules.
Chapter 5: Reference The Trigger Tab Default Storing Subtab Store by default Lets you specify that all events (Anything), no events (Nothing), Custom (user defined) events, or Transitions be stored by default. At start of acquisition Event specification list Group events See Also Lets you choose whether default storing is initially On or Off. When you choose Custom (user defined) events, this area lets you define which events should be stored by default.
Chapter 5: Reference The Trigger Tab Status Subtab The Status subtab shows you the sequence level that is evaluating captured data, occurrence and global counter values, and flag values. See Also “To view the trigger status” on page 93 Save/Recall Subtab The Save/Recall subtab lets you save trigger setups within a session. The Agilent Technologies 16760A logic analyzer provides memory locations to store up to 15 trigger sequences for both state and timing sampling modes.
Chapter 5: Reference The Trigger Tab You can also save trigger sequences outside of configuration files by creating trigger function libraries.
Chapter 5: Reference The Symbols Tab The Symbols Tab The Symbols tab lets you load symbol files or define your own symbols. Symbols are names for particular data values on a label. Two kinds of symbols are available: Multiple files • Object File Symbols. These are symbols from your source code and symbols generated by your compiler. • User-Defined Symbols. These are symbols you create.
Chapter 5: Reference The Symbols Tab Object file versions During the load process, a symbol database file with a .ns extension will be created by the system. One .ns database file will be created for each symbol file you load. Once the .ns file is created, the Symbol Utility will use this file as its working symbol database. The next time you need to load symbols into the system, you can load the .ns file explicitly, by placing the .ns file name in the Load This Object/Symbol File For Label field.
Chapter 5: Reference The Symbols Tab Symbols Selector Dialog Search Pattern: Lets you enter partial symbol names and the asterisk wildcard character (*) to limit the symbols to choose from (see “Search Pattern” on page 196). Use the Recall button to select from previous search patterns. Find Symbols of Type Lets you limit the types of symbols to choose from. Matching Symbols Lists the symbols that match the search pattern. You choose a symbol from this list.
Chapter 5: Reference The Symbols Tab Offset By Lets you add an offset value to the starting point of a symbol. This can be useful when compensating for microprocessor prefetches (see “Offset By Option” on page 196). Align to Lets you mask the lower order bits of a symbol's value. This can be useful for triggering on odd byte boundaries (see “Align to x Byte Option” on page 197).
Chapter 5: Reference The Symbols Tab func1 and func2 are adjacent to each other in physical memory, with func2 following func1. In order to trigger on func2 without getting a false trigger from a prefetch beyond the end of func1, you need to add an offset value to your label value. The offset value must be equal to or greater than the prefetch depth of the processor. In this case, you would add an offset of 16 bytes to your label value. You would set the value of the "Offset By" field to 10 hex.
Chapter 5: Reference The Symbols Tab C++ notation. To improve performance for these ELF symbol files, type information is not associated with variables. Hence, some variables (typically a few local static variables) may not have the proper size associated with them. They may show a size of 1 byte and not the correct size of 4 bytes or even more. All other information function ranges, line numbers, global variables and filenames will be accurate. These behaviors may be changed by creating a readers.
Chapter 5: Reference The Symbols Tab The address or address range must be a hexadecimal number. It must appear on the same line as the symbol name, and it must be separated from the symbol name by one or more blank spaces or tabs. Address ranges must be in the following format: beginning address..ending address The following example defines two symbols that correspond to address ranges and one symbol that corresponds to a single address. main test var1 00001000..00001009 00001010..
Chapter 5: Reference The Symbols Tab [START ADDRESS] address #comment text Lines without a preceding header are assumed to be symbol definitions in one of the [VARIABLES] formats. Example This is an example GPA file that contains several different kinds of records. [SECTIONS] prog 00001000..0000101F data 40002000..40009FFF common FFFF0000..FFFF1000 [FUNCTIONS] main 00001000..00001009 test 00001010..0000101F [VARIABLES] total 40002000 value 40008000 4 4 [SOURCE LINES] File: main.
Chapter 5: Reference The Symbols Tab NOTE: If you use section definitions in a GPA symbol file, any subsequent function or variable definitions must be within the address ranges of one of the defined sections. Functions and variables that are not within the range are ignored. Format [SECTIONS] section_name start..end attribute section_name A symbol representing the name of the section. start The first address of the section, in hexadecimal. end The last address of the section, in hexadecimal.
Chapter 5: Reference The Symbols Tab VARIABLES You can specify symbols for variables using: • The address of the variable. • The address and the size of the variable. • The range of addresses occupied by the variable. If you specify only the address of a variable, the size is assumed to be 1 byte. Format [VARIABLES] var_name start [size] var_name start..end var_name A symbol representing the variable name. start The first address of the variable, in hexadecimal.
Chapter 5: Reference The Symbols Tab Example [SOURCE LINES] File: main.c 10 00001000 11 00001002 14 0000100A 22 0000101E See Also Using the Source Viewer (see the Listing Display Tool help volume) START ADDRESS Format [START ADDRESS] address address The address of the program entry point, in hexadecimal. Example [START ADDRESS] 00001000 Comments Use the # character to include comments in a file. Any text following the # character is ignored.
Chapter 5: Reference The Eye Scan Tab The Eye Scan Tab The Eye Scan tab is used to set up and run eye scan measurements.
Chapter 5: Reference The Eye Scan Tab Select None See Also De-selects all channels. “To select channels for the eye scan” on page 119 Scan Settings Subtab Scan Range Lets you choose from Coarse, Medium, or Fine time and voltage settings. The Default button returns to the defaults for the selected scan range option. Time Lets you enter the minimum and maximum times (relative to clock signal edges) and the size of the time windows for the scan.
Chapter 5: Reference The Eye Scan Tab normal operating mode by sampling signals from the device under test. See Also “To set the eye scan range and resolution” on page 120 Advanced Subtab Eye scan measurements look at selected logic analyzer channels for signals passing through small windows of time and voltage. Advanced options let you specify the number of clocks to process in each window and whether measurement data should be accumulated or replaced.
Chapter 5: Reference The Eye Scan Tab and other anomalies will be displayed if present. Short Processes fewer clocks at each scan point. This setting requires frequent transitions on all channels. Medium Processes a moderate number of clocks at each scan point. Use this for channels transition at a normal rate. Long Processes more clocks at each scan point. Use this setting if some channels have sporadic transitions. Custom Lets you enter the number of clocks to process at each scan point.
Chapter 5: Reference The Eye Scan Tab Qualifier Subtab Qualification Level Select the button that describes the state in which you want Eye Scan to collect data. Clock Edge to Sample Qualifier Level Qualified eye scans may only be performed with double edge clocks. Use Clock Edge to Sample Qualifier Level setting to specify whether the qualifier signal is checked on the rising edge or the falling edge of the system clock.
Chapter 5: Reference The Eye Scan Tab Comments Subtab You can enter your comments on the eye scan settings. When the logic analyzer configuration is saved, comments are saved along with the eye scan settings.
Chapter 5: Reference The Calibration Tab The Calibration Tab All 16760A logic analyzer cards must be calibrated to ensure conformance to specifications. Calibration Instructions Follow these instructions to calibrate 16760A logic analyzer cards. The Cancel button exits the calibration procedure. Calibration Status Displays whether calibration has passed or failed. Calibration Messages Displays any messages returned during the calibration. The Clear Messages button removes all messages.
Chapter 5: Reference Error Messages Error Messages • “Analyzer armed from another module contains no "Arm in from IMB" event” on page 212 • “Branch expression is too complex” on page 212 • “Cannot specify range on label with clock bits that span pod pairs” on page 217 • “Counter value checked as an event, but no increment action specified” on page 218 • “Goto action specifies an undefined level” on page 218 • “Hardware Initialization Failed” on page 218 • “Maximum of 32 Channels Per Label” on
Chapter 5: Reference Error Messages Analyzer armed from another module contains no "Arm in from IMB" event This warning is displayed when a 16715A and newer analyzer machine is in the group run arming tree, armed from another module (not directly from the group run), and no sequencer event list in the analyzer contains an "Arm in from IMB" event or no level in a "Wait for arm in" trigger function. In this case the analyzer will not wait for the module above it to trigger before it triggers.
Chapter 5: Reference Error Messages NOTE: For labels that do span pod pairs, the complexity can be reduced to the same as that of the non-split label case if all bits in the label on all but one pod pair can be set to Xs in the event list expression for the measurement.
Chapter 5: Reference Error Messages • Cannot AND more than 16 non-split pattern events if the pattern events are all on the same pod pair. • Can AND up to 160 non-split pattern events if the pattern events are evenly distributed across all 10 pod pairs on a 5 card set (16 pattern events per pod pair). Specific Guidelines - 400 Mb/s State Modes • Cannot AND or OR more than 8 non-split pattern events if the pattern events are all on the same pod pair.
Chapter 5: Reference Error Messages 1 If (complex event list) occurs 1 time then goto next 2 If anything occurs 1 time then Goto Next 3 If (complex event list) occurs 1 time then Trigger and fill memory • In 400 Mb/s State Modes, the trigger sequence compiler must always add some additional complexity to the compiled expression for the first sequence level that is not needed in subsequent sequence levels.
Chapter 5: Reference Error Messages Specific Guidelines - 800 Mb/s State Mode • Labels that span pods (split labels) require more combiner resources than labels with bits that all belong to a single pod. Whenever possible, define labels that do not span pods. In some cases, the compiler will be able to combine 2 non-split labels that are ANDed together even though it fails to compile a pattern on a single label that spans pods. • Cannot specify more than 4 patterns or 2 ranges per pod.
Chapter 5: Reference Error Messages combine 2 non-split labels that are ANDed together even though it fails to compile a pattern on a single label that spans pods. • Cannot specify more than 3 patterns or 1 range per pod. Non-split patterns may use operations: =, !=, <, <=,>, >=, In range, Not in range. Split patterns may only use operations: =, !=. Patterns on labels with re-ordered bits may only use operations: =, != (same as Timing and 200 and 400 Mb/s modes).
Chapter 5: Reference Error Messages Counter value checked as an event, but no increment action specified This warning occurs because you have used a counter in your trigger sequence, but do not have Counter Increment as an action. You do not need to increment the counter in the same sequence level. The counter event will still function, but will not change value. The default value for both counters is 0.
Chapter 5: Reference Error Messages Maximum of 32 Channels Per Label The logic analyzer can only assign up to 32 channels for each label. If you need more than 32 channels, assign them to two labels and use the labels in conjunction. Must assign another pod pair to specify actions for flags In state sampling mode, when there is only one pod pair assigned to an analyzer, flags are not available. You must assign another pod pair to the analyzer in order for flags to be available.
Chapter 5: Reference Error Messages Possible Solutions • Phrase some of the edges as patterns. For example, if you are looking for a rising edge on a read/write line, you can check for R/W = 0 in one level followed by R/W = 1 in the next level. • Move some of the edges to another pod pair. Even if a label spans pod pairs, only the edge resources of the pod pair the specific channel is on are used.
Chapter 5: Reference Error Messages No Trigger action found in the trace specification This warning occurs when the trigger sequence you specified does not have at least one trigger and fill memory or trigger and goto action. The analyzer will still acquire data, but you will need to manually stop it. For example, when you use the Run until user stop function, to avoid popping up the status window, set the popup level to errors only.
Chapter 5: Reference Error Messages The clock's threshold level is set by the pod threshold. For the logic analyzer's J clock, check the pod threshold of pod 1 of the master card. Timer value checked as an event, but no start action specified This warning occurs because you have used a timer in your trigger sequence, but have not started it with either Start from reset or Resume in any action. You do not need to start the timer in the same sequence level.
Chapter 5: Reference Error Messages When you insert a trigger function, the logic analyzer sets up a field for you to enter values. The field length is based on the number of bits assigned to the first active label, or the label you specify. If there are no bits assigned to the label, the logic analyzer cannot complete the value field.
Chapter 5: Reference Error Messages The analyzer has a maximum limit of 16 event list combiner resources. Each unique event list expression requires the use of at least one of these combiner resources. A complex event list may require more than one combiner resource. The message does not mean that any single event list expression was too complex to combine (see “Branch expression is too complex” on page 212), but that the overall number of unique branch expressions specified has exceeded the limit of 16.
Chapter 5: Reference Error Messages • Event lists with up to 4 unique pattern events can be combined in any combination of ANDs and ORs by a single combiner resource if all of the pattern labels are non-split and contained on the same pod pair. Combining more than 4 labels on the same pod pair will require another combiner resource.
Chapter 5: Reference Error Messages fetch at an address that is not properly aligned, the trigger will never be found. • Trigger set incorrectly Some strategies you can use when verifying or debugging trigger sequence levels are: • Look at the run status message line or open the Run Status window. It will tell you what level of the sequence the logic analyzer is in. • Stop the measurement and look at the data that was captured.
Chapter 5: Reference Specifications and Characteristics Specifications and Characteristics NOTE: For a complete comparison of all logic analyzer specifications and characteristics refer to the Agilent Technologies 16700 Series Logic Analysis System Product Overview which can be downloaded from the 16760A product page on the Agilent web site.
Chapter 5: Reference Specifications and Characteristics E5378A Single-Ended Probe Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics Maximum state data rate supported: Mating connector: Minimum voltage swing: Input dynamic range: Threshold accuracy: Threshold range: User-supplied threshold range: User-supplied threshold input resistance: Threshold control options: 1250 Mb/s Agilent part # Vpos - Vneg >= -3.0 Vdc to +5 +/- (30 mV +1% -3.
Chapter 5: Reference Specifications and Characteristics Maximum input slew rate: Clock input: Number of inputs (see note 5): 5 V/ns Single-ended 34 (32 data and 2 clock) Note 2: A kit containing 5 AMP MICTOR connectors and 5 support shrouds is available, Agilent part # E5346-68701. A support shroud is available separately, Agilent part # E5346-44701. Note 5: Refer to the specific modes of operation for details on how inputs can be used.
Chapter 5: Reference Specifications and Characteristics Data in to BNC port out: Flag set/reset to evaluation: 150 ns N/A Note 1: In the 1500 Mb/s mode, only the even-numbered channels (0,2,4,...etc.) are acquired. Note 2: The resolution of the hardware used to assign time tags is 4 ns. Times of intermediate states are calculated. 1250 Mb/s Sampling Mode Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics 800 Mb/s Sampling Mode Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics 400 Mb/s Sampling Mode Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics 200 Mb/s Sampling Mode Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics Conventional Timing Mode Specifications and Characteristics NOTE: All specifications are marked by "*" (asterisk).
Chapter 5: Reference Specifications and Characteristics Time interval accuracy: Minimum data pulse width: Maximum trigger sequencer speed: Trigger resources: Trigger resource conditions: Maximum global counter: Maximum occurrence counter: Timer value range: Timer resolution: Timer accuracy: Greater than duration: Less than duration: Timer reset latency: Data in to BNC port out delay: Flag set/reset to evaluation: +/- [sample period + (chan-to-chan skew) + (0.01% of time interval)] 3.7 ns, 5.
Chapter 5: Reference Specifications and Characteristics referred to as an "operational accuracy calibration". What is a Characteristic? Characteristics describe product performance that is useful in the application of the product, but that is not covered by the product warranty. Characteristics describe performance that is typical of the majority of a given product, but not subject to the same rigor associated with specifications. Characteristics are verified by Function Tests.
Chapter 5: Reference Specifications and Characteristics 238
6 Concepts • “Understanding Logic Analyzer Triggering” on page 240 • “Understanding State Mode Sampling Positions” on page 256 • “Understanding Eye Scan Measurements” on page 259 239
Chapter 6: Concepts Understanding Logic Analyzer Triggering Understanding Logic Analyzer Triggering Setting up logic analyzer triggers can be difficult and time-consuming. You could assume that if you know how to program, you should be able to set up a logic analyzer trigger with no difficulty. However, this is not true because there are many concepts that are unique to logic analysis. The purpose of this section is to describe these key concepts and how to use them effectively.
Chapter 6: Concepts Understanding Logic Analyzer Triggering placed on the conveyor belt, and at the other end the boxes fall off. In other words, because logic analyzer memory is limited in depth (number of samples), whenever a new sample is acquired the oldest sample currently in memory is thrown away if the memory is full. This is shown in the following figure.
Chapter 6: Concepts Understanding Logic Analyzer Triggering Special box --------------------- Trigger point ------------------------------ Next: “Summary of Triggering Capabilities” on page 242 Summary of Triggering Capabilities Because logic analyzer triggering provides a great deal of functionality, the following table provides a brief summary of the capabilities covered in this article. Each of these capabilities will be described.
Chapter 6: Concepts Understanding Logic Analyzer Triggering edge before it begins looking for the next rising edge. Because there is a sequence of steps to find the trigger, this is known as a trigger sequence. Each step of the sequence is called a sequence level. Each sequence level consists of two parts; the conditions and the actions. The conditions are Boolean expressions such as “If ADDR = 1000” or “If there is a rising edge on SIG1”.
Chapter 6: Concepts Understanding Logic Analyzer Triggering time. Two sequence levels can never be used to specify two events that happen simultaneously. For example, consider the following trigger sequence: 1. If ADDR = 1000 then Go to 2 2. If DATA = 2000 then Trigger If the following samples were acquired, the logic analyzer would trigger on sample #7.
Chapter 6: Concepts Understanding Logic Analyzer Triggering analyzer will never trigger. When the conditions are met in a sequence level, it is clear which sequence level will be executed next when a “Go To” action is used, but it is not necessarily clear if there is no “Go To”. On some logic analyzers, if there is no “Go To”, this means that the next sequence level should be executed. On other logic analyzers, it means the same sequence level should be executed again.
Chapter 6: Concepts Understanding Logic Analyzer Triggering Branches Branches are similar to the Switch statement in the C programming language and the Select Case statement in Basic. They provide a method for testing multiple conditions. Each branch has its own actions. An example of multiple branches is shown below: 1. If ADDR < 1000 then Go To 2 Else If ADDR > 2000 then Go To 3 Else If DATA = 2000 then Trigger 2. If DATA <= 7000 then Trigger 3.
Chapter 6: Concepts Understanding Logic Analyzer Triggering “not in range” function as well. Ranges are a convenient shortcut so that you don't have to specify “ADDR >= 1000 and ADDR <= 2000”. Next: “Flags” on page 247 Flags Flags are Boolean variables that are used to send signals from one module to another. They can be set when a condition occurs in one module and tested later by another module.
Chapter 6: Concepts Understanding Logic Analyzer Triggering be used in place of Global Counters, if possible, because they are easier to use and because there is a limited number of Global Counters. Next: “Timers” on page 248 Timers Timers are used to check the amount of time that has elapsed between events. For example, if you want to trigger on one edge followed by another edge that occurs within 500ns, use a timer.
Chapter 6: Concepts Understanding Logic Analyzer Triggering because timer1 will keep running and condition “Timer1 <500 ns” will never be met. There might be another rising edge on SIG1 that is followed within 500ns by the rising edge on SIG2 that occurs later on, so this situation is unacceptable. To fix this problem, whenever the timer exceeds 500ns without triggering, the sequence should loop back to Level 1 to look for another rising edge on SIG1.
Chapter 6: Concepts Understanding Logic Analyzer Triggering ADDR In Range 1000 to 2000 By default, the Default Storage is set to store all samples acquired. You can also set the Default Storage to store nothing, which means that no samples will be stored unless a sequence level overrides the default storage. Sequence Level Storage Sequence level storage qualification means that within a particular sequence level only certain samples will be stored.
Chapter 6: Concepts Understanding Logic Analyzer Triggering 1. If DATA Else If Store Go to Else If Don't Go to = 005E then Trigger ADDR in range 5000 to 6FFF then Sample 1 ADDR not in range 5000 to 6FFF then Store Sample 1 Alternatively, if the default storage is set to “Store Everything”, use the following: 1.
Chapter 6: Concepts Understanding Logic Analyzer Triggering The Agilent 16715A trigger user interface Note that a picture (which corresponds to the selected function) is provided to the right of the trigger function list. For example, if you want to trigger when a bus pattern is immediately followed by another bus pattern, you can use the “Find Pattern2 occurring immediately after Pattern1” trigger function, shown in the following figure.
Chapter 6: Concepts Understanding Logic Analyzer Triggering The same trigger as If/Then statements Trigger functions can be modified. For example, if you start with the function “Find Edge”, you can add another event, and it becomes the same as “Find Edge and Pattern”. Therefore, a function that is not exactly correct can often be converted into the desired trigger. It is also possible to break down a function into the underlying If/Then statements and modify them.
Chapter 6: Concepts Understanding Logic Analyzer Triggering “Find Edge” and “Find Pattern” together Next: “Setting Up Complex Triggers” on page 254 Setting Up Complex Triggers Frequently, the most difficult part of setting up a complex trigger is breaking down the problem. In other words, how do you map a complex trigger into sequence levels, branches, and Boolean expressions? Here are step by step instructions: 1. Break down the problem into events that don't happen simultaneously.
Chapter 6: Concepts Understanding Logic Analyzer Triggering different parts of the trigger to describe how they work. Inline documentation on an Agilent logic analyzer Next: “Conclusions” on page 255 Conclusions Setting up logic analyzer triggers is very different than writing software. The job can be greatly simplified if other work can be leveraged by using pre-defined trigger functions and well-documented triggers that were written earlier.
Chapter 6: Concepts Understanding State Mode Sampling Positions Understanding State Mode Sampling Positions Synchronous sampling (state mode) logic analyzers are like edgetriggered flip-flops in that they require input logic signals to be stable for a period of time before the clock event (setup time) and after the clock event (hold time) in order to properly interpret the logic level. The combined setup and hold time is known as the setup/hold window.
Chapter 6: Concepts Understanding State Mode Sampling Positions To position the setup/hold window (sampling position) within the data valid window, a logic analyzer has an adjustable delay on each sampling clock input (to position the setup/hold window for all the channels in a pod). Sample Position Adjustments on Individual Channels Some logic analyzers let you adjust the position of the setup/hold window (sampling position) on each channel.
Chapter 6: Concepts Understanding State Mode Sampling Positions channel in a small fraction of the time (and without the extra test equipment) that it takes to make the adjustments manually. Eye finder is an easy way to get the smallest possible logic analyzer setup/hold window.
Chapter 6: Concepts Understanding Eye Scan Measurements Understanding Eye Scan Measurements Eye scan measurements are made possible by the logic analyzer's ability to double-sample each channel using slightly offset delays and by comparing the delayed samples using an exclusive-OR operation. When the exclusive-OR output is high, the delayed samples are different, and a transition is detected between the delay times.
Chapter 6: Concepts Understanding Eye Scan Measurements The result is a map of transitions detected in small windows of time and voltage over a range of time and voltage. Oscilloscope-like eye diagrams are used to display the measurement data. The number of transitions in each window is indicated by brightness or color. When setting up eye scan measurements, you can define the time and voltage ranges, as well as the size (in other words, resolution) of the time and voltage windows.
Chapter 6: Concepts Understanding Eye Scan Measurements Fine settings result in higher eye diagram resolution, but because more samples are collected, measurements take longer to run. The picture below is an example of measurement results when the fine settings are used.
Chapter 6: Concepts Understanding Eye Scan Measurements The smallest time resolution that can be set is 10 ps. The smallest voltage resolution that can be set is 1 mV. The number of channels on which an eye scan measurement collects data also affects the measurement time. The exception is when there are multiple logic analyzer cards in a module; in this case, measurements run simultaneously in parallel.
Glossary absolute Denotes the time period or count of states between a captured state and the trigger state. An absolute count of -10 indicates the state was captured ten states before the trigger state was captured. acquisition Denotes one complete cycle of data gathering by a measurement module. For example, if you are using an analyzer with 128K memory depth, one complete acquisition will capture and store 128K states in acquisition memory.
Glossary pointing device, to click an item, position the cursor over the item. Then quickly press and release the left mouse button. clock channel A logic analyzer channel that can be used to carry the clock signal. When it is not needed for clock signals, it can be used as a data channel, except in the Agilent Technologies 16517A.
Glossary instrument tool. Multiple data sets can be displayed together when sourced into a single display tool. The Filter tool is used to pass on partial data sets to analysis or display tools. debug mode See monitor. delay The delay function sets the horizontal position of the waveform on the screen for the oscilloscope and timing analyzer. Delay time is measured from the trigger point in seconds or states. demo mode An emulation control session which is not connected to a real target system.
Glossary Using the Touchscreen: Position your finger over the item, then press and hold finger to the screen. While holding the finger down, slide the finger along the screen dragging the item to a new location. When the item is positioned where you want it, release your finger. edge mode In an oscilloscope, this is the trigger mode that causes a trigger based on a single channel edge, either rising or falling. edge terms Logic analyzer trigger resources that allow detection of transitions on a signal.
Glossary logic analyzer what data you want to collect, such as which channels represent buses (labels) and what logic threshold your signals use. frame The Agilent Technologies or 16700A/B-series logic analysis system mainframe. See also logic analysis system. gateway address An IP address entered in integer dot notation. The default gateway address is 0.0.0.0, which allows all connections on the local network or subnet.
Glossary is usually represented as decimal numbers separated by periods; for example, 192.35.12.6. Ask your LAN administrator if you need an internet address. labels Labels are used to group and identify logic analyzer channels. A label consists of a name and an associated bit or group of bits. Labels are created in the Format tab. line numbers A line number (Line #s) is a special use of symbols.
Glossary machine because the master card is in slot C of the mainframe. The other cards of the module are called expansion cards. menu bar The menu bar is located at the top of all windows. Use it to select File operations, tool or system Options, and tool or system level Help. message bar The message bar displays mouse button functions for the window area or field directly beneath the mouse cursor. Use the mouse and message bar together to prompt yourself to functions and shortcuts.
Glossary by the channel width of the instrument. pod See pod pair point To point to an item, move the mouse cursor over the item, or position your finger over the item. preprocessor See analysis probe. primary branch The primary branch is indicated in the Trigger sequence step dialog box as either the Then find or Trigger on selection. The destination of the primary branch is always the next state in the sequence, except for the Agilent Technologies 16517A.
Glossary measurement as part of its data acquisition cycle. Sampling Use the selections under the logic analyzer Sampling tab to tell the logic analyzer how you want to make measurements, such as State vs. Timing. secondary branch The secondary branch is indicated in the Trigger sequence step dialog box as the Else on selection. The destination of the secondary branch can be specified as any other active sequence state. See also primary branch.
Glossary symbols Symbols represent patterns and ranges of values found on labeled sets of bits. Two kinds of symbols are available: • Object file symbols - Symbols from your source code, and symbols generated by your compiler. Object file symbols may represent global variables, functions, labels, and source line numbers. • User-defined symbols - Symbols you create. Symbols can be used as pattern and range terms for: • Searches in the listing display.
Glossary timing measurement In a timing measurement, the logic analyzer samples data at regular intervals according to a clock signal internal to the timing analyzer. Since the analyzer is clocked by a signal that is not related to the system under test, timing measurements capture traces of electrical activity over time. These measurements are asynchronous with the test system.
Glossary field. This action allows you to select specific portions of a particular waveform in acquisition memory that will be displayed on the screen. You can view any portion of the waveform record in acquisition memory.
Index Symbols &, 84 *, bit assignment, 60 +, label polarity, 64 -, label polarity, 64 .
Index bit numbers of logic analyzer channels, 60 bit order, changing, 65 bit significance, 60 bits, reordering, 65 boolean expressions, 245 branches, 246 branches, trigger sequence, 80 break down trigger functions, 83, 251 breaking down a trigger function, 72 breaking down trigger functions, 70 browsing, 196 browsing the symbol database, 196 C calibration, 210 canceling data processing, 100 capacitive loading, 97 captured data, canceling processing of, 100 captured data, displaying, 94, 140 captured eye sc
Index counter 2 value checked as an event, but no increment action specified, 218 counter actions, 86 counter events, 86 counter warning message, 218 counters, global, 86 counters, occurrence and global, 247 counting states, 75 counting states or time, 188 counting time, 75 cross-triggering, 112 cursor tool (eye scan display), 142 cutting-and-pasting trigger sequence levels, 80 D data (eye scan), commenting on, 151 data channels, using clock bits, 174 data displayed in symbolic form, 99 data on clocks disp
Index exporting label definitions to an ASCII file, 64 expressions, boolean, 245 external reference (threshold voltage), 35 external reference threshold voltage, 58 eye finder, 46, 49, 169, 256 eye finder advanced settings, 170 eye finder data, 116 eye finder selected/suggested sampling positions, 161 eye limits tool (eye scan display), 142 eye scan comments subtab, 209 eye scan data, commenting on, 151 eye scan data, displaying, 133 eye scan data, information about, 149 eye scan data, loading, 152 eye sca
Index Find pattern2 occurring immediately after pattern1, 181 Find pattern2 occurring too late after pattern1, 182 Find pattern2 occurring too soon after pattern1, 182 Find too few states between pattern1 and pattern2, 182 Find too many states between pattern1 and pattern2, 182 Find width violation on a pattern/ pulse trigger function, 178 finding the symbol you want, 196 fine eye scan settings, 120 flag actions, 87, 183 flag events, 87, 180, 183 flags, 87, 247 flags, pod pair requirements in state mode, 2
Index label polarity, 64 label values, 71 label values, symbolic, 105 labels, 22, 57 labels subtab, eye scan, 204 labels, assigning channels to, 60 labels, assigning to logic analyzer channels, 19 labels, rename/insert/delete, 60 labels, reordering bits, 65 labels, turning off or on, 66 least significant bit in label, 60 levels (trigger sequence), goto, 80 levels, sequence, 242 libraries, trigger functions, 177 limits (eye) tool (eye scan display), 142 line numbers, 202 line numbers number base, 71 listing
Index positive logic, 64 predefined trigger functions, 177 prefetch, triggering beyond, 196 preprocessors (analysis probes), 41 present for >, 84 preserving bit assignments, 66 previous trigger setup, recalling, 91 printing captured data, 110 probing the device under test, 15 probing, analysis probes, 41 probing, E5378A single-ended, 35 probing, E5379A differential, 37 probing, E5380A MICTORcompatible, 39 probing, E5382A flying leads, 40 probing, overview, 35 problems making measurements, 114 processing of
Index setting clock threshold voltages, 59 setting pod threshold voltages, 58 setting the advanced eye scan options, 121 setting the eye scan range, 120 setting the eye scan resolution, 120 settings (eye scan), commenting on, 132 settings (eye scan), qualified, 122 settings (trigger), clearing, 83 settings, eye finder advanced, 170 settings, saving, 116 Setup Assistant, 15, 41 setup eye scan using display scale, 135 setup time, 256 setup/hold, 52 setup/hold (logic analyzer), 46 setup/hold window, 49, 52, 1
Index symbols, loading user-defined, 105 symbols, outside defined sections, 107 symbols, types and use, 193 symbols, user-defined, 104 symbols, using, 101 synchronous sampling, 16 System Performance Analysis toolset, 95 T tab, symbols, 193 then branch, 80 threshold reference voltages, 35 threshold voltages, 19, 160, 171 threshold voltages (clock), setting, 59 threshold voltages (pod), setting, 58 TI COFF file format, 197 time count, 47, 188 time duration, 84 time, counting, 75 timer 1 value checked as an e
Index triggers, strategies for setting up, 251 troubleshooting the logic analyzer, 114 turbo state trigger functions, 185 U unassigned bits, 60 unassigned pod required, 75 understanding logic analyzer triggering, 240 Undo command, 72 ungrouping events, 89 unloading trigger function libraries, 73, 177 user defined threshold logic level, 58, 59 user-defined symbols, 104 user-defined symbols, loading, 105 user-level trigger functions, 80 V variables, 202 versions, 102 versions of symbol files, 102 voltages, t
Publication Number: 5988-9044EN January 1, 2003 s1
