User`s guide

92
Agilent 5500 SPM
User’s Guide
Agilent Technologies
5
Contact Mode Imaging
Setting Up for Contact Mode Imaging 93
Constant Force Mode 93
Constant Height Mode 100
Fine-Tuning the Image 100
Setpoint 100
Gains 101
Scan Settings 101
In Contact Mode imaging, the AFM tip is brought into gentle contact
with the sample and then scanned in raster fashion across the sample
surface. The system will either maintain a constant force on the tip, for
most Contact Mode measurements, or will maintain the tip at a constant
height, for high resolution imaging of very flat surfaces. It is typical in
Contact Mode to image deflection, friction and/or topography, though
other signals may be imaged as well.
In this chapter we will outline the steps to making Contact Mode images
with a system that is calibrated and properly set up. Additional factors
may affect the quality of images produced in Contact Mode. To
understand more about these factors please be sure to read the PicoView
software documentation and Agilent training materials.
NOTE
This chapter references material in Chapter 4, “Preparing for Imaging.” Be
sure to review and understand Chapter 4 before continuing with Contact
Mode.