Specifications

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Table of Contents
1. Introduction
2. Making residual (two-port) measurements on
pulsed carriers
Residual measurement considerations
Hardware configuration
Step-by-step procedure
Example 1: Residual noise floor using an Agilent 83732B
as the source (non-pulsed carrier)
Example 2: Pulsed carrier noise floor using an Agilent
83732B as the stimulus source
Example 3: Residual measurement of an Agilent 8347A
amplifier
3. Making absolute phase noise measurements on
pulsed carriers
Absolute phase noise measurement considerations
Hardware configuration
Step-by-step procedure
Example 1: Absolute pulsed measurement—
Agilent 8663A versus Agilent 83732B
Using a microwave downconverter
Example 2: Absolute pulsed measurement using
a microwave downconverter—Agilent 8644B versus
Agilent 83732B
4. Making AM noise measurements on pulsed carriers
Measurement considerations
PRF filtering
Measurement calibration
Example 1: Agilent 83732B pulsed AM noise
measurement using the internal AM detector