User`s manual

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Oscilloscope Experience Redefined:
Mask/limit testing (option)
Whether you are performing pass/fail tests to specified
standards in manufacturing or testing for infrequent signal
anomalies, mask/limit testing can be a valuable productivity
tool (DSOX4MASK). The 4000 X-Series features powerful
hardware-based mask testing and can perform up to 270,000
tests per second. You can select multiple test criteria,
including the ability to run tests for a specific number of
acquisitions, a specified time, or until detection of a failure.
Figure 9 Mask testing evaluated > 22 M waveforms in just
2 minutes.
Figure 10: The 4000 X-Series was set up to capture data signals
with various rise time edges. Using the search and navigation
capability, the oscilloscope was able to find, mark (white
triangles), and quickly navigate to 16 occurrences of “out of
compliance” rise-time edges.
Figure 11: Using the error condition search, the 4000 X-Series
quickly found 5 places with a missing acknowledgment in an I²C
serial bus. The navigation feature moves between the errors and
zooms automatically to show the error packet.
Experience the Speed
The parametric and serial bus search and navigation feature
comes standard on the 4000 X-Series oscilloscopes. When
you are capturing long, complex waveforms using an
oscilloscope’s deep acquisition memory, manually scrolling
through stored waveform data to find specific events of
interest can be slow and cumbersome. With automatic
search and navigation capability, you can easily set up
specific search criteria and then quickly navigate to “found
and marked” events. Available search criteria include edges,
pulse width (time-qualified), rise/fall times (time-qualified),
runt pulses (time- and level-qualified), and serial bus frames,
packets, and errors.
Search and navigation