Specifications
9
Features
•  136 dB dynamic range with direct receiver access
•  expandability with configurable test set 
•  optional advanced mixer and converter test
•  optional electronic calibration (ECal) modules allow you to calibrate 10 times  
  faster than mechanical calibration
•  optional antenna and pulsed-RF measurements
www.agilent.com/find/pna
High-Performance Microwave 
Measurements
Network Analyzer Overview  20 GHz/40 GHz/50 GHz/67 GHz
Microwave network analyzers
PNA microwave network 
analyzer 
E8361/2/3/4C 
The Agilent E8361/2/3/4C are the 
microwave frequency models from the 
PNA series of network analyzers. These 
models offer an unsurpassed combination 
of high performance, speed, and outstanding 
interconnectivity capabilities to meet the 
challenges of component testing. 
The microwave PNA network analyzers cover 
10 MHz to 20, 40, 50 and 67 GHz frequency 
ranges with excellent accuracy. These  
analyzers are suitable for high-performance 
microwave devices, such as satellite com-
munication components. They offer 123 dB 
dynamic range at the test ports and 136 dB 
with direct receiver access. They also provide 
TRL/LRM calibration capability for in-fixture 
and on-wafer devices. In addition, the 
receiver architecture enables frequency- 
offset mode to characterize your mixers 
and converters. The configurable test set 
allows you to connect external test sets 
easily and make accurate multiport 
measurements. 
The enhanced user interface, crisp display 
with touch screen, and flexible remote 
interfaces maximize productivity in design 
and production environments.
The Windows operating system provides 
the ability to expand the instrument's  
connectivity and provides tools for maximum 
flexibility. In addition, from the Windows 
desktop you can install measurement tools, 
which reduce the need for a dedicated PC, 
and use on-line Help to quickly refer to 
programming and user documentation. 
Furthermore, COM/DCOM provides a  
powerful automation function. These 
functions can increase your design and 
test efficiency dramatically. 










