Technical data

40 Agilent U7232A DisplayPort Electrical Performance Compliance Test Application
4 Source Total Jitter Differential Tests
Source Total Jitter Differential Tests
To evaluate the total jitter accompanying the data transmission at either
an explicit bit error rate of 10
-9
or through an approved estimation
technique. This measurement is a data time interval error (Data- TIE) jitter
measurement. (Reference: Table 3.13 VESA DisplayPort Standard).
The overall system jitter budget allocates different amounts of jitter which
each component of the system is allowed to contribute. To exceed any of
these limits is to violate the component level jitter budget. (Reference:
Jitter model in base DisplayPort Specification (Section 3.5.3.9: The Dual
Dirac Jitter Model)).
The test must use a PRBS 7 test pattern at all voltage levels. The test can
be performed with pre- Emphasis for best performance results.
Test P ro ce du re
1 Start the automated testing application as described in “Starting the
DisplayPort Electrical Performance Compliance Test Application" on
page 22.
2 Connect the W2641A test fixture or other appropriate fixture to the
device under test (DUT).
3 If you are using one connection, connect the probe to one channel. If
you are using two connections, connect the two probes to two channels
of the oscilloscope. If you are using four connections, connect the four
probes to four channels of the oscilloscope.
4 Connect the SMA to SMP cable to the SMA probe head of one of the
probes and to the data lane connector on the W2641A fixture that you
want to test.
5 Connect the other SMA to SMP cable to the other SMA probe head and
to the data lane on the W2641A test fixture that you want to test.
6 In the DisplayPort Compliance Test Application, click the Set Up tab.
7 Set the Test Mode, Test Type, DUT Definition Settings, Fixture Type,
Connection Type and Number of Channels according to the type of
testing being done. Source tests are available in all the 3 test modes -
Compliance Conditions Only, User Defined Conditions and Targeted
Characterization Testing.