Specifications
22
N5250C millimeter-wave system
□ N5250C MM PNA system
1
, 10 MHz to 110 GHz, includes:
  E8361C MW PNA with the following options:
    •  Configurable test set – Option 014
    •  Extended power range and bias-tees – 
 Option UNL
    •  Frequency-offset mode – Option 080
    •  Reference channel switch – Option 081
    •  IF access – Option H11
  N5260A millimeter-wave test set controller with test heads
      •  67 to 110 GHz test heads
 • 1.0 mm combiner assembly
 • Interconnecting cables
 • Installation and productivity assistance
  Additional options available:
    • Millimeter-wave modules with bias-tees - 
 N5250C Option 017
    • Millimeter-wave modules with bias-tees and 
      port 2 attenuator - N5250C Option 018
    •  Receiver attenuator – Option 016 
    •  Time-domain capability – Option 010
    •  Pulsed-RF measurement capability – Option H08
2
    •  Scalar-calibrated converter measurements – Option 082
2
    •  Frequency converter application – Option 083
2
Factory integration of the N5250C system integrates the E8361C 
with Option H11 and the N5260A millimeter-wave controller with 
test heads. On-site installation is included, and the entire system 
carries a full one-year, on-site warranty (where available).
Option Descriptions
□ Millimeter-wave modules with bias-tees (N5250C Option 017)
  Adds 67 GHz bias-tees to the combiner assembly between the 
  input to the combiner and the 67 GHz coupler. The bias-tees have 
  tri-axial connectors for force, sense, and ground. Positioning the 
  bias-tees close to the DUT greatly improves stability for on-wafer
 and in-fixture devices. The bias-tees added for this option have a 
 voltage rating of 40 volts and a maximum of 0.5 amps.
□ Millimeter-wave modules with bias-tees and port 2 
 attenuator (N5250C Option 018)
  Adds 67 GHz bias-tees to the combiner assembly between the 
  input to the combiner and the 67 GHz coupler. The bias-tees have 
  tri-axial connectors for force, sense, and ground. Positioning the 
  bias-tees close to the DUT greatly improves stability for on-wafer 
  and in-fixture devices. The bias-tees added for this option 
  have a voltage rating of 40 volts and a maximum of 0.5 amps 
  Additionally, Option 018 adds a 25 dB micrometer attenuator to 
  the port 2 test head. 
Banded waveguide solution
In order to assemble a banded waveguide solution, the following 
components are needed:
•  Microwave PNA network analyzer (E8361C or E8362/3/4C) 
  with the following options:
  • IF access - Option H11
  • Configurable test set - Option 014
  • Extended power range and bias-tees - Option UNL
  • Frequency-offset mode - Option 080
  • Reference channel switch - Option 081
  • Millimeter-wave test set controller (N5260A) 
    with no options
•  A set of waveguide modules:
• N5256AW15, 50 to 75 GHz
• N5256AW12, 60 to 90 GHz
• N5256AW10, 75 to 110 GHz
• N5256AW08, 90 to 140 GHz
• N5256AW06, 110 to 170 GHz
• N5256AW05, 140 to 220 GHz
• N5256AW03, 220 to 325 GHz
NOTE: To significantly improve system dynamic range above 220 GHz, 
Agilent strongly recommends adding two external synthesizers 
such as Agilent’s PSG Series signal generators; one for the RF sig-
nal, and one for the LO signal.
For more detailed information, see PNA Millimeter-wave Technical 
Overview, literature number 5989-7620EN.
On-wafer applications
For on-wafer applications, Cascade Microtech
3
 provides complete 
probing systems using the N5250C. These include both new prob-
ing systems and upgrades to existing Cascade Microtech products. 
Cascade can also provide on-wafer verification and probing system 
training. Once the N5250C system is verified  in coax, Cascade 
Microtech will verify the system through its 
wafer probes.
PNA Series Network Analyzer










