Technical data

522 Chapter 18
T1 Analyzer
Measurement Results
T1 Analyzer
+Frame Slips
A tally of the number of positive frame slips that occurred since the last
measurement reset.
-Frame Slips
A tally of the number of positive frame slips that occurred since the last
measurement reset.
Bit Errors
A tally of the number of bit errors that occurred since the last measurement reset.
Bit Error Rate
The percent ratio of bit errors to total bits transmitted since the last measurement
reset.
Pattern Sync Loss
A tally of the number of times the pattern detector lost synchronization since the last
measurement reset.
Test Data Rate
The measured data rate of the bit stream.
Testing and Fault Mitigation
The complexity of T1 testing certainly parallels or possibly exceeds that of RF tests
at a cell site. Shadowing efforts and customer expression have shown that most cell
site technicians reduce the complexities of backhaul T1 testing down into a series of
well-defined steps. These tests are often not comprehensive, but are often sufficient
to determine the continuity of a T1 circuit with a high degree of confidence. The test
sequence is often developed by an experienced technician and is determined by
finding the shortest path to an adequate measurement on a particular piece of readily
available equipment. T1 testing often involves one technician on each end of a
circuit. In the case of wireless, the technician at the switch end, very experienced at
backhaul testing, is often working with a field technician who has a broader-based
set of knowledge and is often less experienced in backhaul testing. The switch
technician quickly develops a test procedure that involves the smallest number of
verbal instructions to the field technician.