User`s guide

Contact Mode Imaging 5
Agilent 5500 SPM User’s Guide 95
11
Locate the area of interest on the sample by manually moving the
X/Y stage control micrometers (Figure 66) while watching the video
window.
Figure 66 Stage control micrometers
12 Next you will “approach” the sample, bringing the tip into contact
with the surface. To ensure that the contact will be gentle, verify that
the Setpoint voltage is set appropriately:
a Note the Deflection reading on the HEB front panel, or in
PicoView’s Laser Alignment window (both will display the same
value). This is the current cantilever deflection, stated in volts.
b In PicoView’s Servo window, enter a Setpoint value slightly
more positive than the current Deflection reading. This sets the
deflection that the feedback loop will achieve and maintain.
CAUTION
Raise the sample slowly and carefully to avoid collision with the sample.
Hard contact between the tip and the sample can damage either or both.
CAUTION
If your sample has tall features or steps, you may need to raise the
scanner slightly to avoid contacting features as you move the stage.