Product specifications

3
Introduction
Vector network analyzers (VNA) are the common tool for characterizing
RF and microwave components in both continuous-wave (CW) and pulsed
operations. Some external equipment may be used in conjunction with a VNA
to modulate the stimulus or DC bias, and to perform accurate S-parameter
measurements in pulsed operation. However, components that need to be
characterized in pulsed operation mode are often active devices such as
amplifiers or converters, and many active parameters are characterized in
addition to S-parameters. For amplifiers as an example, 1 dB compression (P1
dB), intermodulation distortion (IMD), and third-order intercept point (IP3) are
commonly measured, and many parameters such as noise figure, higher-order
distortion products, harmonics, etc. are characterized depending on their
intended application needs. These active parameters are power-dependent,
so additional factors must be considered for precise characterization.
To respond to such needs, Agilent’s PNA-X Series, the most flexible VNA
that employs many capabilities designed for active-device characterization,
enables S-parameter and active parameter measurements with a single
set of connections. The PNA-X’s four internal pulse generators and
pulse modulators, two internal sources with a combining network, and
active-application options provide fully integrated pulsed active-device
characterization. This application note discusses pulsed S-parameter
measurements using the PNA-X Series and measurement techniques that
enable power-dependent active-device characterization including compression
and distortion. It also provides a brief summary of pulsed-RF measurement
types, and two detection techniques (wideband and narrowband detection)
are explained specifically using PNA-X architecture and methodologies. Refer
to application note 1408-12 Pulsed-RF S-Parameter Measurements Using
Wideband and Narrowband Detection part number 5989-4839EN for further
details of measurement types and detection techniques.