User`s guide

Introduction to the Agilent 5500 1
Agilent 5500 SPM User’s Guide 30
cantilever due to interatomic magnetic force that persists for greater
tip-sample separation than the van der Waals force.
A standard topography image can be collected for the same scanned
area, using AAC in Intermittent Contact mode. The two images can then
be displayed side-by-side to highlight any correlation between the
magnetic structure and topography.
Electrostatic Force Microscopy (EFM)
Electrostatic Force Microscopy (EFM) is a qualitative method for
examining changes in the intrinsic, or applied, electrostatic field of a
sample surface. A voltage bias is applied between the tip and the
sample, allowing local static charge domains and charge carrier density
to be measured.
The system detects changes in the phase response of the cantilever
which are induced by the interaction of the conducting tip and the
electrostatic field of the sample surface. EFM images are usually
obtained by monitoring the phase change of the cantilever oscillation at
the applied frequency.
A standard topography image can be collected for the same scanned
area, using AAC (or MAC) in Intermittent Contact Mode. The two
images can then be displayed side-by-side to highlight any correlation
between the electrostatic response and topography.
Kelvin Force Microscopy (KFM)
Kelvin Force Microscopy (KFM) is similar to EFM, but with the
addition of a feedback loop to maintain a DC tip bias that counteracts
the surface electrostatic force. The output from this feedback loop
NOTE
MFM requires MAC Mode or MAC III.
NOTE
EFM is an option for the 5500 SPM and requires the additional MAC III
controller.