User`s guide

Index
Agilent 5500 SPM User’s Guide 229
Index
A
AAC Mode, 103, 130
AC Mode, 24, 103, 113
Acoustic, 25, 103, 104, 130
Constant height, 109
Magnetic, 26, 103
Top MAC, 112
AC Mode Tune window, 105, 106
ACAFM, 25
Acoustic AC Mode, 25, 103, 104
Acoustic noise, 55, 56
Adhesion, 18
adhesion, 29
Adhesive force, 23
AFM, 21
Aging, 142
Air flow, 55
Amplitude, 25
Approach, 95, 96, 108, 118, 126, 132
Approach Range, 96
Atomic Force Microscopy, 21
Auto Tune, 107, 131
B
Bias voltage, 114, 117, 119, 130
Bow, 141
Buffer, 97, 110
C
Cables, 58, 71, 127
Calibration, 143, 154
Calibration file, 140, 152
Closed-loop, 154
CameraView, 47
Cantilevers, 65
Capillary force, 23
Closed-loop scanner
X/Y/Z axes, 154
Z-axis only, 153
Conductivity, 119
Contact Mode, 23, 29, 92, 123, 154
Constant Force mode, 93
Laser alignment, 82
Setting up, 93
Counter electrode, 217, 220
Creep, 142
Cross coupling, 141
CSAFM Mode, 27, 119
Current booster, 203
Current Sensing AFM, 27, 119
D
Deflection, 19, 22, 99, 121
Deflection signal, 80
Desiccator, 139
Detector, 22, 40
Alignment, 79
Gain switches, 80
DLFM Mode, 125
Dynamic Lateral Force Microscopy, 125
E
EC/MAC cable, 85, 111, 117, 120, 128, 164, 220
EFM Mode, 130, 134, 177
Elasticity, 18
elasticity, 28
Electrochemistry, 211, 213
Cleaning, 218
Liquid cell, 216, 217, 220
Electrode, 117, 120, 130, 213, 216
Cleaning, 219
Counter electrode, 217, 220
Flame annealing, 219
Pogo electrode, 216, 219
Reference electrode, 217, 220
Working electrode, 216, 219, 221
Electrostatic charge, 18
Electrostatic Force Microscopy, 130
Environmental chamber, 17, 87, 197, 205, 210, 211, 212
Error signal, 22
F
Facility requirements
Acoustic noise, 55
Air flow, 55
Power, 55
Utilities, 56
Water, 55
Flame annealing, 219
FMM Mode, 127
Force
Adhesive, 23
Capillary, 23
van der Waals, 23
Force Modulation Microscopy, 28, 127
Friction, 99, 123
friction, 29
Friction Force Microscopy, 29
Friction signal, 81