User`s guide

Index
Agilent 5500 SPM User’s Guide 230
G
Gains, 96, 108, 154
Optimizing, 101
Glove box, 212, 219
H
Head Electronics Box, 81, 93, 124, 162, 167, 221
HEB, 81, 93, 124, 162, 167, 221
Hot MAC sample plate, 195, 197, 199
Hot sample plate, 195, 197, 199
Humidity, 57
Hysteresis, 140, 146, 149
I
Isolation chamber, 57, 58
K
Kelvin Force Microscopy, 134
KFM Mode, 134, 180
L
Lakeshore controller, 196, 203
Laser
Align using video system, 76
Alignment, 74, 75
Alignment knobs, 72
Laser Alignment window, 80, 95
Lateral Force Microscopy, 29, 123
LFM Mode, 29, 123, 174
Liquid cell, 191, 211, 213, 216, 217, 219, 220
Approach, 192
Cleaning, 218
Flow-through cell, 193
With MAC Mode, 193
Lock-in, 130, 132, 166, 183
Gain, 132
M
MAC III controller, 26, 27, 30, 103, 110, 113, 127, 130, 132,
166
MAC III Mode, 166
Advanced software controls, 182
Components, 167
MAC Mode, 26, 103, 111, 113, 162
Cables, 163
Components, 162
MAC option, 162
Sample setup, 164
Top MAC option, 162
With liquid cell, 193
MAC Mode controller, 26, 27, 30, 31, 103, 110, 127, 162, 163,
165
Magnetic AC Mode, 26, 103
Manual Tune, 126
Microscope base, 80
Multi-purpose Scanner, 114, 119, 127, 139, 143
N
Nano-manipulation, 19
Non-linearity, 140, 145, 148
Nose assembly
Care and handling, 90, 138
One-piece, inserting, 60
One-piece, inserting probe, 64
One-piece, removing, 62
One-piece,removal, 63
Two-piece, assembly, 67
Two-piece, inserting, 67
Two-piece, inserting probe, 69
Two-piece, nose removal tool, 68
Two-piece, removal, 68
O
Off Peak, 107
Offset, 97, 154
P
Peak Amplitude, 107, 131
Peltier Cold MAC sample plate, 201, 202, 204, 205, 206
Phase, 25
Photodiode detector, 40, 79
PicoScan, 214
PicoView, 80, 214
Piezoes, 60, 139, 140, 142, 153
Pogo electrode, 216, 219
Power, 55
Probes, 18, 21, 65
Care and handling, 90, 138
Conductive, 120
Conductive for EFM, 130
Conductive for KFM, 134
Contact Mode, 93
DLFM, 125
STM, 114
Q
Q Control, 112, 131
R
Raster scan, 59, 99
Realtime Images window, 97, 98, 109, 118