User`s guide

Additional Imaging Modes 7
Agilent 5500 SPM User’s Guide 128
For the MAC III controller these connections are made in software.
To image in Force Modulation Mode:
1 First follow the steps from Chapter 4
a Insert the nose assembly into the scanner.
b Insert a probe into the nose assembly.
c Place the scanner in the microscope base.
d Align the laser on the cantilever.
e Insert and align the detector.
f Prepare the sample and place it on the sample plate.
g Plug the 6-pin MAC connector of the EC/MAC Cable into the
6-pin socket on the sample plate. Plug the other end of the cable
into the EC/MAC socket on the microscope .
h Adjust the video system to focus on the cantilever.
2 Choose Controls > Setup > Options, then select the Serial Port AC
Mode Controller check box. The system will now use the signal
from the MAC (or MAC III) controller.
3 In PicoView choose Mode > Contact. Or, if you are using a MAC
III controller Choose Mode > Force Modulation.
4 Press the Close switch on the HEB to raise the sample until the tip is
close to, but not touching, the sample.
5 Use the video system to bring the tip and sample close to contact:
a Bring the cantilever into sharp focus.
b Lower the focal plane just slightly below the tip by turning the
Focus control toward you until the tip is slightly out of focus.
c Using the Close switch on the HEB, raise the sample until the
sample and tip both come nearly into focus. The tip should now
be just above the sample surface.
6 Locate the area of interest on the sample by performing a scan.
7 In PicoView’s Servo window, enter a Setpoint value slightly greater
than the current Deflection reading (from the HEB front panel or
PicoView’s Laser Alignment window).
8 Click the Approach button. The system will raise the sample until
the deflection reaches the Setpoint value.