User`s guide

Agilent 5500 SPM Components 2
Agilent 5500 SPM User’s Guide 50
Temperature Control
This option includes low and/or high temperature sample plates, a
temperature controller and related hardware for maintaining sample
temperature during imaging.
Thermal K
Thermal K provides a method for accurately determining the force
constant of the cantilever for highly accurate force measurements. By
measuring the thermal oscillation of the cantilever with no drive signal
applied, the cantilever force constant can be determined. The option
includes a separate acquisition card that is installed in an empty slot in
the system computer.
Environmental Chamber
The environmental chamber (Figure 26) allows imaging in controlled
atmospheres. Ports and fittings enable gases, liquids and probes to be
introduced to the chamber.
Figure 26 Environmental chamber
Glove Box
This small glove box, shown in Figure 27, can be attached directly to
the microscope body, offering greater environmental control. Since the
sample, piezo, and electronic parts are totally isolated from the imaging